Effect of Fluid Electrical Property Changes on Surface Transverse Wave Sensors

A fluid sensor based on the surface transverse wave (STW) delay line on ST-cut quartz has been developed and tested in a large number of fluids with different viscosity and permittivity levels.Influence of fluid mechanical and electrical properties on the sensor's response has been determined and the sensor's performance has been compared with a bulk acoustic wave (BAW) viscosity sensor.The result shows that the viscosity sensitivity of the developed STW sensor represented by the signal to noise ratio is lower than that of a 5 MHz BAW sensor.Applications of the sensor in detecting the quality of industrial fluids are discussed.

Enhanced electrical property of graphite/Al_(2)O_(3) composite fabricated by reductive sintering of gel-casted body using cross-linked epoxy polymer

In the present study,graphite/alumina composites are fabricated via reductive sintering of gel-casted green bodies with structurally controlled cross-linked epoxy polymers for the first time.The cross-linking degrees of polymers are tuned by the amount ratio of epoxy monomer/polyvinyl alcohol cross-linker utilized in gel-casting process.Superior electrical properties with respect to 5-fold enhanced electrical conductivity and 2-fold higher carrier mobility are successfully achieved in graphite/alumina composite fabricated from cross-linked epoxy polymer,whose phenomenon is attributed to the excellent conductive path in ceramic matrix established by highly uniform network with improved graphitization degree.

Nonlinear analysis on electrical properties in a bended composite piezoelectric semiconductor beam

In this paper,the interactions between the transverse loads and the electrical field quantities are investigated based on the nonlinear constitutive relation.By considering a composite beam consisting of a piezoelectric semiconductor and elastic layers,the nonlinear model is established based on the phenomenological theory and Euler’s beam theory.Furthermore,an iteration procedure based on the differential quadrature method(DQM)is developed to solve the nonlinear governing equations.Before analysis,the convergence and correctness are surveyed.It is found that the convergence of the proposed iteration is fast.Then,the transverse pressure induced electrical field quantities are investigated in detail.From the calculated results,it can be found that the consideration of nonlinear constitutive relation is necessary for a beam undergoing a large load.Compared with the linear results,the consideration of the nonlinear constitutive relation breaks the symmetry for the electric potential,the electric field,and the perturbation carrier density,and has little influence on the electric displacement.Furthermore,the non-uniform pressures are considered.The results show that the distributions of the electric field quantities are sensitively altered.It indicates that the electrical properties can be manipulated with the design of different transverse loads.The conclusions in this paper could be the guidance on designing and manufacturing electronic devices accurately.

Preparation of Fluorine-free MXene Ti_(3)C_(2)T_(x) and Its Electrical Properties

The fluorine-free MXene was prepared by Lewis acid salt etching of ternary layered ceramic MAX phase material.The structure of fluorine-free MXene was characterized by scanning electron microscopy(SEM)and X-ray diffractometry(XRD).The study finds that the layer spacing of fluorine-free MXene is approximately twice that of MXene etched by the liquid-phase method,compared to the conventional liquidphase method.It also has greater capacitive properties.Therefore,the MXene prepared by this method shows a great potential for application in the field of capacitors.

Suitable contacting scheme for evaluating electrical properties of GaN-based p-type layers

A suitable contacting scheme for p-(Al)GaN facilitating quick feedback and accurate measurements is proposed in this study.22 nm p^(+)-GaN followed by 2 nm p-In_(0.2)Ga_(0.8)N was grown on p-type layers by metal-organic chemical vapor deposition.Samples were then cut into squares after annealing and contact electrodes using In balls were put at the corners of the squares.Good linearity between all the electrodes was confirmed inⅠ–Ⅴcurves during Hall measurements even with In metal.Serval samples taken from the same wafer showed small standard deviation of~4%for resistivity,Hall mobility and hole concentration.The influence of contact layer on the electrical characteristics of bulk p-type layers was then investigated by step etching technique using inductively coupled plasma etching and subsequent Hall-effect measurements.Identical values could be obtained consistently when a 28 nm non-conductive layer thickness at the surface was taken into account.Therefore,the procedures for evaluating the electrical properties of GaN-based p-type layers just using In balls proposed in this study are shown to be quick and useful as for the other conventionalⅢ–Ⅴmaterials.

Exploring heteroepitaxial growth and electrical properties of α-Ga_(2)O_(3) films on differently oriented sapphire substrates

This study explores the epitaxial relationship and electrical properties of α-Ga_(2)O_(3) thin films deposited on a-plane, mplane, and r-plane sapphire substrates. We characterize the thin films by X-ray diffraction and Raman spectroscopy, and elucidate thin film epitaxial relationships with the underlying sapphire substrates. The oxygen vacancy concentration of α-Ga_(2)O_(3) thin films on m-plane and r-plane sapphire substrates are higher than α-Ga_(2)O_(3) thin film on a-plane sapphire substrates. All three thin films have a high transmission of over 80% in the visible and near-ultraviolet regions, and their optical bandgaps stay around 5.02–5.16 eV. Hall measurements show that the α-Ga_(2)O_(3) thin film grown on r-plane sapphire has the highest conductivity of 2.71 S/cm, which is at least 90 times higher than the film on a-plane sapphire. A similar orientation-dependence is seen in their activation energy as revealed by temperature-dependent conductivity measurements, with 0.266, 0.079, and 0.075eV for the film on a-, m-, r-plane, respectively. The origin of the distinct transport behavior of films on differently oriented substrates is suggested to relate with the distinct evolution of oxygen vacancies at differently oriented substrates. This study provides insights for the substrate selection when growing α-Ga_(2)O_(3) films with tunable transport properties.

Optical and electrical properties of BaSnO_(3) and In_2O_(3) mixed transparent conductive films deposited by filtered cathodic vacuum arc technique at room temperature

For the crystalline temperature of BaSnO_(3)(BTO)was above 650℃,the transparent conductive BTO-based films were always deposited above this temperature on epitaxy substrates by pulsed laser deposition or molecular beam epitaxy till now which limited there application in low temperature device process.In the article,the microstructure,optical and electrical of BTO and In_(2)O_(3) mixed transparent conductive BaInSnO_(x)(BITO)film deposited by filtered cathodic vacuum arc technique(FCVA)on glass substrate at room temperature were firstly reported.The BITO film with thickness of 300 nm had mainly In_(2)O_(3) polycrystalline phase,and minor polycrystalline BTO phase with(001),(011),(111),(002),(222)crystal faces which were first deposited at room temperature on amorphous glass.The transmittance was 70%–80%in the visible light region with linear refractive index of 1.94 and extinction coefficient of 0.004 at 550-nm wavelength.The basic optical properties included the real and imaginary parts,high frequency dielectric constants,the absorption coefficient,the Urbach energy,the indirect and direct band gaps,the oscillator and dispersion energies,the static refractive index and dielectric constant,the average oscillator wavelength,oscillator length strength,the linear and the third-order nonlinear optical susceptibilities,and the nonlinear refractive index were all calculated.The film was the n-type conductor with sheet resistance of 704.7Ω/□,resistivity of 0.02Ω⋅cm,mobility of 18.9 cm2/V⋅s,and carrier electron concentration of 1.6×10^(19) cm^(−3) at room temperature.The results suggested that the BITO film deposited by FCVA had potential application in transparent conductive films-based low temperature device process.

Investigation on the Novel High-performance Copper/Graphene Composite Conductor for High Power Density Motor

High-performance Cu/Graphene composite wire synergistically strengthened by nano Cr_(3)C_(2) phase was directly synthesized via hot press sintering followed by severe cold plastic deformation, using liquid paraffin and CuCr alloy powder as the raw materials. Since graphene is in situ formed under the catalysis of copper powder during the sintering process, the problem that graphene is easy to agglomerate and difficult to disperse uniformly in the copper matrix has been solved. The nano Cr_(3)C_(2)-particles nailed at the interface favor to improve the interface bonding. The Cu/Graphene composite possesses high electrical conductivity, hardness, and plasticity. The composite wire exhibits high electrical conductivity of 96.93% IACS, great tensile strength of 488MPa, and excellent resistance to softening. Even after annealing at 400℃ for 1 h, the tensile strength can still reach 268 MPa with a conductivity of about 99.14% IACS.The wire's temperature coefficient of resistance(TCR) is largely reduced to 0.0035/℃ due to the complex structure,which leads the wire to present low resistivity at higher temperatures. Such Cu/Graphene composite wire with excellent comprehensive performance has a good application prospect in high-power density motors.

Microstructure and Electrical Properties of Er_2O_3-Doped ZnO-Based Varistor Ceramics Prepared by High-Energy Ball Milling

The microstructure, electrical properties and density of ZnO-based varistor ceramics with different Er2O3 content prepared by high-energy ball milling （HEBM） and sintered at 800℃ were investigated. With increasing Er2O3 content, the ZnO grain size decreases due to the Er-rich phases inhibiting grain growth ; and nonlinear coefficient （ α ） decreases because of the decrease of barrier height （φB） The breakdown voltage （Eb） and density increase, whereas leakage current （IL） decreases with increasing Er2O3 content. The barrier height （φB）, donor concentration （Nd）, density of interface states （Ns） decrease and barrier width （ω） increases with increasing Er2O3 content due to acceptor effect of Er2O3 in varistor ceramics.

Effects of Rare-Earth La_2O_3 Addition on Microstructures and Electrical Properties of SrTiO_3 Varistor-Capacitor Dual Functional Ceramics

The effects of rare-earth La_2O_3 addition on microstructures and electrical properties of SrTiO_3 ceramics were investigated. Semiconductor SrTiO_3-based voltage-sensing and dielectric dual functional ceramics was prepared by a single step sintering technology in this study, and the effects of the content of La_2O_3 on characteristics of the product were discussed in terms of microstructures and electrical properties of materials. The results show that SrTiO_3-based ceramics doped with La_2O_3 exhibits more homogeneous grain distribution, greater grain size, and excellent voltage sensing and dielectric characteristics than those without La_2O_3 doping. The samples doped with 1 1% La_2O_3 were sintered at 1420 ℃ in N_2+C weak reducing atmosphere. The average grain size of the samples doped with La_2O_3 is 40 μm, the breakdown voltage of 19.7 V·mm^(-1), the nonlinear exponent of 7.2, and dielectric constant of 22500. The results reveal that final products are suitable to use in low operating voltage.

Study on the Property Evolution of Atmospheric Pressure Plasma Jets in Helium

Nowadays atmospheric pressure plasma jets （APPJs） are being widely applied to many fields and have received growing interests from cold plasma community. A helium APPJ with co-axial double ring electrode configuration is driven by an AC high voltage power with an adjustable frequency of 1-60 kHz. Experiments are conducted for acquiring the electrical and optical properties of APPJ, including the discharge mode, current peak＇s phase and APPJ＇s length, etc. Moreover, the actions of Penning effect on APPJ are discussed by adding impurity nitrogen into highly pure helium. The results may contribute to further research and aPPlications of APPJs.

Electrochemical anodic oxidation assisted fabrication of memristors

Owing to the advantages of simple structure,low power consumption and high-density integration,memristors or memristive devices are attracting increasing attention in the fields such as next generation non-volatile memories,neuromorphic computation and data encryption.However,the deposition of memristive films often requires expensive equipment,strict vacuum conditions,high energy consumption,and extended processing times.In contrast,electrochemical anodizing can produce metal oxide films quickly(e.g.10 s) under ambient conditions.By means of the anodizing technique,oxide films,oxide nanotubes,nanowires and nanodots can be fabricated to prepare memristors.Oxide film thickness,nanostructures,defect concentrations,etc,can be varied to regulate device performances by adjusting oxidation parameters such as voltage,current and time.Thus memristors fabricated by the anodic oxidation technique can achieve high device consistency,low variation,and ultrahigh yield rate.This article provides a comprehensive review of the research progress in the field of anodic oxidation assisted fabrication of memristors.Firstly,the principle of anodic oxidation is introduced;then,different types of memristors produced by anodic oxidation and their applications are presented;finally,features and challenges of anodic oxidation for memristor production are elaborated.

Achievable hole concentration at room temperature as a function of Mg concentration for MOCVD-grown p-GaN after sufficient annealing

Relationship between the hole concentration at room temperature and the Mg doping concentration in p-GaN grown by MOCVD after sufficient annealing was studied in this paper.Different annealing conditions were applied to obtain sufficient activation for p-GaN samples with different Mg doping ranges.Hole concentration,resistivity and mobility were characterized by room-temperature Hall measurements.The Mg doping concentration and the residual impurities such as H,C,O and Si were measured by secondary ion mass spectroscopy,confirming negligible compensations by the impurities.The hole concentration,resistivity and mobility data are presented as a function of Mg concentration,and are compared with literature data.The appropriate curve relating the Mg doping concentration to the hole concentration is derived using a charge neutrality equation and the ionized-acceptor-density[N-(A)^(-)](cm^(−3))dependent ionization energy of Mg acceptor was determined asE_(A)^(Mg)=184−2.66×10^(−5)×[N_(A)^(-)]1/3 meV.

Electronic properties of 2D materials and their junctions

With an extensive range of distinctive features at nano meter-scale thicknesses,two-dimensional(2D)materials drawn the attention of the scientific community.Despite tremendous advancements in exploratory research on 2D materials,knowledge of 2D electrical transport and carrier dynamics still in its infancy.Thus,here we highlighted the electrical characteristics of 2D materials with electronic band structure,electronic transport,dielectric constant,carriers mobility.The atomic thinness of 2D materials makes substantially scaled field-effect transistors(FETs)with reduced short-channel effects conceivable,even though strong carrier mobility required for high performance,low-voltage device operations.We also discussed here about factors affecting 2D materials which easily enhanced the activity of those materials for various applications.Presently,Those 2D materials used in state-of-the-art electrical and optoelectronic devices because of the extensive nature of their electronic band structure.2D materials offer unprecedented freedom for the design of novel p-n junction device topologies in contrast to conventional bulk semiconductors.We also,describe the numerous 2D p-n junctions,such as homo junction and hetero junction including mixed dimensional junctions.Finally,we talked about the problems and potential for the future.

Characterization of structural and electrical properties of ZnO tetrapods

ZnO tetrapods were synthesized by a typical thermal vapor-solid deposition method in a horizontal tube furnace.Structural characterization was carried out by transmission electron microscopy （TEM） and select-area electron diffraction （SAED）,which shows the presence of zinc blende nucleus in the center of tetrapods while the four branches taking hexagonal wurtzite structure.The electrical transport property of ZnO tetrapods was investigated through an in-situ nanoprobe system.The three branches of a tetrapod serve as source,drain,and ＂gate＂,respectively;while the fourth branch pointing upward works as the force trigger by vertically applying external force downward.The conductivity of each branch of ZnO-tetrapods increases 3-4 times under pressure.In such situation,the electrical current through the branches of ZnO tetrapods can be tuned by external force,and therefore a simple force sensor based on ZnO tetrapods has been demonstrated for the first time.

Effect of pressure on the electrical properties of flexible NiPc thin films fabricated by rubbing-in technology

Nickel phthalocyanine(Ni Pc) film was deposited onto the surface of flexible conductive glass by rubbing-in technology and used to fabricate devices based on ITO/Ni Pc/CNT/rubber structure. The I–V characteristics of the devices were investigated under different uniaxial pressures of 200, 280, and 480 gf/cm^(2), applied perpendicular to the surface of the Ni Pc film. Results showed that the nonlinearity coefficients of the I–V curves are in the range of 2 to 3, which was found to be decreased with the increase of the pressure. The rectification ratio of the devices was estimated to be varied from 1.5 to 3 based on the applied pressure. Concluding, the resistance of the active layers was decreased with the increase of both pressure and voltage. We believe that using the rubbing-in technology under sufficient applied pressure it is possible to utilize Ni Pc for the development of various electronic devices such as diodes, nonlinear resistors, and sensors.

Compositional Dependence of Surface Morphology and Electrical Properties of GaInAsSb Alloys Grown by Metalorganic Chemical Vapor Deposition

MOCVD growth and characterization of GaSb rich and InAs rich GaInAsSb on GaSb substrates were investigated. The surface of InAs rich GaInAsSb epilayer was different from GaSb rich film. The flux of TMSb in vapor phase might be the cause of the different surface features between GaSb rich and InAs rich epilayers. The n type conduction of InAs rich GaInAsSb was also different from GaSb rich samples. The p type conduction is often attributed to native lattice defect or carbon impurity on group Ⅴ sites. Carbon might occupies group Ⅲ sites as donor in InAs rich GaInAsSb film. The strength of the chemical bonding between carbon and group Ⅲ or group Ⅴ elements had much to do with the carbon impurity site preference, resulting in the two type conductions of GaInAsSb film grown by MOCVD.

Monitoring Method for the Electrical Properties of Piezoelectric Transducer

The monitoring of cutting force in a vibration cutting process has a great significance in the popularization of ultrasonic vibration cutting technology. A new monitoring method of which the cutting force of ultrasonic elliptic vibration cutting is monitored using the electrical properties of transducer was proposed by studying on the relationship of cutting force, transducer electric impedance and load. A measurement system was designed for the electrical properties of transducer. The feasibility of cutting force monitoring method based on the electrical properties of piezoelectric transducer was proved by the cutting experiments.

Electrical properties of nano-silver/polyacrylamide/ethylene vinyl acetate composite

Nano-Ag particles/polyacrylamide （PAM） composites were synthesized by γ irradiation method and then blended with ethylene vinyl acetate （EVA）. Dielectric behaviors of the Ag/PAM/EVA composites are investigated as a function of both the concentration and size of Ag particles. When concentration of the Ag fillers is rarely low, dielectric anomalies were first observed in contrast to the traditional percolation theory. As concentration of Ag increases, volume resistivity and breakdown field strength are enhanced, loss tangent （tan δ） reduced and dielectric constant kept invariable. In addition, the above variation became larger when the diameter of the Ag nano-particles is smaller. Such dielectric anomalies may be understood by considering the unique ＂Coulomb Blockade Effect＂ of the nano-sized Ag particles.

improvement of electrical properties of Cu/SiCOH low-k film integrated system by O2 plasma treatment

This paper investigates the effect of O2 plasma treatment on the electric property of Cu/SiCOH low dielectric constant （low-k） film integrated structure. The results show that the leakage current of Cu/SiCOH low-k integrated structure can be reduced obviously at the expense of a slight increase in dielectric constant k of SiCOH films. Bythe Fourier transform infrared （FTIR） analysis on the bonding configurations of SiCOH films treated by O2 plasmar it is found that the decrease of leakage current is related to the increase of Si-O cages originating from the linkage of Si dangling bonds through O, which makes the open pores sealed and reduces the diffusion of Cu to pores.