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Synthesis and Properties of New Infrared Nonlinear Optical Li_2Ga_2GeS_6 Crystal
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作者 宋满 刘启明 +2 位作者 TAN Min CHEN Ruiqi YANG Sanjun 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2015年第3期509-511,共3页
IR Li2Ga2GeS6 nonlinear crystals were directly obtained with the composition of 40GeS2- 30Ga2Ss-30LieS, by the conventional melt-quenching method. The high depth digital image indicated that the obtained LizGa2GeS6 cr... IR Li2Ga2GeS6 nonlinear crystals were directly obtained with the composition of 40GeS2- 30Ga2Ss-30LieS, by the conventional melt-quenching method. The high depth digital image indicated that the obtained LizGa2GeS6 crystals showed a big size of 0.3 × 0.25 × 0.3 mm3. It was shown that the compound was very suscepfive to H20 with second harmonic observation. Besides, the glass-forming region of GeS2-Ga2S3- Li2S system was further studied by the conventional melt-quenching method.GeS2-Ga2S3-Li2S glass-ceramics containing IR Li2Ga2GeS6 nonlinear nanocrystals were obtained at a more carefully controlled heating rate. 展开更多
关键词 ir Li2Ga2GeS6 nonlinear crystals glass-forming region SIZE
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Growth and characterizations of CdGeAs2single crystal by descending crucible with rotation method 被引量:5
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作者 Wei Huang Bei-Jun Zhao +4 位作者 Shi-Fu Zhu Zhi-Yu He Bao-Jun Chen Jing-Jing Tang Wei-Jia Liu 《Rare Metals》 SCIE EI CAS CSCD 2014年第2期210-214,共5页
By the method of descending crucible with rotation, crack-free CdGeAs2single crystals of U15 mm 950 mm were grown in a furnace with three independen heating zones after optimizing the temperature field, and the descen... By the method of descending crucible with rotation, crack-free CdGeAs2single crystals of U15 mm 950 mm were grown in a furnace with three independen heating zones after optimizing the temperature field, and the descending and rotational speed to meet the need of CdGeAs2crystal growth. The properties of as-grown crysta were characterized by a variety of techniques. The results of X-ray diffraction(XRD) show that there are two cleavage faces, which are(110) and(101). The peaks are in high intensity and good symmetry, which demonstrates that the crystal is integral in structure and well crystallized. The energy-dispersive spectrometry results indicate that the wafer of the CdGeAs2crystal is closer to the stoichiometry The IR transmittance of the wafer is *48.6 % at 5.5 lm, and the maximum value is up to 51.6 % in the range of2.3–18.0 lm. Etch pits of(001) face are observed and the density of the etch pits is evaluated to be 1 9 105cm-2. 展开更多
关键词 CdGeAs2 crystal Crystal growth X-ray diffraction ir transmittance
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