Fabrication of wear-resistant layers with lamellar eutectic structure by laser surface alloying using the in situ reaction between Cr and B_4C

To improve the wear resistance of Cr5 steel, wear-resistant layers with lamellar eutectic microstructure were fabricated by laser surface alloying（LSA）, which is dependent on the in situ reaction between Cr and B_4C. Our results indicated that the hypoeutectic structures of the LSA layers were divided into interdendritic eutectic structures and dendrites. The area fraction of the eutectic structures increased with increasing laser scanning speed, which improved the hardness and wear resistance of the LSA layers. The average hardness of the LSA layer prepared at a scanning speed of 8 mm/s was HV_（0.2） 883.9, which was 1.8 times greater than that of the traditional quenched layer（approximately HV 480）. After sliding for 659.4 m, the specimen prepared at a scanning speed of 8 mm/s exhibited a volume loss of 0.0323 mm^3, which was only 29.5% of the volume loss of the traditional quenched specimen.

Detailed calibration of the PI-LCX：1300 high performance single photon counting hard x-ray CCD camera

X-ray charge-coupled-device（CCD） camera working in single photon counting mode is a type of x-ray spectrometer with high-sensitivity and superior signal-to-noise performance. In this study, two single photon counting CCD cameras with the same mode（model： PI-LCX： 1300） are calibrated with quasi-monochromatic x-rays from radioactive sources and a conventional x-ray tube. The details of the CCD response to x-rays are analyzed by using a computer program of multi-pixel analyzing and event-distinguishing capability. The detection efficiency, energy resolution, fraction of multi-pixel events each as a function of x-ray energy, and consistence of two CCD cameras are obtained. The calibrated detection efficiency is consistent with the detection efficiency from Monte Carlo calculations with XOP program. When the multi-pixel event analysis is applied, the CCDs may be used to measure x-rays up to 60 ke V with good energy resolution（E /？E ≈ 100 at60 ke V）. The difference in detection efficiency between two CCD cameras is small（5.6% at 5.89 ke V）, but the difference in fraction of the single pixel event between them is much larger（25% at 8.04 ke V）. The obtained small relative error of detection efficiency（2.4% at 5.89 ke V） makes the high accurate measurement of x-ray yield possible in the laser plasma interaction studies. Based on the discrete calibration results, the calculated detection efficiency with XOP can be used for the whole range of 5 ke V–30 ke V.