The deformation measurement of electrosynthesized polythiophene(Pth) thin films is difficult because of the small thickness and highflexibility of the specimen. An electronic speckle patterninterferom- etry (ESPI) met...The deformation measurement of electrosynthesized polythiophene(Pth) thin films is difficult because of the small thickness and highflexibility of the specimen. An electronic speckle patterninterferom- etry (ESPI) method is used to measure the deformation ofPth films of thicknesses in the range of 4-65 μm . Theirstress-strain curves are obtained. It is found that the mechanicalproperties of Pth films are sensitive to the specimen thickness. Thetensile strength increases with decreasing thickness of thin filmfrom 10 μm. The influence of the electrochemical synthesisconditions on the mechanical properties of Pth films is also dis-Cussed.展开更多
基金the Basic-Research Foundation of Tsinghua University(JC2000057)the Visiting Scholar Foundation of Solid Mechanical Key Lab in Tongji University of the Ministry of Education of China
文摘The deformation measurement of electrosynthesized polythiophene(Pth) thin films is difficult because of the small thickness and highflexibility of the specimen. An electronic speckle patterninterferom- etry (ESPI) method is used to measure the deformation ofPth films of thicknesses in the range of 4-65 μm . Theirstress-strain curves are obtained. It is found that the mechanicalproperties of Pth films are sensitive to the specimen thickness. Thetensile strength increases with decreasing thickness of thin filmfrom 10 μm. The influence of the electrochemical synthesisconditions on the mechanical properties of Pth films is also dis-Cussed.
