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Preparation and properties of tungsten-doped indium oxide thin films 被引量:9
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作者 Li, Yuan Wang, Wenwen +1 位作者 Zhang, Junying Wang, Rongming 《Rare Metals》 SCIE EI CAS CSCD 2012年第2期158-163,共6页
关键词 In 2 O 3 : W thin film DC magnetron sputtering substrate temperature sputtering current optical and electrical properties
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Effects of dopant content on optical and electrical properties of In_2O_3: W transparent conductive films 被引量:3
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作者 Zhang, Yuanpeng Li, Yuan +3 位作者 Li, Chunzhi Wang, Wenwen Zhang, Junying Wang, Rongming 《Rare Metals》 SCIE EI CAS CSCD 2012年第2期168-171,共4页
关键词 In 2 O 3 : W thin film doping content DC magnetron sputtering optical and electrical properties
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SEMICONDUCTING PROPERTIES OF In_2O_3 ANODIC FILM
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作者 Zhonghua LIN Haiyi CHEN Zhaowu TIAN NATIONAL LABORATORY OF PHYSICAL CHEMISTRY OF SOLID SURFACE XIAMEN UNIVERSITY,XIAMEN,361005 《Chinese Chemical Letters》 SCIE CAS CSCD 1990年第3期275-276,共2页
The good potentiality of the In_2O_3 anodic film as a photoanodic material has been demonstrated.The anodic oxidation of In substrate in alkaline solution for obtaining In_2O_3 film has been developed and their semico... The good potentiality of the In_2O_3 anodic film as a photoanodic material has been demonstrated.The anodic oxidation of In substrate in alkaline solution for obtaining In_2O_3 film has been developed and their semiconducting properties have been investigated through capacitance, photoelectrochemistry and electroreflection measurements. 展开更多
关键词 In SEMICONDUCTING PROPERTIES OF in2o3 ANODIC FILM
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Tungsten Doped Indium Oxide Thin Films Deposited at Room Temperature by Radio Frequency Magnetron Sputtering 被引量:2
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作者 Jiaojiao Pan Wenwen Wang +2 位作者 Dongqi Wu Qiang Fu Ding Ma 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2014年第7期644-648,共5页
Tungsten doped indium oxide (IWO) thin films were deposited on glass substrate at room temperature by radio frequency reactive magnetron sputtering. Chemical states analysis was carried out, indicating that valence ... Tungsten doped indium oxide (IWO) thin films were deposited on glass substrate at room temperature by radio frequency reactive magnetron sputtering. Chemical states analysis was carried out, indicating that valence states of element W in the films were W4+ and W6+. The effects of sputtering power and film thickness on the surface morphology, optical and electrical properties of IWO thin films were investigated. The IWO thin films had high transmittance in near infrared (NIR) spectral range. The resistivity, carrier mobility and carrier concentration owned their respective optimum values as sputtering power and thickness changed. The asdeposited IWO film with the minimum resistivity of 3.23 × 10^-4 Ω cm was obtained at a sputtering power of 50 W, with carrier mobility of 27.1 cm2 V-1 s-1, carrier concentration of 7.15 × 10^20 cm-3, average transmittance about 80% in visible region and above 75% in NIR region. It may meet the application requirement of high conductivity and transparency in NIR wavelength region. 展开更多
关键词 in2o3 W thin film Radio frequency magnetron sputtering Room temperature Optical and electrical properties
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