Design of 32 kbit one-time programmable memory for microcontroller units

A 32 kbit OTP(one-time programmable)memory for MCUs(micro-controller units)used in remote controllers was designed.This OTP memory is used for program and data storage.It is required to apply 5.5V to BL(bit-line)and 11V to WL(word-line)for a OTP cell of 0.35μm ETOX(EEPROM tunnel oxide)type by MagnaChip.We use 5V transistors on column data paths to reduce the area of column data paths since they require small areas.In addition,we secure device reliability by using HV(high-voltage)transistors in the WL driver.Furthermore,we change from a static logic to a dynamic logic used for the WL driver in the core circuit.Also,we optimize the WD(write data)switch circuit.Thus,we can implement them with a small-area design.In addition,we implement the address predecoder with a small-area logic circuit.The area of the designed 32 kbit OTP with 5V and HV devices is 674.725μm×258.75μm(=0.1745mm2)and is 56.3% smaller than that using 3.3V devices.

Technical Research for Detector of Grain Moisture Content Based on Error Compensation

According to the existing method including testing the frequency and establishing the relationship between moisture content and frequency, a corresponding instrument was designed. In order to further improve the accuracy and rapidity of the system, a new approach to describe the relationship between the measurement error and the temperature was proposed. The error band could be obtained and divided into several parts（based on the range of temperature） to indicate the error value that should compensate the grain moisture content for the changes in temperature. By calculating the error band at the maximum and the minimum operating temperatures, as well as by determining the error compensation value from the error band based on the measurement moisture content, the final effective result was derived.

Decentralized and overall condition monitoring system for large-scale mobile and complex equipment

It is an urgent project to realize online and overall condition monitoring and timely fault diagnosis for large-scale mobile and complex equipment. Moreover, most of the existing large-scale complex equipment has quite insufficient accessibility of examination, although it still has quite a long service life. The decentralized and overall condition monitoring, as a new concept, is proposed from the point of view of the whole system. A set of complex equipment is divided into several parts in terms of concrete equipment. Every part is processed via one detecting unit, and the main detecting unit is connected with other units. The management work and communications with the remote monitoring center have been taken on by it. Consequently, the difficulty of realizing a condition monitoring system and the complexity of processing information is reduced greatly. Furthermore, excellent maintainability of the condition monitoring system is obtained because of the modularization design. Through an application example, the design and realization of the decentralized and overall condition monitoring system is introduced specifically. Some advanced technologies, such as, micro control unit （MCU）, advanced RISC machines （ARM）, and control area network （CAN）, have been adopted in the system. The system＇s applicability for the existing large-scale mobile and complex equipment is tested.