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Optimization of extreme ultraviolet vortex beam based on high harmonic generation
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作者 肖礴 赵逸文 +6 位作者 程方晶 王革文 姜威 王一琛 胡杰 梁红静 马日 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第5期459-464,共6页
In high harmonic generation(HHG),Laguerre–Gaussian(LG) beams are used to generate extreme ultraviolet(XUV)vortices with well-defined orbital angular momentum(OAM),which have potential applications in fields such as m... In high harmonic generation(HHG),Laguerre–Gaussian(LG) beams are used to generate extreme ultraviolet(XUV)vortices with well-defined orbital angular momentum(OAM),which have potential applications in fields such as microscopy and spectroscopy.An experimental study on the HHG driven by vortex and Gaussian beams is conducted in this work.It is found that the intensity of vortex harmonics is positively correlated with the laser energy and gas pressure.The structure and intensity distribution of the vortex harmonics exhibit significant dependence on the relative position between the gas jet and the laser focus.The ring-like structures observed in the vortex harmonics,and the interference of quantum paths provide an explanation for the distinct structural characteristics.Moreover,by adjusting the relative position between the jet and laser focus,it is possible to discern the contributions from different quantum paths.The optimization of the HH vortex field is applicable to the XUV,which opens up a new way for exploiting the potential in optical spin or manipulating electrons by using the photon with tunable orbital angular momentum. 展开更多
关键词 high harmonic generation phase matching extreme ultraviolet vortex beam quantum path interference
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A laser-produced plasma source based on thin-film Gd targets for next-generation extreme ultraviolet lithography
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作者 陈笑 黎遥 +5 位作者 侯鉴波 张哲 陆显扬 严羽 何亮 徐永兵 《Plasma Science and Technology》 SCIE EI CAS CSCD 2023年第10期1-5,共5页
We have studied laser-produced plasma based on mass-limited thin-film Gd targets for beyond the current extreme ultraviolet(EUV)light source of 13.5 nm wavelength based on tin.The influences of the laser intensity on ... We have studied laser-produced plasma based on mass-limited thin-film Gd targets for beyond the current extreme ultraviolet(EUV)light source of 13.5 nm wavelength based on tin.The influences of the laser intensity on the emission spectra centered around 6.7 nm from thin-film Gd targets were first investigated.It is found that the conversion efficiency of the produced plasma is saturated when the laser intensity goes beyond 2×10^(11)W cm^(-2).We have systematically compared the emission spectra of the laser-produced plasma with the changes in the thicknesses of the thin-film Gd targets.It is proved that a minimum-mass target with a thickness of 400 nm is sufficient to provide the maximum conversion efficiency,which also implies that this thickness is the ablation depth for the targets.These findings should be helpful in the exploration of next-generation EUV sources,as the thin-film Gd targets will reduce the debris during the plasma generation process compared with the bulk targets. 展开更多
关键词 extreme ultraviolet light source laser-produced plasma GADOLINIUM
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Data processing and initial results from the CE-3 Extreme Ultraviolet Camera 被引量:3
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作者 Jian-Qing Feng Jian-Jun Liu +10 位作者 Fei He Wei Yan Xin Ren Xu Tan Ling-Ping He Bo Chen Wei Zuo Wei-Bin Wen Yan Su Yong-Liao Zou Chun-Lai Li 《Research in Astronomy and Astrophysics》 SCIE CAS CSCD 2014年第12期1664-1673,共10页
The Extreme Ultraviolet Camera (EUVC) onboard the Chang'e-3 (CE-3) lander is used to observe the structure and dynamics of Earth's plasmasphere from the Moon. By detecting the resonance line emission of helium i... The Extreme Ultraviolet Camera (EUVC) onboard the Chang'e-3 (CE-3) lander is used to observe the structure and dynamics of Earth's plasmasphere from the Moon. By detecting the resonance line emission of helium ions (He+) at 30.4 nm, the EUVC images the entire plasmasphere with a time resolution of 10 min and a spatial resolution of about 0.1 Earth radius (RE) in a single frame. We first present details about the data processing from EUVC and the data acquisition in the commissioning phase, and then report some initial results, which reflect the basic features of the plas- masphere well. The photon count and emission intensity of EUVC are consistent with previous observations and models, which indicate that the EUVC works normally and can provide high quality data for future studies. 展开更多
关键词 space vehicles: instruments: extreme ultraviolet Camera -- Earth: plas-masphere -- method: data processing
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Spectral Efficiency of Extreme Ultraviolet Emission from CO_2 Laser-Produced Tin Plasma Using a Grazing Incidence Flat-Field Spectrograph
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作者 吴涛 王新兵 王少义 《Plasma Science and Technology》 SCIE EI CAS CSCD 2013年第5期435-438,共4页
A grazing incidence flat-field spectrograph using a concave grating was constructed to measure extreme ultraviolet (EUV) emission from a CO 2 laser-produced tin plasma throughout the wavelength region of 5 nm to 20 ... A grazing incidence flat-field spectrograph using a concave grating was constructed to measure extreme ultraviolet (EUV) emission from a CO 2 laser-produced tin plasma throughout the wavelength region of 5 nm to 20 nm for lithography. Spectral efficiency of the EUV emission around 13.5 nm from plate, cavity, and thin foil tin targets was studied. By translating the focusing lens along the laser axis, the dependence of EUV spectra on the amount of defocus was investigated. The results showed that the spectral efficiency was higher for the cavity target in comparison to the plate or foil target, while it decreased with an increase in the defocus distance. The source's spectra and the EUV emission intensity normalized to the incident pulse energy at 45 from the target normal were characterized for the in-band (2% of bandwidth) region as a function of laser energy spanning from 46 mJ to 600 mJ for the pure tin plate target. The energy normalized EUV emission was found to increase with the increasing incident pulse energy. It reached the optimum value for the laser energy of around 343 mJ, after which it dropped rapidly. 展开更多
关键词 laser-produced plasma extreme ultraviolet (EUV) emission CO2 laser spec-tral efficiency EUV lithography
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Analysis of extreme ultraviolet spectra of laser-produced Cd plasmas
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作者 Mohammedelnazier Bakhiet Maogen Su +5 位作者 Shiquan Cao Qi Min Duixiong Sun Siqi He Lei Wu Chenzhong Dong 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第7期375-382,共8页
In order to provide detailed information about Cd structure and gain more insight regarding ionization degrees and types of transition,as well as the understanding of the temporal evolution behavior of laser produced ... In order to provide detailed information about Cd structure and gain more insight regarding ionization degrees and types of transition,as well as the understanding of the temporal evolution behavior of laser produced Cd plasmas,extreme ultraviolet spectra of laser-produced cadmium(Cd)plasmas have been measured in the 8.4-12 nm region using spatiotemporally resolved laser-produced plasma spectroscopy technique.Spectral features were analyzed by the Hartree-Fock(HF)method with relativistic correlations(HFR)using the Cowan code.The results showed that the 4p-5s resonance transition arrays from Cd^9+to Cd^13+merged to form intense lines in this spectral region.A number of new spectral features from Cd^9+and Cd^10+ions are reported in this study.Based on the assumption of a normalized Boltzmann distribution among the excited states associated with a steady-state collisional-radiative model,the plasma parameters were obtained by comparing the experimental and simulated spectra.As a result,we succeeded in reproducing the synthetic spectra for different time delays,which yielded good agreement with the experiments.The temporal evolution behaviors of electron temperature and electron density of plasma were also analyzed. 展开更多
关键词 extreme ultraviolet spectra laser-produced plasmas collisional-radiative model CADMIUM
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Micro-pinch formation and extreme ultraviolet emission of laser-induced discharge plasma
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作者 Jun-Wu Wang Xin-Bing Wang +1 位作者 Du-Luo Zuo Vassily S.Zakharov 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第9期355-363,共9页
Extreme ultraviolet(EUV)source produced by laser-induced discharge plasma(LDP)is a potential technical means in inspection and metrology.A pulsed Nd:YAG laser is focused on a tin plate to produce an initial plasma the... Extreme ultraviolet(EUV)source produced by laser-induced discharge plasma(LDP)is a potential technical means in inspection and metrology.A pulsed Nd:YAG laser is focused on a tin plate to produce an initial plasma thereby triggering a discharge between high-voltage electrodes in a vacuum system.The process of micro-pinch formation during the current rising is recorded by a time-resolved intensified charge couple device camera.The evolution of electron temperature and density of LDP are obtained by optical emission spectrometry.An extreme ultraviolet spectrometer is built up to investigate the EUV spectrum of Sn LDP at 13.5 nm.The laser and discharge parameters such as laser energy,voltage,gap distance,and anode shape can influence the EUV emission. 展开更多
关键词 laser-induced discharge plasma micro-pinch electron temperature and density extreme ultraviolet spectra
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Design of broad angular phase retarders for the complete polarization analysis of extreme ultraviolet radiation
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作者 林承友 陈淑静 +1 位作者 陈朝阳 丁迎春 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第11期512-517,共6页
A method of designing broad angular phase retarders in the extreme ultraviolet (EUV) region is presented. The design is based on a standard Levenberg-Marquardt algorithm combined with a common merit function. Using ... A method of designing broad angular phase retarders in the extreme ultraviolet (EUV) region is presented. The design is based on a standard Levenberg-Marquardt algorithm combined with a common merit function. Using this method, a series of broad angular EUV phase retarders were designed using aperiodic Mo/Si multilayers. At photon energy of 90 eV, broad angular phase retarders with 30°, 60°, and 90° phase retardations have been realized in the angular range of 39°-51°. By analyzing and comparing the performances of the designed broad angular phase retarders, we found that the Mo/Si multilayer with more layers could obtain higher phase retardation in broader angular range when used to design the broad angular phase retarder. Broad angular phase retarders possess lower sensitivity toward changing incident angle compared with the traditional phase retarders designed with transmission periodic multilayers, and can be used for the polarization control of broad angular EUV sources. 展开更多
关键词 broad angular phase retarders extreme ultraviolet radiation polarization analysis
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Design optimization of broadband extreme ultraviolet polarizer in high-dimensional objective space
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作者 Shang-Qi Kuang Bo-Chao Li +2 位作者 Yi Wang Xue-Peng Gong Jing-Quan Lin 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第7期579-585,共7页
With the purpose of designing the extreme ultraviolet polarizer with many objectives,a combined application of multiobjective genetic algorithms is theoretically proposed.Owing to the multi-objective genetic algorithm... With the purpose of designing the extreme ultraviolet polarizer with many objectives,a combined application of multiobjective genetic algorithms is theoretically proposed.Owing to the multi-objective genetic algorithm,the relationships between different designing objectives of extreme ultraviolet polarizer have been obtained by analyzing the distribution of nondominated solutions in the four-dimensional objective space,and the optimized multilayer design can be obtained by guiding the searching in the desired region based on the multi-objective genetic algorithm with reference direction.Compared with the conventional method of multilayer design,our method has a higher probability of achieving the optimal multilayer design.Our work should be the first research in optimizing the optical multilayer designs in the high-dimensional objective space,and our results demonstrate a potential application of our method in the designs of optical thin films. 展开更多
关键词 extreme ultraviolet polarizer multilayer design multi-objective genetic algorithm
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Direct Coulomb explosion of N2O2+induced by monochromatic extreme ultraviolet photons at 38.5 eV
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作者 Min Zhang B Najjari +5 位作者 Bang Hai Dong-Mei Zhao Jian-Ting Lei Da-Pu Dong Shao-Feng Zhang Xin-Wen Ma 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第6期159-163,共5页
The direct Coulomb explosion of N2O2+has been investigated experimentally after double-ionization by a single extreme ultraviolet(EUV)photon with an energy of ~38.5 eV.From the ion–ion time-of-flight coincidence spec... The direct Coulomb explosion of N2O2+has been investigated experimentally after double-ionization by a single extreme ultraviolet(EUV)photon with an energy of ~38.5 eV.From the ion–ion time-of-flight coincidence spectrum,the de-nitrogenation(N2O2+→N++NO+)and de-oxygenation(N2O2+→O++N+2)photodissociation channels of N2O2+are unequivocally identified.The measured kinetic energy release(KER)distribution of the de-nitrogenation channel presents a major peak accompanied by a shoulder structure.We find that the major peak can be attributed to the direct photodissociation of the 11△and 1^1Σ+states,while the shoulder structure should be ascribed to the predissociation of the1^1△and 1^1Σ+states via 13Πstate. 展开更多
关键词 extreme ultraviolet photon kinetic energy release photodissociation pathway
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Higher order harmonics suppression in extreme ultraviolet and soft x-ray
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作者 陈勇 魏来 +6 位作者 钱凤 杨祖华 王少义 巫殷忠 张强强 范全平 曹磊峰 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第2期344-348,共5页
The extreme ultraviolet and soft x-ray sources are widely used in various domains. Suppressing higher order harmonics and improving spectral purity are significant. This paper describes a novel method of higher order ... The extreme ultraviolet and soft x-ray sources are widely used in various domains. Suppressing higher order harmonics and improving spectral purity are significant. This paper describes a novel method of higher order harmonics suppression with single order diffraction gratings in extreme ultraviolet and soft x-ray. The principle of harmonic suppression with single order diffraction grating is described, and an extreme ultraviolet and soft x-ray non-harmonics grating monochromator is designed based on the single order diffraction grating. The performance is simulated by an optical design software. The emergent beams of a monochromator with different gratings are measured by a transmission grating spectrometer. The results show that the single order diffraction grating can suppress higher order harmonics effectively, and it is expected to be widely used in synchrotron radiation, diagnostics of laser induced plasma, and astrophysics. 展开更多
关键词 higher order harmonics suppression extreme ultraviolet and soft x-ray monochromator single order diffraction grating
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Spectral purity systems applied for laser-produced plasma extreme ultraviolet lithography sources:a review 被引量:3
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作者 Nan Lin Yunyi Chen +2 位作者 Xin Wei Wenhe Yang Yuxin Leng 《High Power Laser Science and Engineering》 SCIE CAS CSCD 2023年第5期137-152,共16页
With the development of high-volume manufacturing for very-large-scale integrated circuits,the purity of the light source in the extreme ultraviolet lithography(EUVL)system needs to fulfil extreme requirements in orde... With the development of high-volume manufacturing for very-large-scale integrated circuits,the purity of the light source in the extreme ultraviolet lithography(EUVL)system needs to fulfil extreme requirements in order to avoid thermal effect,optical distortion and critical dimension errors caused by out-of-band radiations.This paper reviews the key technologies and developments of the spectral purity systems for both a free-standing system and a built-in system integrated with the collector.The main challenges and developing trends are also discussed,with a view towards practical applications for further improvement.Designing and manufacturing spectral purity systems for EUVL is not a single task;rather,it requires systematic considerations for all relevant modules.Moreover,the requirement of spectral purity filters drives the innovation in filtering technologies,optical micromachining and advanced metrology. 展开更多
关键词 collector mirror extreme ultraviolet lithography spectral purity filter
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Exploring new avenues in high repetition rate table-top coherent extreme ultraviolet sources 被引量:9
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作者 Steffen Hadrich Manuel Krebs +4 位作者 Armin Hoffmann Arno Klenke Jan Rothhardt Jens Limpert Andreas Tunnermann 《Light(Science & Applications)》 SCIE EI CAS CSCD 2015年第1期231-236,共6页
The process of high harmonic generation(HHG)enables the development of table-top sources of coherent extreme ultraviolet(XUV)light.Although these are now matured sources,they still mostly rely on bulk laser technology... The process of high harmonic generation(HHG)enables the development of table-top sources of coherent extreme ultraviolet(XUV)light.Although these are now matured sources,they still mostly rely on bulk laser technology that limits the attainable repetition rate to the low kilohertz regime.Moreover,many of the emerging applications of such light sources(e.g.,photoelectron spectroscopy and microscopy,coherent diffractive imaging,or frequency metrology in the XUV spectral region)require an increase in the repetition rate.Ideally,these sources are operated with a multi-MHz repetition rate and deliver a high photon flux simultaneously.So far,this regime has been solely addressed using passive enhancement cavities together with low energy and high repetition rate lasers.Here,a novel route with significantly reduced complexity(omitting the requirement of an external actively stabilized resonator)is demonstrated that achieves the previously mentioned demanding parameters.A krypton-filled Kagome photonic crystal fiber is used for efficient nonlinear compression of 9 μJ,250 fs pulses leading to,7 μJ,31 fs pulses at 10.7 MHz repetition rate.The compressed pulses are used for HHG in a gas jet.Particular attention is devoted to achieving phase-matched(transiently)generation yielding.10^(13) photons s^(-1)(.50 μW)at 27.7 eV.This new spatially coherent XUV source improved the photon flux by four orders of magnitude for direct multi-MHZ experiments,thus demonstrating the considerable potential of this source. 展开更多
关键词 coherent extreme ultraviolet sources high average power high harmonic generation nonlinear compression ultrafast laser
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All-reflective optical system design for extreme ultraviolet lithography 被引量:3
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作者 常军 邹美芳 +2 位作者 王蕊瑞 冯树龙 M.M.Talha 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第11期1082-1084,共3页
All-reflective optical systems,due to their material absorption and low refractive index,are used to create the most suitable devices in extreme ultraviolet lithography (EUVL).In this letter,we present a design for ... All-reflective optical systems,due to their material absorption and low refractive index,are used to create the most suitable devices in extreme ultraviolet lithography (EUVL).In this letter,we present a design for an all-reflective lithographic projection lens.We also discuss its design idea and structural system.After analysis of the four-mirror optical system,the initial structural parameters are determined,the optical system is optimized,and the tolerances of the system are analyzed.We also show the implementation of optimal layout and desired imaging performance. 展开更多
关键词 DESIGN extreme ultraviolet lithography OPTIMIZATION Refractive index Systems analysis
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Line identification of boron and nitrogen emissions in extreme-and vacuumultraviolet wavelength ranges in the impurity powder dropping experiments of the Large Helical Device and its application to spectroscopic diagnostics
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作者 Tetsutarou OISHI Naoko ASHIKAWA +12 位作者 Federico NESPOLI Suguru MASUZAKI Mamoru SHOJI Eric P GILSON Robert LUNSFORD Shigeru MORITA Motoshi GOTO Yasuko KAWAMOTO Chihiro SUZUKI Zhen SUN Alex NAGY David A GATES Tomohiro MORISAKI 《Plasma Science and Technology》 SCIE EI CAS CSCD 2021年第8期6-17,共12页
An impurity powder dropper was installed in the 21 st campaign of the Large Helical Device experiment(Oct.2019–Feb.2020)under a collaboration between the National Institute for Fusion Science and the Princeton Plasma... An impurity powder dropper was installed in the 21 st campaign of the Large Helical Device experiment(Oct.2019–Feb.2020)under a collaboration between the National Institute for Fusion Science and the Princeton Plasma Physics Laboratory for the purposes of real-time wall conditioning and edge plasma control.In order to assess the effective injection of the impurity powders,spectroscopic diagnostics were applied to observe line emission from the injected impurity.Thus,extreme-ultraviolet(EUV)and vacuum-ultraviolet(VUV)emission spectra were analyzed to summarize observable impurity lines with B and BN powder injection.Emission lines released from B and N ions were identified in the EUV wavelength range of 5–300Ameasured using two grazing incidence flat-field EUV spectrometers and in the VUV wavelength range of 300–2400Ameasured using three normal incidence 20 cm VUV spectrometers.BI–BV and NIII–NVII emission lines were identified in the discharges with the B and BN powder injection,respectively.Useful B and N emission lines which have large intensities and are isolated from other lines were successfully identified as follows:BI(1825.89,1826.40)A(blended),BII 1362.46A,BIII(677.00,677.14,677.16)A(blended),BIV 60.31A,BV 48.59A,NIII(989.79,991.51,991.58)A(blended),NIV765.15A,NV(209.27,209.31)A(blended),NVI 1896.80A,and NVII 24.78A.Applications of the line identifications to the advanced spectroscopic diagnostics were demonstrated,such as the vertical profile measurements for the BV and NVII lines using a space-resolved EUV spectrometer and the ion temperature measurement for the BII line using a normal incidence 3 m VUV spectrometer. 展开更多
关键词 plasma spectroscopy extreme ultraviolet vacuum ultraviolet magnetically confined fusion impurity seeding wall conditioning
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A Model for Extreme Ultraviolet Radiation Conversion Efficiency From Laser Produced Mass-Limited Tin-Based Droplet Target Plasmas
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作者 吴涛 王新兵 +1 位作者 余仕成 熊伦 《Communications in Theoretical Physics》 SCIE CAS CSCD 2012年第4期695-700,共6页
Simple arguments are used to construct a model to explain the extreme ultraviolet radiation conversion efficiency(EUV-CE) of a tin-based droplet target laser produced plasmas by calculating the laser absorption effici... Simple arguments are used to construct a model to explain the extreme ultraviolet radiation conversion efficiency(EUV-CE) of a tin-based droplet target laser produced plasmas by calculating the laser absorption efficiency,radiation efficiency,and spectral efficiency.The dependence of drive laser pulse duration and laser intensity on EUV-CE is investigated.The results show that at some appropriate laser intensity,where the sum energy of the thermal conduction,out-off band radiation and plasma plume kinetic losses is at a minimum,the EUV-CE should reach a maximum.The EUV-CE predicted by the present simple model is also compared with the available experimental and simulation data and a fair agreement between them is found. 展开更多
关键词 conversion efficiency laser produced plasma extreme ultraviolet lithography
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Characteristics of laser induced discharge tin plasma and its extreme ultraviolet radiation
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作者 Junwu WANG Xinbing WANG Duluo ZUO 《Frontiers of Optoelectronics》 EI CSCD 2021年第3期352-359,共8页
In this paper,a CO_(2) laser induced discharge plasma extreme ultraviolet(EUV)source experimental device was established.The optical emission spectroscopy was used to diagnose the characteristics of the plasma,and the... In this paper,a CO_(2) laser induced discharge plasma extreme ultraviolet(EUV)source experimental device was established.The optical emission spectroscopy was used to diagnose the characteristics of the plasma,and the evolution of electron temperature and electron density with time was obtained.The influence of discharge voltage on plasma parameters was analyzed and discussed.The EUV radiation characteristics of the plasma were investigated by self-made grazing incidence EUV spectrometer.The EUV radiation intensity and conversion efficiency were discussed. 展开更多
关键词 extreme ultraviolet(EUV)radiation laser induced discharge plasma optical emission spectroscopy electron temperature and density
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Strong-field effects induced in the extreme ultraviolet domain
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作者 I.Makos I.Orfanos +5 位作者 E.Skantzakis I.Liontos P.Tzallas A.Forembski L.A.A.Nikolopoulos D.Charalambidis 《High Power Laser Science and Engineering》 SCIE CAS CSCD 2020年第4期119-128,共10页
Motivated by the achieved high intensities of novel extreme ultraviolet(XUV)radiation sources,such as free electron lasers and laser-driven high harmonic generation beamlines,we elaborate on their perspective in induc... Motivated by the achieved high intensities of novel extreme ultraviolet(XUV)radiation sources,such as free electron lasers and laser-driven high harmonic generation beamlines,we elaborate on their perspective in inducing observable strong field effects.The feasibility of extending such effects from the infrared and visible spectral regimes in the XUV domain is supported through numerically calculated models of near-future experiments.We highlight the advancement of performing studies in the time domain,using ultra-short XUV pulses,which allows for the temporal evolution of such effects to be followed.Experimental and theoretical obstacles and limitations are further discussed. 展开更多
关键词 strong field extreme ultraviolet high harmonic generation
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Latest developments in EUV photoresist evaluation capability at Shanghai Synchrotron Radiation Facility 被引量:1
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作者 Zhen‑Jiang Li Cheng‑Hang Qi +8 位作者 Bei‑Ning Li Shu‑Min Yang Jun Zhao Zhi‑Di Lei Shi‑Jie Zhu Hao Shi Lu Wang Yan‑Qing Wu Ren‑Zhong Tai 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2023年第12期206-215,共10页
Evaluating the comprehensive characteristics of extreme ultraviolet(EUV)photoresists is crucial for their application in EUV lithography,a key process in modern technology.This paper highlights the capabilities of the... Evaluating the comprehensive characteristics of extreme ultraviolet(EUV)photoresists is crucial for their application in EUV lithography,a key process in modern technology.This paper highlights the capabilities of the Shanghai Synchrotron Radiation Facility(SSRF)08U1B beamline in advancing this field.Specifically,it demonstrates how this beamline can create fringe patterns with a 15-nm half-pitch on a resist using synchrotron-based EUV lithography.This achievement is vital for evaluating EUV photoresists at the advanced 5-nm node.We provide a detailed introduction to the methods and experimental setup used at the SSRF 08U1B beamline to assess an EUV photoresist.A significant part of this research involved the fabrication of high-resolution hydrogen silsesquioxane mask gratings.These gratings,with an aspect ratio of approximately 3,were created using electron beam lithography on an innovative mask framework.This framework was crucial in eliminating the impact of zeroth-order light on interference patterns.The proposed framework propose offers a new approach to mask fabrication,particularly beneficial for achromatic Talbot lithography and multicoherent-beam interference applications. 展开更多
关键词 extreme ultraviolet photoresist Interference lithography HIGH-RESOLUTION Electron beam lithography·Hydrogen silsesquioxane GRATING
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Lensless diffractive imaging with ultra-broadbandtable-top sources: from infrared to extreme-ultravioletwavelengths 被引量:6
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作者 Stefan Witte Vasco T Tenner +1 位作者 Daniel WE Noom Kjeld SE Eikema 《Light(Science & Applications)》 SCIE EI CAS 2014年第1期274-281,共8页
Lensless imaging is an approach to microscopy in which a high-resolution image of an object is reconstructed from one or more measured diffraction patterns,providing a solution in situations where the use of imaging o... Lensless imaging is an approach to microscopy in which a high-resolution image of an object is reconstructed from one or more measured diffraction patterns,providing a solution in situations where the use of imaging optics is not possible.However,current lensless imaging methods are typically limited by the need for a light source with a narrow,stable and accurately known spectrum.We have developed a general approach to lensless imaging without spectral bandwidth limitations or sample requirements.We use two time-delayed coherent light pulses and show that scanning the pulse-to-pulse time delay allows the reconstruction of diffraction-limited images for all the spectral components in the pulse.In addition,we introduce an iterative phase retrieval algorithm that uses these spectrally resolved Fresnel diffraction patterns to obtain high-resolution images of complex extended objects.We demonstrate this two-pulse imaging method with octave-spanning visible light sources,in both transmission and reflection geometries,and with broadband extreme-ultraviolet radiation from a high-harmonic generation source.Our approach enables effective use of low-flux ultra-broadband sources,such as table-top high-harmonic generation systems,for high-resolution imaging. 展开更多
关键词 coherent diffractive imaging extreme ultraviolet Fourier transform spectroscopy high-harmonic generation lensless imaging
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Spectral and ion emission features of laser-produced Sn and SnO2 plasmas 被引量:1
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作者 兰慧 王新兵 左都罗 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第3期249-255,共7页
We have made a detailed comparison of the atomic and ionic debris, as well as the emission features of Sn and SnO2 plasmas under identical experimental conditions. Planar slabs of pure metal Sn and ceramic SnO2 are ir... We have made a detailed comparison of the atomic and ionic debris, as well as the emission features of Sn and SnO2 plasmas under identical experimental conditions. Planar slabs of pure metal Sn and ceramic SnO2 are irradiated with 1.06 μm, 8 ns Nd:YAG laser pulses. Fast photography employing an intensified charge coupled device (ICCD), optical emission spectroscopy (OES), and optical time of flight emission spectroscopy are used as diagnostic tools. Our results show that the Sn plasma provides a higher extreme ultraviolet (EUV) conversion efficiency (CE) than the SnO2 plasma. However, the kinetic energies of Sn ions are relatively low compared with those of SnO2. OES studies show that the Sn plasma parameters (electron temperature and density) are lower compared to those of the SnO2 plasma. Furthermore, we also give the effects of the vacuum degree and the laser pulse energy on the plasma parameters. 展开更多
关键词 laser-produced plasma Nd:YAG laser ion emission extreme ultraviolet emission
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