Design of 1 kbit antifuse one time programmable memory IP using dual program voltage

A 1 kbit antifuse one time programmable(OTP) memory IP,which is one of the non-volatile memory IPs,was designed and used for power management integrated circuits(ICs).A conventional antifuse OTP cell using a single positive program voltage(VPP) has a problem when applying a higher voltage than the breakdown voltage of the thin gate oxides and at the same time,securing the reliability of medium voltage(VM) devices that are thick gate transistors.A new antifuse OTP cell using a dual program voltage was proposed to prevent the possibility for failures in a qualification test or the yield drop.For the newly proposed cell,a stable sensing is secured from the post-program resistances of several ten thousand ohms or below due to the voltage higher than the hard breakdown voltage applied to the terminals of the antifuse.The layout size of the designed 1 kbit antifuse OTP memory IP with Dongbu HiTek's 0.18 μm Bipolar-CMOS-DMOS(BCD) process is 567.9 μm×205.135 μm and the post-program resistance of an antifuse is predicted to be several ten thousand ohms.

Temperature and Process Variations Aware Dual Threshold Voltage Footed Domino Circuits Leakage Management

Considering the effect of temperature and process variations, the inputs and clock signals combination sleep state dependent leakage current characteristics is analyzed and the optimal sleep state is examined in sub-65nm dual threshold voltage （V1） footed domino circuits. HSPICE simulations based on 65nm and 45nm BSIM4 models show that the proposed CLIL state （the clock signal and inputs are all low） is the optimal state to reduce the leakage current of the high fan-in footed domino circuits at high temperature and almost all footed domino circuits at room temperature, as compared to the conventional CHIL state （the clock signal is high and inputs are all low） and the CHIH state （the clock signal and inputs are all high）. Further, the influence of the process variations on the leakage current characteristics of the dual V1 footed domino circuits is evaluated. At last, temperature and process variation aware new low leakage current setup guidelines are provided.

Power management unit chip design for automobile active-matrix organic light-emitting diode display module

A power management unit （PMU） chip supplying dual panel supply voltage, which has a low electro-magnetic interference （EMI） characteristic and is favorable for miniaturization, is designed. A two-phase charge pump circuit using external pumping capacitor increases its pumping current and works out the charge-loss problem by using bulk-potential biasing circuit. A low-power start-up circuit is also proposed to reduce the power consumption of the band-gap reference voltage generator. And the ring oscillator used in the ELVSS power circuit is designed with logic devices by supplying the logic power supply to reduce the layout area. The PMU chip is designed with MagnaChip＇s 0.25 μ high-voltage process. The driving currents of ELVDD and ELVSS are more than 50 mA when a SPICE simulation is done.