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Electrochemical migration behavior and mechanism of PCB-ImAg and PCB-HASL under adsorbed thin liquid films 被引量:4
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作者 丁康康 李晓刚 +3 位作者 肖葵 董超芳 张凯 赵瑞涛 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2015年第7期2446-2457,共12页
The electrochemical migration(ECM) behavior and mechanism of immersion silver processing circuit board(PCB-ImAg)and hot air solder leveling circuit board(PCB-HASL) under the 0.1 mol/L Na2SO4 absorbed thin liquid... The electrochemical migration(ECM) behavior and mechanism of immersion silver processing circuit board(PCB-ImAg)and hot air solder leveling circuit board(PCB-HASL) under the 0.1 mol/L Na2SO4 absorbed thin liquid films with different thicknesses were investigated using stereo microscopy and scanning electron microscopy(SEM).Meanwhile,the corrosion tendency and kinetics rule of metal plates after bias application were analyzed with the aid of electrochemical impedance spectroscopy(EIS)and scanning Kelvin probe(SKP).Results showed that under different humidity conditions,the amount of migrating corrosion products of silver for PCB-ImAg was limited,while on PCB-HASL both copper dendrites and precipitates such as sulfate and metal oxides of copper/tin were found under a high humidity condition(exceeding 85%).SKP results indicated that the cathode plate of two kinds of PCB materials had a higher corrosion tendency after bias application.An ECM model involving multi-metal reactions was proposed and the differences of ECM behaviors for two kinds of PCB materials were compared. 展开更多
关键词 immersion silver processing circuit board(PCB-ImAg) hot air solder leveling circuit board(PCB-HASL) electrochemical migration electrical bias absorbed thin liquid film
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