Applying seepage modeling to improve sediment yield predictions in contour ridge systems

Contour ridge systems may lead to seepage that could result in serious soil erosion. Modeling soil erosion under seepage conditions in a contour ridge system has been overlooked in most current soil erosion models. To address the importance of seepage in soil erosion modeling, a total of 23 treatments with 3 factors, row grade, field slope and ridge height, in 5 gradients were arranged in an orthogonal rotatable central composite design. The second-order polynomial regression model for predicting the sediment yield was improved by using the measured or predicted seepage discharge as an input factor, which increased the coefficient of determination(R^2) from 0.743 to 0.915 or 0.893. The improved regression models combined with the measured seepage discharge had a lower P(0.007) compared to those combined with the predicted seepage discharge(P=0.016). With the measured seepage discharge incorporated, some significant(P<0.050) effects and interactions of influential factors on sediment yield were detected, including the row grade and its interactions with the field slope, ridge height and seepage discharge, the quadratic terms of the field slope and its interactions with the row grade and seepage discharge. In the regression model with the predicted seepage discharge as an influencing factor, only the interaction between row grade and seepage discharge significantly affected the sediment yield. The regression model incorporated with predicted seepage discharge may be expressed simply and can be used effectively when measured seepage discharge data are not available.

Research on LTE Network Coverage Planning

When deploying an LTE network, coverage planning is critical to reduce construction costs and ensure network quality. This paper considers actual network planning requirements and combines theory with simulation analysis to study LTE wireless access link and network characteristics. A theory for LTE cellular coverage planning and application methods is proposed that lays the basic foundation for LTE cellular networks.

OUT-OF-PLANE COMPRESSIVE PROPERTIES OF HEXAGONAL PAPER HONEYCOMBS

The compressive behaviour of paper honeycombs is studied by means of an experimental analysis. Experiment results show how geometry aspects of hexagonal paper honeycombs, e.g. the height of paper honeycomb, the thickness and length of honeycomb cell-wall, the drawing ratio of hexagonal honeycomb, affect the compressive properties of the paper honeycombs. It is in good agreement with the theory model. The constraint factor K of the critical buckling stress is mainly determined by the length of honeycomb cell-wail. It can be described as K=1.54 for B type paper honeycombs and K=3.32 for D type paper honeycombs. The plateau stress is the power exponent function of the thickness to length ratio of honeycomb cell-wall, and the experiment results show that the constant is 13.2 and the power exponent is 1.77. The research results can be used to characterize and improve efficiently the compressive properties of paper honeycombs.

Performance prediction of four-contact vertical Hall-devices using a conformal mapping technique

Instead of the conventional design with five contacts in the sensor active area, innovative vertical Hall devices （VHDs） with four contacts and six contacts are asymmetrical in structural design but symmetrical in the current flow that can be well fit for the spinning current technique for offset elimination. In this article, a conformal mapping calculation method is used to predict the performance of asymmetrical VHD embedded in a deep n-well with four contacts. Furthermore, to make the calculation more accurate, the junction field effect is also involved into the conformal mapping method. The error between calculated and simulated results is less than 5% for the currentrelated sensitivity, and approximately 13% for the voltage-related sensitivity. This proves that such calculations can be used to predict the optimal structure of the vertical Hall-devices.