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Enhanced etching of silicon didioxide guided by carbon nanotubes in HF solution
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作者 赵华波 应轶群 +6 位作者 严峰 魏芹芹 傅云义 张岩 李彦 魏子钧 张朝晖 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第10期442-446,共5页
This paper describes a new method to create nanoscale SiO2 pits or channels using single-walled carbon nanotubes (SWNTs) in an HF solution at room temperature within a few seconds. Using aligned SWNT arrays, a patte... This paper describes a new method to create nanoscale SiO2 pits or channels using single-walled carbon nanotubes (SWNTs) in an HF solution at room temperature within a few seconds. Using aligned SWNT arrays, a pattern of nanoscale SiO2 channels can be prepared. The nanoscale SiO2 patterns can also be created on the surface of three- dimensional (3D) SiO2 substrate and even the nanoscale trenches can be constructed with arbitrary shapes. A possible mechanism for this enhanced etching of SiO2 has been qualitatively analysed using defects in SWNTs, combined with H3O+ electric double layers around SWNTs in an HF solution. 展开更多
关键词 carbon nanotube silicon dioxide HF wet etching defects and electric double layers
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