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BOARD-LEVEL BUILT-IN SELF-REPAIR METHOD OF RAM 被引量:1
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作者 DOU Yanjie Zhan Huiqin +1 位作者 Chen Yakun Shang Hongliang 《Journal of Electronics(China)》 2012年第1期128-131,共4页
This paper describes the method of built-in self-repairing of RAM on board, designs hardware circuit, and logic for the RAM's faults self-repairing system based on FPGA. The key technology is that it utilizes FPGA... This paper describes the method of built-in self-repairing of RAM on board, designs hardware circuit, and logic for the RAM's faults self-repairing system based on FPGA. The key technology is that it utilizes FPGA to test RAM according to some algorithm to find out failure memory units and replace the faulty units with FPGA. Then it can build a memory that has no fault concern to external controller, and realizes the logic binding between external controller and RAM. Micro Controller Unit (MCU) can operate external RAM correctly even if RAM has some fault address units. Conventional MCS-51 is used to simulate the operation of MCU operating external memory. Simulation shows FPGA can complete the faulty address units' mapping and MCU can normally read and write external RAM. This design realizes the RAM's built-in self-repairing on board. 展开更多
关键词 RAM testing Built-in self-repairing faulty address mapping Function test
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