用先磁控溅射多层金属膜预置层后硫化的方法成功制备出CZGe_xT_(1-x)S薄膜,并主要研究了Ge含量对于该薄膜光电学性能的影响。分别采用X射线衍射仪、X射线能量色散谱仪、拉曼光谱仪、扫描电子显微镜,紫外-可见-近红外分光光度计和霍尔效...用先磁控溅射多层金属膜预置层后硫化的方法成功制备出CZGe_xT_(1-x)S薄膜,并主要研究了Ge含量对于该薄膜光电学性能的影响。分别采用X射线衍射仪、X射线能量色散谱仪、拉曼光谱仪、扫描电子显微镜,紫外-可见-近红外分光光度计和霍尔效应测量仪对不同Ge含量的CZGe_xT_(1-x)S薄膜的物相结构、元素比例、表面形貌、光学带隙以及电学性能进行了表征与分析。结果表明随着Ge含量的升高,晶粒尺寸不断长大,光学带隙从1.52上升至2.12 e V。同时,Ge替换Sn可减少薄膜内的缺陷,所制备的CZGe S薄膜的载流子浓度与迁移率分别为1.99×1018cm-3与9.712 cm2/Vs。展开更多
Displacement damage dose (Dd) approach was applied to analyze the electron irradiation-induced degradation of GaInP/ GaAs/Ge space solar cells by effective 1 MeV electron Dd, the electron irradiation-induced maximum p...Displacement damage dose (Dd) approach was applied to analyze the electron irradiation-induced degradation of GaInP/ GaAs/Ge space solar cells by effective 1 MeV electron Dd, the electron irradiation-induced maximum power Pmax degradation of the solar cells is plotted as a function of the effective 1 MeV electron Dd , and the result shows that all the measured electron data can be represented by a single curve using displacement damage dose. Obviously, the displacement damage dose approach simplifies the description of electron irradiation-induced degradation of GaInP/GaAs/Ge space solar cells, and also offers an alternative for handling the case where degradation occurs as a result of combined electron and proton irradiation.展开更多
文摘用先磁控溅射多层金属膜预置层后硫化的方法成功制备出CZGe_xT_(1-x)S薄膜,并主要研究了Ge含量对于该薄膜光电学性能的影响。分别采用X射线衍射仪、X射线能量色散谱仪、拉曼光谱仪、扫描电子显微镜,紫外-可见-近红外分光光度计和霍尔效应测量仪对不同Ge含量的CZGe_xT_(1-x)S薄膜的物相结构、元素比例、表面形貌、光学带隙以及电学性能进行了表征与分析。结果表明随着Ge含量的升高,晶粒尺寸不断长大,光学带隙从1.52上升至2.12 e V。同时,Ge替换Sn可减少薄膜内的缺陷,所制备的CZGe S薄膜的载流子浓度与迁移率分别为1.99×1018cm-3与9.712 cm2/Vs。
基金supported by the National Natural Science Foundation of China (Grant Nos. 10675023 and 11075018)the Fundamental Research Funds for the Central Universities
文摘Displacement damage dose (Dd) approach was applied to analyze the electron irradiation-induced degradation of GaInP/ GaAs/Ge space solar cells by effective 1 MeV electron Dd, the electron irradiation-induced maximum power Pmax degradation of the solar cells is plotted as a function of the effective 1 MeV electron Dd , and the result shows that all the measured electron data can be represented by a single curve using displacement damage dose. Obviously, the displacement damage dose approach simplifies the description of electron irradiation-induced degradation of GaInP/GaAs/Ge space solar cells, and also offers an alternative for handling the case where degradation occurs as a result of combined electron and proton irradiation.