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THERMAL STRESS MEASUREMENT OF QUARTZ OSCILLATOR MODULE PACKAGING 被引量:2
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作者 Ji Hongwei Qin Yuwen Chen Jinlong 《Acta Mechanica Solida Sinica》 SCIE EI 2001年第3期251-258,共8页
The thermal stress of the quartz oscillator module packaging isinvestigated using digital-im- age correlation method (DICM), and theexperimental results are given. Under the quartz oscillator modulepackaging, the quar... The thermal stress of the quartz oscillator module packaging isinvestigated using digital-im- age correlation method (DICM), and theexperimental results are given. Under the quartz oscillator modulepackaging, the quartz oscillator and the Fe-Sn-Cu alloy frame arejoined together with the electroconductive adhesive (PI), and theelectroconductive adhesive needs to be cured twice at 150 deg. C and275 deg. C respective- ly. 展开更多
关键词 digital-image correlation method (DICM) thermal stress micro-zone strainmeasurement
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