An accurate photodiode circuit macro-model is proposed for SPICE simulation. The definition and implementation of the macro-model is based on carrier stationary continuity equation. In this macro-model, the photodiode...An accurate photodiode circuit macro-model is proposed for SPICE simulation. The definition and implementation of the macro-model is based on carrier stationary continuity equation. In this macro-model, the photodiode is a device of three pins, one for light intensity input and the other two for photocurrent output, which represent the relationship between photocurrent and incident light. The validity of the proposed macro-model is demonstrated with its PSPICE simulation result compared with reported experimental data.展开更多
论文建立了基于比例边界有限元法(scaled boundary finite element methods,SBFEM)框架的非局部宏微观损伤模型,考虑材料细观物理参数的空间变异性,探讨了材料参数的空间变异性对结构开裂过程的影响。结果表明:考虑材料参数空间变异性后...论文建立了基于比例边界有限元法(scaled boundary finite element methods,SBFEM)框架的非局部宏微观损伤模型,考虑材料细观物理参数的空间变异性,探讨了材料参数的空间变异性对结构开裂过程的影响。结果表明:考虑材料参数空间变异性后,裂纹扩展路径具有不确定性,建议的模型能够很好地反应材料内在的随机性;随着结构受力情况的复杂化和结构本体缺陷的增多,裂纹开裂模式的变异性也会增大。自相关长度和参数变异系数对结构开裂分析结果有重要影响。展开更多
基金National Natural Science Foundation of China(30470469)
文摘An accurate photodiode circuit macro-model is proposed for SPICE simulation. The definition and implementation of the macro-model is based on carrier stationary continuity equation. In this macro-model, the photodiode is a device of three pins, one for light intensity input and the other two for photocurrent output, which represent the relationship between photocurrent and incident light. The validity of the proposed macro-model is demonstrated with its PSPICE simulation result compared with reported experimental data.
文摘论文建立了基于比例边界有限元法(scaled boundary finite element methods,SBFEM)框架的非局部宏微观损伤模型,考虑材料细观物理参数的空间变异性,探讨了材料参数的空间变异性对结构开裂过程的影响。结果表明:考虑材料参数空间变异性后,裂纹扩展路径具有不确定性,建议的模型能够很好地反应材料内在的随机性;随着结构受力情况的复杂化和结构本体缺陷的增多,裂纹开裂模式的变异性也会增大。自相关长度和参数变异系数对结构开裂分析结果有重要影响。