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Effects of power on ion behaviors in radio-frequency magnetron sputtering of indium tin oxide(ITO)
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作者 李茂洋 莫超超 +7 位作者 陈佳丽 季佩宇 谭海云 张潇漫 崔美丽 诸葛兰剑 吴雪梅 黄天源 《Plasma Science and Technology》 SCIE EI CAS CSCD 2024年第7期116-122,共7页
This study delves into ion behavior at the substrate position within RF magnetron discharges utilizing an indium tin oxide(ITO)target.The positive ion energies exhibit an upward trajectory with increasing RF power,att... This study delves into ion behavior at the substrate position within RF magnetron discharges utilizing an indium tin oxide(ITO)target.The positive ion energies exhibit an upward trajectory with increasing RF power,attributed to heightened plasma potential and initial emergent energy.Simultaneously,the positive ion flux escalates owing to amplified sputtering rates and electron density.Conversely,negative ions exhibit broad ion energy distribution functions(IEDFs)characterized by multiple peaks.These patterns are clarified by a combination of radiofrequency oscillation of cathode voltage and plasma potential,alongside ion transport time.This elucidation finds validation in a one-dimensional model encompassing the initial ion energy.At higher RF power,negative ions surpassing 100 e V escalate in both flux and energy,posing a potential risk of sputtering damages to ITO layers. 展开更多
关键词 RF magnetron sputtering ito film ion energy distribution functions plasma diagnosis
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Periodic transparent nanowires in ITO film fabricated via femtosecond laser direct writing 被引量:2
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作者 Qilin Jiang Long Chen +8 位作者 Jukun Liu Yuchan Zhang Shian Zhang Donghai Feng Tianqing Jia Peng Zhou Qian Wang Zhenrong Sun Hongxing Xu 《Opto-Electronic Science》 2023年第1期11-22,共12页
This paper reports the fabrication of regular large-area laser-induced periodic surface structures(LIPSSs)in indium tin oxide(ITO)films via femtosecond laser direct writing focused by a cylindrical lens.The regular LI... This paper reports the fabrication of regular large-area laser-induced periodic surface structures(LIPSSs)in indium tin oxide(ITO)films via femtosecond laser direct writing focused by a cylindrical lens.The regular LIPSSs exhibited good properties as nanowires,with a resistivity almost equal to that of the initial ITO film.By changing the laser fluence,the nanowire resistances could be tuned from 15 to 73 kΩ/mm with a consistency of±10%.Furthermore,the average transmittance of the ITO films with regular LIPSSs in the range of 1200-2000 nm was improved from 21%to 60%.The regular LIPSS is promising for transparent electrodes of nano-optoelectronic devices-particularly in the near-infrared band. 展开更多
关键词 transparent nanowires periodic surface nanostructures femtosecond laser direct writing ito film anisotropic electrical conductivity
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High-performance omnidirectional self-powered photodetector constructed by CsSnBr_(3)/ITO heterostructure film
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作者 Dong Liu Feng-Jing Liu +6 位作者 Jie Zhang Zi-Xu Sa Ming-Xu Wang Sen Po Yip Jun-Chen Wan Peng-Sheng Li Zai-Xing Yang 《Journal of Electronic Science and Technology》 EI CAS CSCD 2023年第2期78-86,共9页
Omnidirectional photodetectors attract enormous attention due to their prominent roles in optical tracking systems and omnidirectional cameras.However,it is still a challenge for the construction of high-performance o... Omnidirectional photodetectors attract enormous attention due to their prominent roles in optical tracking systems and omnidirectional cameras.However,it is still a challenge for the construction of high-performance omnidirectional photodetectors where the incident light can be effectively absorbed in multiple directions and the photo-generated carriers can be effectively collected.Here,a high-performance omnidirectional self-powered photodetector based on the CsSnBr_(3)/indium tin oxide(ITO)heterostructure film was designed and demonstrated.The as-fabricated photodetector exhibited an excellent self-powered photodetection performance,showing responsivity and detectivity up to 35.1 mA/W and 1.82×10^(10) Jones,respectively,along with the smart rise/decay response time of 4 ms/9 ms.Benefitting from the excellent photoelectric properties of the CsSnBr_(3) film as well as the ability of the CsSnBr_(3)/ITO heterostructure to efficiently separate and collect photo-generated carriers,the as-fabricated photodetector also exhibited an excellent omnidirectional self-powered photodetection performance.All the results have certified that this work finds an efficient way to realize high-performance omnidirectional self-powered photodetectors. 展开更多
关键词 Chemical vapor deposition CsSnBr_(3)/ito heterostructure film OMNIDIRECtiONAL Self-powered photodetector
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ITO/AgNWs/ITO薄膜的制备及其性能研究
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作者 杨涛 陈彩明 +4 位作者 黄瑜佳 吴少平 徐华蕊 汪坤喆 朱归胜 《人工晶体学报》 CAS 北大核心 2024年第7期1150-1159,共10页
随着显示面板向超大尺寸、超高清、可触控的方向发展,单一的氧化铟锡(ITO)薄膜难以满足显示器件越来越高的光电性能要求,因此复合导电薄膜得以发展。本文制备了以二维银纳米线(AgNWs)导电网络嵌入ITO薄膜形成的ITO(222)/AgNWs/ITO(400)... 随着显示面板向超大尺寸、超高清、可触控的方向发展,单一的氧化铟锡(ITO)薄膜难以满足显示器件越来越高的光电性能要求,因此复合导电薄膜得以发展。本文制备了以二维银纳米线(AgNWs)导电网络嵌入ITO薄膜形成的ITO(222)/AgNWs/ITO(400)复合薄膜结构,系统研究了AgNWs添加量和上层ITO薄膜溅射温度对复合薄膜结构与光电性能的影响,AgNWs金属导电网络不仅提升了薄膜的电学性能,还保持了优良的光学性能。结果表明,在旋涂600μL的AgNWs分散液、上层ITO薄膜的溅射温度为175℃时,制备的复合ITO薄膜方阻为7.13Ω/□,在550 nm处透过率为91.52%,且品质因数为57.82×10^(-3)Ω^(-1),实现了超低电阻率和高可见光透过率复合ITO薄膜的制备。 展开更多
关键词 ito薄膜 磁控溅射 AgNWs 导电网络 复合薄膜 光电性能 溅射温度
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氮含量对Ti-B-C-N薄膜微观结构和性能的影响
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作者 陈向阳 张瑾 +1 位作者 马胜利 胡海霞 《机械工程材料》 CAS CSCD 北大核心 2024年第5期62-66,共5页
采用反应磁控溅射法在高速钢基体上制备氮原子分数分别为10.8%,15.6%,28.1%,36.4%的Ti-B-C-N薄膜,研究了氮含量对薄膜微观结构、硬度和摩擦磨损性能的影响。结果表明:Ti-B-C-N薄膜均由α-Fe和Ti(C,N)纳米晶组成,具有Ti(C,N)纳米晶镶嵌... 采用反应磁控溅射法在高速钢基体上制备氮原子分数分别为10.8%,15.6%,28.1%,36.4%的Ti-B-C-N薄膜,研究了氮含量对薄膜微观结构、硬度和摩擦磨损性能的影响。结果表明:Ti-B-C-N薄膜均由α-Fe和Ti(C,N)纳米晶组成,具有Ti(C,N)纳米晶镶嵌在非晶基体相中的纳米复合结构;随着氮含量增加,非晶相含量增加,Ti(C,N)纳米晶的含量和晶粒尺寸减小;随着氮含量增加,Ti-B-C-N薄膜的显微硬度增大,摩擦因数和磨损率均减小,表面磨痕变浅,磨损机制由剥落和微观犁削转变为微观抛光。 展开更多
关键词 反应磁控溅射 ti-B-C-N薄膜 纳米复合结构 硬度 摩擦磨损性能
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模压成型压力对氧化铟锡(ITO)靶材性能影响研究
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作者 姜峰 谭泽旦 +5 位作者 黄誓成 方志杰 陆映东 覃立仁 王永清 曾纪术 《矿冶工程》 CAS 北大核心 2024年第1期134-137,142,共5页
以化学共沉淀-煅烧法制备的纳米ITO粉体为原料,通过模压、冷等静压成型,采用常压烧结法制备了ITO靶材,研究了模压成型压力对ITO靶材相对密度、电阻率和晶粒尺寸的影响。结果表明,模压成型压力60 MPa且烧结条件适宜时,制得的ITO靶材相对... 以化学共沉淀-煅烧法制备的纳米ITO粉体为原料,通过模压、冷等静压成型,采用常压烧结法制备了ITO靶材,研究了模压成型压力对ITO靶材相对密度、电阻率和晶粒尺寸的影响。结果表明,模压成型压力60 MPa且烧结条件适宜时,制得的ITO靶材相对密度为99.81%、电阻率为1.707×10^(-4)Ω·cm、平均晶粒尺寸为7.62μm。研究结果可为ITO靶材的致密化与大型化生产提供借鉴。 展开更多
关键词 模压成型 氧化铟锡 导电薄膜 靶材 常压烧结 电阻率 致密化
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TiN、Ti插入层对ITO与GaN欧姆接触性能影响的研究
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作者 孟文利 张育民 +2 位作者 孙远航 王建峰 徐科 《人工晶体学报》 CAS 北大核心 2023年第9期1609-1616,共8页
透明半导体铟锡氧化物(ITO)作为电极能够降低光导开关电极边缘电流集聚效应和提高脉冲激光的利用率。本文通过在ITO与GaN界面之间分别插入10 nm的Ti与TiN,研究Ti、TiN对ITO与GaN欧姆接触性能的影响。I-V测试结果表明,随着退火温度升高,... 透明半导体铟锡氧化物(ITO)作为电极能够降低光导开关电极边缘电流集聚效应和提高脉冲激光的利用率。本文通过在ITO与GaN界面之间分别插入10 nm的Ti与TiN,研究Ti、TiN对ITO与GaN欧姆接触性能的影响。I-V测试结果表明,随着退火温度升高,插入TiN的光导开关一直保持欧姆接触特性,而插入Ti的光导开关由欧姆接触转变为肖特基接触。通过TEM测试发现,当以Ti作为插入层时,ITO通过插入层向插入层与GaN的界面扩散,在接触界面形成Ti的氧化物及空洞。透射光谱显示,不同退火温度下插入Ti层的透过率均低于38.3%,而以TiN作为插入层时透过率为38.8%~55.0%。因此含有TiN的光导开关具有更稳定的电学性能和更高的透过率,这为GaN光导开关在高温高功率领域的应用提供了参考。 展开更多
关键词 GaN光导开关 ito ti tiN 欧姆接触
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Properties of Reactive Magnetron Sputtered ITO Films without in-situ Substrate Heating and Post-deposition Annealing 被引量:4
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作者 Meng CHEN, Xuedong BAI, Jun GONG, Chao SUN, Rongfang HUANG and Lishi WEN (Institute of Metal Research, the Chinese Academy of Sciences, Shenyang 110015, China) 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2000年第3期281-285,共5页
Indium tin oxide (ITO) films were prepared on polyester, Si and glass substrate with relatively high deposition rate of above 0.9 nm/s by DC reactive magnetron sputtering technique at the sputtering pressure of 0.06 P... Indium tin oxide (ITO) films were prepared on polyester, Si and glass substrate with relatively high deposition rate of above 0.9 nm/s by DC reactive magnetron sputtering technique at the sputtering pressure of 0.06 Pa system, respectively. The dependence of resistivity on deposition parameters, such as deposition rate, target-to-substrate distance (TSD), oxygen flow rate and sputtering time (thickness), has been investigated, together with the structural and the optical properties. It was revealed that all ITO films exhibited lattice expansion. The resistivity of ITO thin films shows significant substrate effect: much lower resistivity and broader process window have been reproducibly achieved for the deposition of ITO films onto polyester rather than those prepared on both Si and glass substrates. The films with resistivity of as low as 4.23 x 10^-4 Ω.cm and average transmittance of ~78% at wavelength of 400~700 nm have been achieved for the films on polyester at room temperature. 展开更多
关键词 ito Properties of Reactive Magnetron Sputtered ito films without in-situ Substrate Heating and Post-deposition Annealing TSD rate than
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Properties of PET/ITO Thin Films Deposited by DC Magnetron Sputtering 被引量:1
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作者 ZHANG Xing ZHANG Jingquan WANG Bo WANG Shenghao FENG Lianghuan CAI Yaping WU Lili LI Wei LEI Zhi LI Bing ZENG Guanggen 《Semiconductor Photonics and Technology》 CAS 2010年第1期35-41,共7页
In_2O_3∶SnO_2(ITO) thin films were fabricated on the substrate of flexible polyethylene terephthalate(PET) by DC magnetron sputtering from a ceramic target of In_2O_3/SnO_2(90∶10). Properties of the thin films were ... In_2O_3∶SnO_2(ITO) thin films were fabricated on the substrate of flexible polyethylene terephthalate(PET) by DC magnetron sputtering from a ceramic target of In_2O_3/SnO_2(90∶10). Properties of the thin films were characterized by X-ray diffraction(XRD), four-point probe, Hall-effect measurement, UV-Vis spectrophotometer, and scanning electron microscopy(SEM). The effects of sputtering pressure, oxygen partial pressure and deposition temperature on properties of microstructure and optoelectronics properties of PET/ITO thin films were investigated in detail. High-quality ITO thin films on PET substrates with the resistivity as low as 8.5×10-4 Ω·cm and the optical transmittance over 80% in the visible spectrum range were obtained. 展开更多
关键词 PET/ito thin film XRD TRANSMISSION Hall effect
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Ti基块体非晶合金在酸性溶液中的腐蚀行为
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作者 杨靓 张浩然 +4 位作者 张山 施志林 韦超 马明臻 刘日平 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2024年第3期874-889,共16页
研究Ti_(34.3)Zr_(31.5)Cu_(5)Ni_(5.5)Be_(23.7)块体非晶合金在不同浓度HCl和H_(2)SO_(4)溶液中的腐蚀行为。电化学测试与扫描电子显微镜分析发现,在极化过程中,Cl^(-)离子在HCl溶液中引发点蚀损伤,点蚀电位随溶液浓度的增大而降低,被... 研究Ti_(34.3)Zr_(31.5)Cu_(5)Ni_(5.5)Be_(23.7)块体非晶合金在不同浓度HCl和H_(2)SO_(4)溶液中的腐蚀行为。电化学测试与扫描电子显微镜分析发现,在极化过程中,Cl^(-)离子在HCl溶液中引发点蚀损伤,点蚀电位随溶液浓度的增大而降低,被腐蚀表面的损伤程度则与溶液浓度呈正相关。在H_(2)SO_(4)溶液中材料表面形成钝化膜,表现出良好的耐蚀性。X射线光电子能谱分析发现,随着HCl溶液浓度的增加,钝化膜的稳定性降低。通过浸泡实验得到4种材料的腐蚀速率。结果显示,Ti_(34.3)Zr_(31.5)Cu_(5)Ni_(5.5)Be_(23.7)块体非晶合金在HCl溶液中的耐腐蚀性能最好,其腐蚀速率为7.22×10^(-3) mm/a,约为316L不锈钢腐蚀速率的1/1294。 展开更多
关键词 钛基块体非晶合金 酸性溶液 钝化膜 腐蚀行为 腐蚀速率
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退火处理对低阻LCD屏ITO薄膜光电性能的影响
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作者 武洋 贾文友 +2 位作者 刘莉 郑建军 徐娇 《盐城工学院学报(自然科学版)》 CAS 2024年第1期75-78,共4页
采用磁控溅射法制备氧化铟锡(ITO)薄膜,对制备好的ITO薄膜样品进行不同温度、不同时间的退火处理。用WGT-S透过率雾度仪、四探针测试仪测量退火后的电阻屏ITO薄膜光电性能参数,并采用扫描电子显微镜观测退火前后薄膜的表面状态,分析退... 采用磁控溅射法制备氧化铟锡(ITO)薄膜,对制备好的ITO薄膜样品进行不同温度、不同时间的退火处理。用WGT-S透过率雾度仪、四探针测试仪测量退火后的电阻屏ITO薄膜光电性能参数,并采用扫描电子显微镜观测退火前后薄膜的表面状态,分析退火处理对电阻屏ITO薄膜光电性能的影响。研究结果表明:制备的ITO薄膜的最佳退火温度为400℃,退火时间约为70 min。 展开更多
关键词 ito薄膜 退火温度 退火时间 光电性能
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ITO thin films prepared by electron beam evaporation with End-Hall ion source assisted without heating to the substrate 被引量:4
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作者 GAO Jin-song XU Ying WANG Xiao-yi WANG Tong-tong 《光学精密工程》 EI CAS CSCD 北大核心 2005年第4期397-402,共6页
ITO (indium oxide doped with tin) thin films were deposited on glass substrates by using ITO pellet with a composition of w(In2O3)=90% and w(SnO2)=10% by electron beam evaporated with End-Hall ion source assiste... ITO (indium oxide doped with tin) thin films were deposited on glass substrates by using ITO pellet with a composition of w(In2O3)=90% and w(SnO2)=10% by electron beam evaporated with End-Hall ion source assisted without extra heating. The rate of deposition and flow rate of oxygen were measured and changed to obtain the best properties of ITO thin films. Furthermore, the post annealing process was done in vacuum at different annealing temperatures for 2 h and at 400℃ for different keeping time, respectively. The relation between optical, electrical properties and structure was discussed in detail. 展开更多
关键词 ito 薄膜 电子束 离子源
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Effects of heat treatment on morphological,optical and electrical properties of ITO films by sol-gel technique 被引量:2
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作者 李芝华 柯于鹏 任冬燕 《中国有色金属学会会刊:英文版》 EI CSCD 2008年第2期366-371,共6页
Indium-tin-oxide(ITO)films were prepared on the quarts glass by sol-gel technique.Effects of different heat treatment temperatures and cooling methods on the morphological,optical and electrical properties of ITO film... Indium-tin-oxide(ITO)films were prepared on the quarts glass by sol-gel technique.Effects of different heat treatment temperatures and cooling methods on the morphological,optical and electrical properties of ITO films were measured by TG/DTA, IR,XRD,SEM,UV-VIS spectrometer and four-probe apparatus.It is found that the crystallized ITO films exhibit a polycrystalline cubic bixbyite structure.The heat treatment process has significant effects on the morphological,optical and electrical properties of ITO films.Elevating the heat treatment temperature can perfect the crystallization process of ITO films,therefore the optical and electrical properties of ITO films are improved.But the further increasing of heat treatment temperature results in the increment of ITO films’resistivity.Compared with ITO films elaborated by furnace cooling,those prepared through air cooling have following characteristics as obviously decreased crystalline size,deeply declined porosity,more compact micro-morphology,improved electrical property and slightly decreased optical transmission. 展开更多
关键词 热处理技术 光学特性 电学特性 溶胶-凝胶技术 薄膜
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Preparation of ITO transparent conductive film by sol-gel method
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作者 李芝华 任冬燕 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2006年第6期1358-1361,共4页
The ITO transparent conductive films were prepared on substrate of quartz glass by sol-gel method.The raw materials were nitrate indium,acetylacetone and the dopant of anhydrous chloride(SnCl4).The process from gel to... The ITO transparent conductive films were prepared on substrate of quartz glass by sol-gel method.The raw materials were nitrate indium,acetylacetone and the dopant of anhydrous chloride(SnCl4).The process from gel to crystalline film and the microstructure of the films were investigated by DTA-TG,XRD and SEM.The influence of preparation processes on the electricity performance of the films was also studied by four-probe apparatus.The results show that the crystallization process of ITO xerogel completes when the heat treatment temperature reaches 600 ℃.The ITO films possesses on vesicular structures accumulated by spherical particles,and both heat treatment temperature and cooling rate have important effects on the resistivity of ITO films. 展开更多
关键词 ito film SOL-GEL process RESIStiVITY TRANSPARENCY
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Study on adhesion and electro-optical properties of ITO films on flexible PET substrate
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作者 TANG Wu WENG Xiaolong WU Yutao DENG Longjiang 《Rare Metals》 SCIE EI CAS CSCD 2006年第z2期65-68,共4页
High-quality ITO films on flexible PET substrate were prepared by RF magnetron sputtering at low deposition temperature with different Ar gas sputtering pressure. Adhesion and electro-optical properties of ITO films w... High-quality ITO films on flexible PET substrate were prepared by RF magnetron sputtering at low deposition temperature with different Ar gas sputtering pressure. Adhesion and electro-optical properties of ITO films were investigated as a function of Ar partial pressure. The sputtering conditions provide very uniform ITO films with high transparency (>85% in 400-760 nm spectra) and low electrical resistivity (1.408×10-3-1.956×10-3 Ω·cm). Scratch test experiments indicate that there is a good adhesion property between ITO films and PET substrate, the critical characteristic load increases from 16.5 to 23.2 N with increasing Ar sputtering pressure from 0.2 to 1.4 Pa. 展开更多
关键词 ito films ADHESION RESIStiVITY
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AlGaInP thin-film LED with omni-directionally reflector and ITO transparent conducting n-type contact
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作者 张剑铭 邹德恕 +6 位作者 徐晨 郭伟玲 朱彦旭 梁庭 达小丽 李建军 沈光地 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第11期3498-3501,共4页
In this paper a novel A1GalnP thin-film light-emitting diode (LED) with omni-directionally reflector (ODR) and transparent conducting indium tin oxide (ITO) n-type contact structure is proposed, and fabrication ... In this paper a novel A1GalnP thin-film light-emitting diode (LED) with omni-directionally reflector (ODR) and transparent conducting indium tin oxide (ITO) n-type contact structure is proposed, and fabrication process is developed. This reflector is realized with the combination of a low-refractive-index dielectric layer and a high reflectivity metal layer. This allows the light emitted or internally reflected downwardly towards the GaAs substrate at any angle of incidence to be reflected towards the top surface of the chip. ITO n-type contact is used for anti-reflection and current spreading layers on the ODR-LED with ITO. The sheet resistance of the ITO films (95 nm) deposited on n- ohmic contact of ODR-LED is of the order 23.5Ω/△ with up to 90% transmittance (above 92% for 590-770 nm) in the visible region of the spectrum. The optical and electrical characteristics of the ODR-LED with ITO are presented and compared to conventional AS-LED and ODR-LED without ITO. It is shown that the light output from the ODR-LED with ITO at forward current 20mA exceeds that of AS-LED and ODR-LED without ITO by about a factor of 1.63 and 0.16, respectively. A favourable luminous intensity of 218.3 mcd from the ODR-LED with ITO (peak wavelength 620 nm) could be obtained under 20 mA injection, which is 2.63 times and 1.21 times higher than that of AS-LED and ODR-LED without ITO, respectively. 展开更多
关键词 ALGAINP thin-film LED Omni-directional reflector ito
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(Zr,Ti)O_(4)基微波薄膜介质基片制备关键工艺研究
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作者 江俊俊 康建宏 +2 位作者 汪小玲 刘杨琼 赵杨军 《材料导报》 EI CAS CSCD 北大核心 2024年第S01期42-46,共5页
素坯成型工艺对微波陶瓷材料在微波薄膜介质基片产品中的工程化应用具有关键影响。目前关于(Zr,Ti)O_(4)主晶相系统微波介质陶瓷材料的研究主要集中在降低(Zr,Ti)O_(4)陶瓷烧结温度、掺杂改性优化其介电性能、Q×f值(品质因数与频... 素坯成型工艺对微波陶瓷材料在微波薄膜介质基片产品中的工程化应用具有关键影响。目前关于(Zr,Ti)O_(4)主晶相系统微波介质陶瓷材料的研究主要集中在降低(Zr,Ti)O_(4)陶瓷烧结温度、掺杂改性优化其介电性能、Q×f值(品质因数与频率的乘积)等配方优化方面。本文以(Zr,Ti)-O4基微波陶瓷材料为原材料,通过研究中介微波薄膜介质基片关键成型工艺对其物相结构、微观形貌和介电性能的影响,发现不同素坯成型工艺方式对(Zr,Ti)O_(4)基陶瓷的致密度、介质损耗值、Q×f值等影响显著。采用方式四进行薄膜介质基片的制备,获得的(Zr,Ti)O_(4)基薄膜介质基片致密度较高,气孔率低,陶瓷材料的介质损耗低至1.1×10^(-4),15 GHz下Q×f值高达50000。本文通过对不同素坯成型方式的研究,以期为(Zr,Ti)O_(4)基微波陶瓷材料薄膜介质基片的工程化应用提供理论支撑。 展开更多
关键词 (Zr ti)O_(4) 薄膜介质基片 工程化应用 微波陶瓷材料 成型工艺 介电性能
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MoS_(2)/Ti-WC纳米多层薄膜结构设计及其宽温域摩擦性能研究
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作者 高臻荣 候果源 任思明 《表面技术》 EI CAS CSCD 北大核心 2024年第11期80-89,170,共11页
目的探究环境温度对MoS_(2)/Ti-WC纳米多层薄膜摩擦磨损性能的影响,探讨并揭示薄膜在高温环境下的损伤机理。方法采用非平衡磁控溅射技术制备MoS_(2)/Ti-WC纳米多层薄膜,评价Ti、WC双功能组元以及纳米多层结构设计对薄膜表面形貌和微观... 目的探究环境温度对MoS_(2)/Ti-WC纳米多层薄膜摩擦磨损性能的影响,探讨并揭示薄膜在高温环境下的损伤机理。方法采用非平衡磁控溅射技术制备MoS_(2)/Ti-WC纳米多层薄膜,评价Ti、WC双功能组元以及纳米多层结构设计对薄膜表面形貌和微观结构的影响。利用X射线衍射仪(XRD)、扫描电镜(SEM)、扫描探针显微镜(SPM)等表征手段对薄膜的晶体结构、表截面形貌以及表面粗糙度进行分析,利用原位纳米压痕仪对薄膜的力学性能进行评估,利用高温摩擦磨损试验机评价薄膜在不同温度环境(25~300℃)下的摩擦磨损性能,进一步通过激光共聚焦对磨痕和磨斑进行光学形貌分析,并利用能谱仪(EDS)和共聚焦显微拉曼光谱(Micro-Raman)对钢配副表面的摩擦转移膜进行成分分析。最终揭示MoS_(2)/Ti-WC纳米多层薄膜在不同温度下的磨损机理。结果MoS_(2)/Ti-WC纳米多层的结构设计可以诱导MoS_(2)(002)晶面的择优生长,获得表面平整光滑、结构致密的薄膜。相比于MoS_(2)/Ti薄膜,WC纳米层的引入,赋予薄膜更高的硬度和硬/弹比。MoS_(2)/Ti-WC纳米多层薄膜在潮湿空气中的平均摩擦因数为0.07,平均磨损率为6.14×10^(-7)mm^(3)/(N·m)。结论MoS_(2)/Ti-WC纳米多层薄膜在宽温域(100~300℃)内保持稳定的摩擦性能,这得益于薄膜纳米多层的结构设计、高的硬/弹比以及优异的抗氧化性能,同时在钢配副表面形成了连续且致密的转移膜。 展开更多
关键词 磁控溅射 MoS_(2)/ti-WC纳米多层薄膜 环境适应性 高温润滑性能 摩擦磨损
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ITO薄膜的制备及其光电性能研究
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作者 黄惜惜 赵桂香 +3 位作者 扬川苏 张中建 高荣刚 黄国平 《太阳能》 2024年第4期94-100,共7页
随着HJT太阳电池的发展,对其氧化铟锡(ITO)薄膜的研究日益增多。通过直流磁控溅射法在玻璃衬底上制备ITO薄膜,研究了氧含量、溅射功率、沉积温度及溅射气压对ITO薄膜光电性能的影响。研究结果显示:1)ITO薄膜的光电性能对氧含量较为敏感... 随着HJT太阳电池的发展,对其氧化铟锡(ITO)薄膜的研究日益增多。通过直流磁控溅射法在玻璃衬底上制备ITO薄膜,研究了氧含量、溅射功率、沉积温度及溅射气压对ITO薄膜光电性能的影响。研究结果显示:1)ITO薄膜的光电性能对氧含量较为敏感,随着氧含量增加,ITO薄膜的电阻率也随之增加,而透过率则呈先上升后下降,然后基本保持不变的趋势;2)随着沉积温度升高,ITO薄膜的透过率也随之升高,而电阻率则呈先下降后上升的趋势;3)随着溅射气压的升高,ITO薄膜的电阻率呈上升趋势,而透过率则是先降低再略微升高;4)当氧含量在1.8%~2.0%,溅射功率在3000~4000 W,沉积温度在150~190℃,溅射气压在0.5~0.7 Pa时,ITO薄膜具有较优的光电性能。因此,在合理范围内提高沉积温度,其则会具有退火作用,有助于进一步改善ITO薄膜的光电性能。 展开更多
关键词 太阳电池 磁控溅射 氧含量 沉积温度 ito薄膜 光电性能
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Effective tool design of three-rank form as precision removal-process of ITO thin-films
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作者 Pai-shan PA 《中国有色金属学会会刊:英文版》 CSCD 2009年第B09期232-237,共6页
A new effective tool design of three-rank form of electroremoval was present using a precision recycle system offering faster performance in removing the indium-tin-oxide(ITO) thin-films on color filter surface of dis... A new effective tool design of three-rank form of electroremoval was present using a precision recycle system offering faster performance in removing the indium-tin-oxide(ITO) thin-films on color filter surface of displays. Higher electric power is not required since the three-rank form tool is adopted as a feeding mode to reduce the response area. The low yield of ITO persists throughout the entire semiconductor production process. By establishing a recycle process of ultra-precise removal of the thin-film nanostructure, defective products in the optoelectronic semiconductors industry can be effectively recycled, decreasing both production costs and pollution. A 5th generation TFT-LCD was used. The design features of the removal processes for the thin-films and the tool design of three-rank form were of major interest. For the precision removal processes, a pulsed current can improve the effect of dreg discharge and contributes to the achievement of a fast workpiece (displays' color filter) feed rate, but raises the current rating. High flow velocity of the electrolyte with a high rotational speed of the tool electrodes elevates the ITO removal effect. A displays' color filter with a fast feed rate is combined with enough electric power to provide highly effective removal. A small thickness of the rank and a small arc angle of the negative-electrode correspond to a higher removal rate for ITO-film. An effective three-rank form negative-electrode provides larger discharge mobility and better removal effect. It only needs a short period of time to remove the ITO easily and cleanly. 展开更多
关键词 工具设计 薄膜材料 ito
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