The pellicle-forming yeast could cause the quality deterioration of wine. In this study, a pellicle-forming strain Hmp-1 was isolated from the spoilage blackberry wine, and identified as Pichia membranifaciens based o...The pellicle-forming yeast could cause the quality deterioration of wine. In this study, a pellicle-forming strain Hmp-1 was isolated from the spoilage blackberry wine, and identified as Pichia membranifaciens based on the morphology and partial nucleotide sequence of 26S rDNA. The effects of fermentation conditions （ethanol, sulfur dioxide, sugar, and temperature） on the growth of P. membranifaciens strain Hmp-1 and Saccharomyces cerevisiae strain FM^S-115 （a strain used for the blackberry wine fermentation） were investigated, respectively. The results indicated that Hmp-1 had lower resistance to these factors compared to FM-S-115, and the growth of Hmp-1 was completely inhibited by 10% （v/v） or 50 mg L-~ SO2 during the fermentation of blackberry wine. These results suggested that Hmp-1 could effectively be controlled by increasing ethanol or SO2 concentration during the fermentation and storage of blackberry wine. Furthermore, the analysis based on gas chromatography-mass spectrometry （GC-MS） showed that Hmp-1 remarkably decreased kinds of volatile compounds in blackberry wine, especially aldehydes and esters. In addition, some poisonous compounds were detected in the blackberry wine fermented by FM-S-115 and Hmp-l. These results suggested that Hmp-1 was a major cause leading to the quality deterioration of blackberry wine.展开更多
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most omplicated and cost sensitive environments...An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most omplicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner.There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixedproducts FAB.展开更多
基金supported by the Natural Science Foundation of Jiangsu Province,China (BK20170603)
文摘The pellicle-forming yeast could cause the quality deterioration of wine. In this study, a pellicle-forming strain Hmp-1 was isolated from the spoilage blackberry wine, and identified as Pichia membranifaciens based on the morphology and partial nucleotide sequence of 26S rDNA. The effects of fermentation conditions （ethanol, sulfur dioxide, sugar, and temperature） on the growth of P. membranifaciens strain Hmp-1 and Saccharomyces cerevisiae strain FM^S-115 （a strain used for the blackberry wine fermentation） were investigated, respectively. The results indicated that Hmp-1 had lower resistance to these factors compared to FM-S-115, and the growth of Hmp-1 was completely inhibited by 10% （v/v） or 50 mg L-~ SO2 during the fermentation of blackberry wine. These results suggested that Hmp-1 could effectively be controlled by increasing ethanol or SO2 concentration during the fermentation and storage of blackberry wine. Furthermore, the analysis based on gas chromatography-mass spectrometry （GC-MS） showed that Hmp-1 remarkably decreased kinds of volatile compounds in blackberry wine, especially aldehydes and esters. In addition, some poisonous compounds were detected in the blackberry wine fermented by FM-S-115 and Hmp-l. These results suggested that Hmp-1 was a major cause leading to the quality deterioration of blackberry wine.
文摘An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most omplicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner.There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixedproducts FAB.
