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Pixelated non-volatile programmable photonic integrated circuits with 20-level intermediate states
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作者 Wenyu Chen Shiyuan Liu Jinlong Zhu 《International Journal of Extreme Manufacturing》 SCIE EI CAS CSCD 2024年第3期477-487,共11页
Multi-level programmable photonic integrated circuits(PICs)and optical metasurfaces have gained widespread attention in many fields,such as neuromorphic photonics,opticalcommunications,and quantum information.In this ... Multi-level programmable photonic integrated circuits(PICs)and optical metasurfaces have gained widespread attention in many fields,such as neuromorphic photonics,opticalcommunications,and quantum information.In this paper,we propose pixelated programmable Si_(3)N_(4)PICs with record-high 20-level intermediate states at 785 nm wavelength.Such flexibility in phase or amplitude modulation is achieved by a programmable Sb_(2)S_(3)matrix,the footprint of whose elements can be as small as 1.2μm,limited only by the optical diffraction limit of anin-house developed pulsed laser writing system.We believe our work lays the foundation for laser-writing ultra-high-level(20 levels and even more)programmable photonic systems and metasurfaces based on phase change materials,which could catalyze diverse applications such as programmable neuromorphic photonics,biosensing,optical computing,photonic quantum computing,and reconfigurable metasurfaces. 展开更多
关键词 programmable photonic integrated circuits phase change materials multi-level intermediate states metasurfaces
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Emerging MoS_(2)Wafer-Scale Technique for Integrated Circuits 被引量:3
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作者 Zimeng Ye Chao Tan +4 位作者 Xiaolei Huang Yi Ouyang Lei Yang Zegao Wang Mingdong Dong 《Nano-Micro Letters》 SCIE EI CAS CSCD 2023年第3期129-170,共42页
As an outstanding representative of layered materials,molybdenum disulfide(MoS_(2))has excellent physical properties,such as high carrier mobility,stability,and abundance on earth.Moreover,its reasonable band gap and ... As an outstanding representative of layered materials,molybdenum disulfide(MoS_(2))has excellent physical properties,such as high carrier mobility,stability,and abundance on earth.Moreover,its reasonable band gap and microelectronic compatible fabrication characteristics makes it the most promising candidate in future advanced integrated circuits such as logical electronics,flexible electronics,and focal-plane photodetector.However,to realize the all-aspects application of MoS_(2),the research on obtaining high-quality and large-area films need to be continuously explored to promote its industrialization.Although the MoS_(2)grain size has already improved from several micrometers to sub-millimeters,the high-quality growth of wafer-scale MoS_(2)is still of great challenge.Herein,this review mainly focuses on the evolution of MoS_(2)by including chemical vapor deposition,metal–organic chemical vapor deposition,physical vapor deposition,and thermal conversion technology methods.The state-of-the-art research on the growth and optimization mechanism,including nucleation,orientation,grain,and defect engineering,is systematically summarized.Then,this review summarizes the wafer-scale application of MoS_(2)in a transistor,inverter,electronics,and photodetectors.Finally,the current challenges and future perspectives are outlined for the wafer-scale growth and application of MoS_(2). 展开更多
关键词 Wafer-scale growth Molybdenum disulfide Gas deposition integrated circuits
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Through-silicon-via crosstalk model and optimization design for three-dimensional integrated circuits 被引量:3
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作者 钱利波 朱樟明 +2 位作者 夏银水 丁瑞雪 杨银堂 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第3期591-596,共6页
Through-silicon-via (TSV) to TSV crosstalk noise is one of the key factors affecting the signal integrity of three- dimensional integrated circuits (3D ICs). Based on the frequency dependent equivalent electrical ... Through-silicon-via (TSV) to TSV crosstalk noise is one of the key factors affecting the signal integrity of three- dimensional integrated circuits (3D ICs). Based on the frequency dependent equivalent electrical parameters for the TSV channel, an analytical crosstalk noise model is established to capture the TSV induced crosstalk noise. The impact of various design parameters including insulation dielectric, via pitch, via height, silicon conductivity, and terminal impedance on the crosstalk noise is analyzed with the proposed model. Two approaches are proposed to alleviate the TSV noise, namely, driver sizing and via shielding, and the SPICE results show 241 rnV and 379 mV reductions in the peak noise voltage, respectively. 展开更多
关键词 three-dimensional integrated circuits through-silicon-via crosstalk driver sizing via shielding
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A 330-500 GHz Zero-Biased Broadband Tripler Based on Terahertz Monolithic Integrated Circuits 被引量:2
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作者 任田昊 张勇 +4 位作者 延波 徐锐敏 杨成樾 周静涛 金智 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第2期31-34,共4页
A 330-500 GHz zero-biased broadband monolithic integrated tripler is reported. The measured results show that the maximum efficiency and the maximum output power are 2% and 194μW at 348 GHz. The saturation characteri... A 330-500 GHz zero-biased broadband monolithic integrated tripler is reported. The measured results show that the maximum efficiency and the maximum output power are 2% and 194μW at 348 GHz. The saturation characteristic test shows that the output i dB compression point is about -8.5 dBm at 334 GHz and the maximum efficiency is obtained at the point, which is slightly below the 1 dB compression point. Compared with the conventional hybrid integrated circuit, a major advantage of the monolithic integrated circuit is the significant improvement of reliability and consistency. In this work, a terahertz monolithic frequency multiplier at this band is designed and fabricated. 展开更多
关键词 InP InGaAs A 330-500 GHz Zero-Biased Broadband Tripler Based on Terahertz Monolithic integrated circuits dBm SBD
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Hybrid material integration in silicon photonic integrated circuits 被引量:2
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作者 Swapnajit Chakravarty† Min Teng +1 位作者 Reza Safian Leimeng Zhuang 《Journal of Semiconductors》 EI CAS CSCD 2021年第4期33-42,共10页
Hybrid integration ofⅢ-Ⅴand ferroelectric materials is being broadly adopted to enhance functionalities in silicon photonic integrated circuits(PICs).Bonding and transfer printing have been the popular approaches fo... Hybrid integration ofⅢ-Ⅴand ferroelectric materials is being broadly adopted to enhance functionalities in silicon photonic integrated circuits(PICs).Bonding and transfer printing have been the popular approaches for integration of III–V gain media with silicon PICs.Similar approaches are also being considered for ferroelectrics to enable larger RF modulation bandwidths,higher linearity,lower optical loss integrated optical modulators on chip.In this paper,we review existing integration strategies ofⅢ-Ⅴmaterials and present a route towards hybrid integration of bothⅢ-Ⅴand ferroelectrics on the same chip.We show that adiabatic transformation of the optical mode between hybrid ferroelectric and silicon sections enables efficient transfer of optical modal energies for maximum overlap of the optical mode with the ferroelectric media,similar to approaches adopted to maximize optical overlap with the gain section,thereby reducing lasing thresholds for hybridⅢ-Ⅴintegration with silicon PICs.Preliminary designs are presented to enable a foundry compatible hybrid integration route of diverse functionalities on silicon PICs. 展开更多
关键词 CMOS technology photonic integrated circuits hybrid integration ferroelectric modulator
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Influence of Tilted Angle on Effective Linear Energy Transfer in Single Event Effect Tests for Integrated Circuits at 130 nm Technology Node 被引量:2
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作者 张乐情 卢健 +5 位作者 胥佳灵 刘小年 戴丽华 徐依然 毕大炜 张正选 《Chinese Physics Letters》 SCIE CAS CSCD 2017年第11期119-122,共4页
A heavy-ion irradiation experiment is studied in digital storage cells with different design approaches in 130?nm CMOS bulk Si and silicon-on-insulator (SOI) technologies. The effectiveness of linear energy transf... A heavy-ion irradiation experiment is studied in digital storage cells with different design approaches in 130?nm CMOS bulk Si and silicon-on-insulator (SOI) technologies. The effectiveness of linear energy transfer (LET) with a tilted ion beam at the 130?nm technology node is obtained. Tests of tilted angles θ=0 ° , 30 ° and 60 ° with respect to the normal direction are performed under heavy-ion Kr with certain power whose LET is about 40?MeVcm 2 /mg at normal incidence. Error numbers in D flip-flop chains are used to determine their upset sensitivity at different incidence angles. It is indicated that the effective LETs for SOI and bulk Si are not exactly in inverse proportion to cosθ , furthermore the effective LET for SOI is more closely in inverse proportion to cosθ compared to bulk Si, which are also the well known behavior. It is interesting that, if we design the sample in the dual interlocked storage cell approach, the effective LET in bulk Si will look like inversely proportional to cosθ very well, which is also specifically explained. 展开更多
关键词 SOI Influence of Tilted Angle on Effective Linear Energy Transfer in Single Event Effect Tests for integrated circuits at 130 nm Tec
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Device Physics Research for Submicron and Deep Submicron Space Microelectronics Devices and Integrated Circuits
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作者 Huang Chang, Yang Yinghua, Yu Shan, Zhang Xing, Xu Jun, Lu Quan, Chen Da 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 1992年第4期3-4,6-2,共4页
Device physics research for submicron and deep submicron space microelectronics devices and integrated circuits will be described in three topics.1.Thin film submicron and deep submicron SOS / CMOS devices and integra... Device physics research for submicron and deep submicron space microelectronics devices and integrated circuits will be described in three topics.1.Thin film submicron and deep submicron SOS / CMOS devices and integrated circuits.2.Deep submicron LDD CMOS devices and integrated circuits.3.C band and Ku band microwave GaAs MESFET and III-V compound hetrojunction HEM T and HBT devices and integrated circuits. 展开更多
关键词 GaAs MESFET CMOS Device Physics Research for Submicron and Deep Submicron Space Microelectronics Devices and integrated circuits MOSFET length
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Development of 0.50μm CMOS Integrated Circuits Technology
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作者 Yu Shan, Zhang Dingkang and Huang Chang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 1992年第4期7-10,2,共5页
Submicron CMOS IC technology, including triple layer resist lithography technology, RIE, LDD, Titanium Salicide, shallow junction, thin gate oxide, no bird's beak isolation and channel's multiple implantation ... Submicron CMOS IC technology, including triple layer resist lithography technology, RIE, LDD, Titanium Salicide, shallow junction, thin gate oxide, no bird's beak isolation and channel's multiple implantation doping technology have been developed. 0.50μm. CMOS integrated circuits have been fabricated using this submicron CMOS process. 展开更多
关键词 In m CMOS integrated circuits Technology Development of 0.50 CMOS
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Development of Physical Library for Short Channel CMOS / SOI Integrated Circuits
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作者 Zhang Xing, Lu Quan, Shi Yongguan, Yang Yinghua, Huang Chang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 1992年第4期16-18,2-6,共5页
An 'Integrated Device and Circuit simulator' for thin film (0.05-0.2μm) submicron (0.5μm) and deep submicron (0.15, 0.25,0.35μm) CMOS/ SOI integrated circuit has been developed. This simulator has been used... An 'Integrated Device and Circuit simulator' for thin film (0.05-0.2μm) submicron (0.5μm) and deep submicron (0.15, 0.25,0.35μm) CMOS/ SOI integrated circuit has been developed. This simulator has been used for design and fabrication and physical library development of thin film submicron and deep submicron CMOS/ SOI integrated circuit. 展开更多
关键词 Development of Physical Library for Short Channel CMOS In SOI integrated circuits
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Advances in Developing Transitions in Microwave Integrated Circuits
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作者 张运传 王秉中 《Journal of Electronic Science and Technology of China》 2005年第1期40-44,共5页
Advances in developing transitions in microwave integrated circuits during the last ten years are reviewed. Some typical structures of transition are introduced. Transition structures can be classified into two basic ... Advances in developing transitions in microwave integrated circuits during the last ten years are reviewed. Some typical structures of transition are introduced. Transition structures can be classified into two basic types: one is transition between the same kind of transmission lines on different planes of a common substrate, the other transition between different types of transmission lines. Furthermore, future development of transition structures is discussed. 展开更多
关键词 ADVANCE transition structure microwave integrated circuits transmission line
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High density Al2O3/TaN-based metal-insulatormetal capacitors in application to radio equency integrated circuits 被引量:3
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作者 丁士进 黄宇健 +3 位作者 黄玥 潘少辉 张卫 汪礼康 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第9期2803-2808,共6页
Metal-insulator-metal (MIM) capacitors with atomic-layer-deposited Al2O3 dielectric and reactively sputtered TaN electrodes in application to radio frequency integrated circuits have been characterized electrically.... Metal-insulator-metal (MIM) capacitors with atomic-layer-deposited Al2O3 dielectric and reactively sputtered TaN electrodes in application to radio frequency integrated circuits have been characterized electrically. The capacitors exhibit a high density of about 6.05 fF/μm^2, a small leakage current of 4.8 × 10^-8 A/cm^2 at 3 V, a high breakdown electric field of 8.61 MV/cm as well as acceptable voltage coefficients of capacitance (VCCs) of 795 ppm/V2 and 268ppm/V at 1 MHz. The observed properties should be attributed to high-quality Al2O3 film and chemically stable TaN electrodes. Further, a logarithmically linear relationship between quadratic VCC and frequency is observed due to the change of relaxation time with carrier mobility in the dielectric. The conduction mechanism in the high field ranges is dominated by the Poole-Frenkel emission, and the leakage current in the low field ranges is likely to be associated with trap-assisted tunnelling. Meanwhile, the Al2O3 dielectric presents charge trapping under low voltage stresses, and defect generation under high voltage stresses, and it has a hard-breakdown performance. 展开更多
关键词 metal-insulator-metal atomic-layer-deposition AL2O3 radio frequency integrated circuit
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Digital synthesis of programmable photonic integrated circuits
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作者 张娟 计正勇 +1 位作者 丁一鹏 王阳 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第2期355-365,共11页
Programmable photonic waveguide meshes can be programmed into many different circuit topologies and thereby provide a variety of functions.Due to the complexity of the signal routing in a general mesh,a particular syn... Programmable photonic waveguide meshes can be programmed into many different circuit topologies and thereby provide a variety of functions.Due to the complexity of the signal routing in a general mesh,a particular synthesis algorithm often only accounts for a specific function with a specific cell configuration.In this paper,we try to synthesize the programmable waveguide mesh to support multiple configurations with a more general digital signal processing platform.To show the feasibility of this technique,photonic waveguide meshes in different configurations(square,triangular and hexagonal meshes)are designed to realize optical signal interleaving with arbitrary duty cycles.The digital signal processing(DSP)approach offers an effective pathway for the establishment of a general design platform for the software-defined programmable photonic integrated circuits.The use of well-developed DSP techniques and algorithms establishes a link between optical and electrical signals and makes it convenient to realize the computer-aided design of optics–electronics hybrid systems. 展开更多
关键词 photonic integrated circuit digital signal processing Z-TRANSFORM
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Two-dimensional materials in photonic integrated circuits:recent developments and future perspectives[Invited] 被引量:2
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作者 谭华 杜磊 +2 位作者 杨丰赫 储蔚 詹义强 《Chinese Optics Letters》 SCIE EI CAS CSCD 2023年第11期51-75,共25页
The heterogeneous integration of photonic integrated circuits(PICs)with a diverse range of optoelectronic materials has emerged as a transformative approach,propelling photonic chips toward larger scales,superior perf... The heterogeneous integration of photonic integrated circuits(PICs)with a diverse range of optoelectronic materials has emerged as a transformative approach,propelling photonic chips toward larger scales,superior performance,and advanced integration levels.Notably,two-dimensional(2D)materials,such as graphene,transition metal dichalcogenides(TMDCs),black phosphorus(BP),and hexagonal boron nitride(hBN),exhibit remarkable device performance and integration capabilities,offering promising potential for large-scale implementation in PICs.In this paper,we first present a comprehensive review of recent progress,systematically categorizing the integration of photonic circuits with 2D materials based on their types while also emphasizing their unique advantages.Then,we discuss the integration approaches of 2D materials with PICs.We also summarize the technical challenges in the heterogeneous integration of 2D materials in photonics and envision their immense potential for future applications in PICs. 展开更多
关键词 two-dimensional materials silicon photonics heterogeneous integration photonic integrated circuits
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Wide bandgap semiconductor-based integrated circuits
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作者 Saravanan Yuvaraja Vishal Khandelwal +1 位作者 Xiao Tang Xiaohang Li 《Chip》 EI 2023年第4期105-132,共28页
Wide-bandgap semiconductors exhibit much larger energybandgaps than traditional semiconductors such as silicon,rendering them very promising to be applied in the fields of electronics and optoelectronics.Prominent exa... Wide-bandgap semiconductors exhibit much larger energybandgaps than traditional semiconductors such as silicon,rendering them very promising to be applied in the fields of electronics and optoelectronics.Prominent examples of semiconductors include SiC,GaN,ZnO,and diamond,which exhibitdistinctive characteristics such as elevated mobility and thermalconductivity.These characteristics facilitate the operation of awide range of devices,including energy-efficient bipolar junctiontransistors(BJTs)and metal-oxide-semiconductor field-effecttransistors(MOSFETs),as well as high-frequency high-electronmobility transistors(HEMTs)and optoelectronic components suchas light-emitting diodes(LEDs)and lasers.These semiconductorsare used in building integrated circuits(ICs)to facilitate theoperation of power electronics,computer devices,RF systems,andother optoelectronic advancements.These breakthroughs includevarious applications such as imaging,optical communication,andsensing.Among them,the field of power electronics has witnessedtremendous progress in recent years with the development of widebandgap(WBG)semiconductor devices,which is capable ofswitching large currents and voltages rapidly with low losses.However,it has been proven challenging to integrate these deviceswith silicon complementary metal oxide semiconductor(CMOS)logic circuits required for complex control functions.The monolithic integration of silicon CMOS with WBG devices increases thecomplexity of fabricating monolithically integrated smart integrated circuits(ICs).This review article proposes implementingCMOS logic directly on the WBG platform as a solution.However,achieving the CMOS functionalities with the adoption of WBGmaterials still remains a significant hurdle.This article summarizesthe research progress in the fabrication of integrated circuitsadopting various WBG materials ranging from SiC to diamond,with the goal of building future smart power ICs. 展开更多
关键词 Wide bandgap semiconductors integrated circuits TRANSISTORS Power electronics
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Carbon nanotube integrated circuit technology:purification,assembly and integration
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作者 Jianlei Cui Fengqi Wei Xuesong Mei 《International Journal of Extreme Manufacturing》 SCIE EI CAS CSCD 2024年第3期120-138,共19页
As the manufacturing process of silicon-based integrated circuits(ICs)approaches its physical limit,the quantum effect of silicon-based field-effect transistors(FETs)has become increasingly evident.And the burgeoning ... As the manufacturing process of silicon-based integrated circuits(ICs)approaches its physical limit,the quantum effect of silicon-based field-effect transistors(FETs)has become increasingly evident.And the burgeoning carbon-based semiconductor technology has become one of the most disruptive technologies in the post-Moore era.As one-dimensional nanomaterials,carbon nanotubes(CNTs)are far superior to silicon at the same technology nodes of FETs because of their excellent electrical transport and scaling properties,rendering them the most competitive material in the next-generation ICs technology.However,certain challenges impede the industrialization of CNTs,particularly in terms of material preparation,which significantly hinders the development of CNT-based ICs.Focusing on CNT-based ICs technology,this review summarizes its main technical status,development trends,existing challenges,and future development directions. 展开更多
关键词 carbon nanotubes integrated circuits field-effect transistors post-Moore
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Progress in complementary metal–oxide–semiconductor silicon photonics and optoelectronic integrated circuits 被引量:7
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作者 陈弘达 张赞 +2 位作者 黄北举 毛陆虹 张赞允 《Journal of Semiconductors》 EI CAS CSCD 2015年第12期1-13,共13页
Silicon photonics is an emerging competitive solution for next-generation scalable data communications in different application areas as high-speed data communication is constrained by electrical interconnects. Optica... Silicon photonics is an emerging competitive solution for next-generation scalable data communications in different application areas as high-speed data communication is constrained by electrical interconnects. Optical interconnects based on silicon photonics can be used in intra/inter-chip interconnects, board-to-board interconnects, short-reach communications in datacenters, supercomputers and long-haul optical transmissions. In this paper, we present an overview of recent progress in silicon optoelectronic devices and optoelectronic integrated circuits (OEICs) based on a complementary metal-oxide-semiconductor-compatible process, and focus on our research contributions. The silicon optoelectronic devices and OEICs show good characteristics, which are expected to benefit several application domains, including communication, sensing, computing and nonlinear systems. 展开更多
关键词 silicon photonics silicon LED grating coupler silicon modulator optoelectronic integrated circuits
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Effect of unbalanced and common losses in quantum photonic integrated circuits 被引量:1
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作者 李明 邹长铃 +1 位作者 郭光灿 任希锋 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第9期94-98,共5页
Loss is inevitable for the optical system due to the absorption of materials, scattering caused by the defects, and surface roughness. In quantum optical circuits, the loss can not only reduce the intensity of the sig... Loss is inevitable for the optical system due to the absorption of materials, scattering caused by the defects, and surface roughness. In quantum optical circuits, the loss can not only reduce the intensity of the signal, but also affect the performance of quantum operations. In this work, we divide losses into unbalanced linear losses and shared common losses, and provide a detailed analysis on how loss affects the integrated linear optical quantum gates. It is found that the orthogonality of eigenmodes and the unitary phase relation of the coupled waveguide modes are destroyed by the loss. As a result, the fidelity of single-and two-qubit operations decreases significantly as the shared loss becomes comparable to the coupling strength. Our results are important for the investigation of large-scale photonic integrated quantum information processes. 展开更多
关键词 Effect of unbalanced and common losses in quantum photonic integrated circuits
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Regrowth-Free Processing for GaAs and InP Photonic Integrated Circuits
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作者 John H. Marsh 《光学学报》 EI CAS CSCD 北大核心 2003年第S1期443-444,共2页
Technologies are described for integrating multiple bandgaps and photonic crystal structures monolithically in a semiconductor chip. Practical devices examples include high power 980 nm pumps, 2×2 crosspoint swit... Technologies are described for integrating multiple bandgaps and photonic crystal structures monolithically in a semiconductor chip. Practical devices examples include high power 980 nm pumps, 2×2 crosspoint switches and lasers modelocked at THz frequencies. 展开更多
关键词 for in In of MODE Regrowth-Free Processing for GaAs and InP Photonic integrated circuits HAVE HIGH been
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A numerical integration-based yield estimation method for integrated circuits
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作者 梁涛 贾新章 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第4期161-169,共9页
A novel integration-based yield estimation method is developed for yield optimization of integrated circuits.This method tries to integrate the joint probability density function on the acceptability region directly. ... A novel integration-based yield estimation method is developed for yield optimization of integrated circuits.This method tries to integrate the joint probability density function on the acceptability region directly. To achieve this goal,the simulated performance data of unknown distribution should be converted to follow a multivariate normal distribution by using Box-Cox transformation(BCT).In order to reduce the estimation variances of the model parameters of the density function,orthogonal array-based modified Latin hypercube sampling (OA-MLHS) is presented to generate samples in the disturbance space during simulations.The principle of variance reduction of model parameters estimation through OA-MLHS together with BCT is also discussed.Two yield estimation examples,a fourth-order OTA-C filter and a three-dimensional(3D) quadratic function are used for comparison of our method with Monte Carlo based methods including Latin hypercube sampling and importance sampling under several combinations of sample sizes and yield values.Extensive simulations show that our method is superior to other methods with respect to accuracy and efficiency under all of the given cases.Therefore,our method is more suitable for parametric yield optimization. 展开更多
关键词 integrated circuits yield estimation Box-Cox transformation orthogonal array Latin hypercube
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Accurate metamodels of device parameters and their applications in performance modeling and optimization of analog integrated circuits
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作者 梁涛 贾新章 陈军峰 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第11期114-120,共7页
Techniques for constructing metamodels of device parameters at BSIM3v3 level accuracy are presented to improve knowledge-based circuit sizing optimization. Based on the analysis of the prediction error of analytical p... Techniques for constructing metamodels of device parameters at BSIM3v3 level accuracy are presented to improve knowledge-based circuit sizing optimization. Based on the analysis of the prediction error of analytical performance expressions, operating point driven (OPD) metamodels of MOSFETs are introduced to capture the circuit's characteristics precisely. In the algorithm of metamodel construction, radial basis functions are adopted to interpolate the scattered multivariate data obtained from a well tailored data sampling scheme designed for MOSFETs. The OPD metamodels can be used to automatically bias the circuit at a specific DC operating point. Analytical-based performance expressions composed by the OPD metamodels show obvious improvement for most small-signal performances compared with simulation-based models. Both operating-point variables and transistor dimensions can be optimized in our nesting-loop optimization formulation to maximize design flexibility. The method is successfully applied to a low-voltage low-power amplifier. 展开更多
关键词 CMOS analog integrated circuits OPTIMIZATION metamodels of device parameters RBF interpolation
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