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Multiple-State Storage Capability of Stacked Chalcogenide Films (Si16Sb33Te51/Si4Sb45Te51/Si11Sb39Te50) for Phase Change Memory 被引量:1
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作者 赖云锋 冯洁 +6 位作者 乔保卫 黄晓刚 蔡燕飞 林殷茵 汤庭鳌 蔡炳初 陈邦明 《Chinese Physics Letters》 SCIE CAS CSCD 2006年第9期2516-2518,共3页
The multiple-state storage capability of phase change memory (PCM) is confirmed by using stacked chalcogenide films as the storage medium. The current-voltage characteristics and the resistance-current characteristi... The multiple-state storage capability of phase change memory (PCM) is confirmed by using stacked chalcogenide films as the storage medium. The current-voltage characteristics and the resistance-current characteristics of the PCM clearly indicate that four states can be stored in this stacked film structure. Qualitative analysis indicates that the multiple-state storage capability of this stacked film structure is due to successive crystallizations in different Si-Sb-Te layers triggered by different amplitude currents. 展开更多
关键词 RANDOM-ACCESS MEMORY doped ge2sb2te5 films OPTICAL DISK CRYSTALLIZATION
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