A novel phase-sensitive scanning near-field optical microscope

Phase is one of the most important parameters of electromagnetic waves. It is the phase distribution that determines the propagation, reflection, refraction, focusing, divergence, and coupling features of light, and further affects the intensity distribution. In recent years, the designs of surface plasmon polariton （SPP） devices have mostly been based on the phase modulation and manipulation. Here we demonstrate a phase sensitive multi-parameter heterodyne scanning near-field opti- cal microscope （SNOM） with an aperture probe in the visible range, with which the near field optical phase and amplitude distributions can be simultaneously obtained. A novel architecture combining a spatial optical path and a fiber optical path is employed for stability and flexibility. Two kinds of typical nano-photonic devices are tested with the system. With the phase-sensitive SNOM, the phase and amplitude distributions of any nano-optical field and localized field generated with any SPP nano-structures and irregular phase modulation surfaces can be investigated. The phase distribution and the interference pattern will help us to gain a better understanding of how light interacts with SPP structures and how SPP waves generate, localize, convert, and propagate on an SPP surface. This will be a significant guidance on SPP nano-structure design and optimization.

Multi-mode Scanning Near-field Optical Microscope

A scanning near-field optical microscope using uncoated fiber tip is described, which can work in transmission and reflection configurations, both capable of working in illumination and collection-mode, so that either transparent or opaque sample can be investigated. Depending on different applications, either constant-gap or constant-height images can be achieved. A compact homemade translator permits to select interested area of sample in the range of 4 mm×4 mm. Working in the constant-height as well as transmission and collection-mode configuration, several kinds of samples such as holographic grating, liposome and zeolite were investigated. The experimental results revealed the dependence of the optical resolution of the SNOM on the tip-sample separation.

Application of a microscopic optical potential of chiral effective field theory in (p, d) transfer reactions

The microscopic global nucleon–nucleus optical model potential(OMP)proposed by Whitehead,Lim,and Holt,the WLH potential(Whitehead et al.,Phys Rev Lett 127:182502,2021),which was constructed in the framework of many-body per-turbation theory with state-of-the-art nuclear interactions from chiral effective field theory(EFT),was tested with(p,d)transfer reactions calculated using adiabatic wave approximation.The target nuclei included both stable and unstable nuclei,and the incident energies reached 200 MeV.The results were compared with experimental data and predictions using the phenomenological global optical potential of Koning and Delaroche,the KD02 potential.Overall,we found that the micro-scopic WLH potential described the(p,d)reaction angular distributions similarly to the phenomenological KD02 potential;however,the former was slightly better than the latter for radioactive targets.On average,the obtained spectroscopic factors(SFs)using both microscopic and phenomenological potentials were similar when the incident energies were below approxi-mately 120 MeV.However,their difference tended to increase at higher incident energies,which was particularly apparent for the doubly magic target nucleus 40Ca.

Comparative Alpha Tracks Counting Using an Optical Microscope and a Spark Counter

In the metrology of radon, an environmental lung carcinogen, the integrated measurements necessary for epidemiological studies are made very often using the tracks detector LR 115 type 2. For dosimetric analysis, the etched tracks from radon alpha particles on this detector are usually counted by means of an optical microscope or a spark counter. An optimal reading of the track densities which must be converted into radon concentrations, can’t be done without a good mastery of the mode of operation and use of these devices. Furthermore, investigations to know as to whether or not each of those can be used to determine radon concentration are necessary. These are the objectives of the present work in which LR 115 samples exposed to radon for at least 3 months, were chemically developed under standard conditions and read. The track densities obtained with the microscope are very much higher than those of the counter for each sample. These results are consistent with those published by other authors. However, each of these devices can be used interchangeably for alpha tracks counting, as both provide radon concentrations with a very good linear correlation coefficient of 0.95 taking into account their respective calibration factors for the reading of this detector. In addition, the saturation phenomenon for the spark counter reading of LR 115 detector occurs beyond 11,000 tr/cm2, a density never reached during our environmental radon measurements.

Local magneto-optical Kerr effect imaging by scanning near-field optical microscope in reflection-mode

A method for local magneto-optical Kerr effect imaging based on a home-made scanning near-field optical microscope working in reflection mode is presented. Shear force detection is carried out by using a symmetric piezoelectric bimorph sensor, which provides an easy way not only for probe-surface distance control but also for imaging. Polarization-preserving fiber probes used as a local optical detector are fabricated with a heating-pulling technique and the probes＇ polarization properties are measured. Shear force topographic and near-field magneto-optical images of magueto-optical disk taken with the proposed method are shown.

A historical overview of nano-optics:From near-field optics to plasmonics

Nano-optics is an emergent research field in physics that appeared in the 1980s,which deals with light–matter optical interactions at the nanometer scale.In early studies of nano-optics,the main concern focus is to obtain higher optical resolution over the diffraction limit.The researches of near-field imaging and spectroscopy based on scanning near-field optical microscopy(SNOM)are developed.The exploration of improving SNOM probe for near-field detection leads to the emergence of surface plasmons.In the sense of resolution and wider application,there has been a significant transition from seeking higher resolution microscopy to plasmonic near-field modulations in the nano-optics community during the nano-optic development.Nowadays,studies of nano-optics prefer the investigation of plasmonics in different material systems.In this article,the history of the development of near-field optics is briefly reviewed.The difficulties of conventional SNOM to achieve higher resolution are discussed.As an alternative solution,surface plasmons have shown the advantages of higher resolution,wider application,and flexible nano-optical modulation for new devices.The typical studies in different periods are introduced and characteristics of nano-optics in each stage are analyzed.In this way,the evolution progress from near-field optics to plasmonics of nano-optics research is presented.The future development of nano-optics is discussed then.

Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope(OM) combined with a nanopipette-based quartz tuning fork atomic force microscope(nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane(PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization(force spectroscopy/microscopy) using the quartz tuning fork(QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.

Experimental research on dual polarized laser optical feedback microscope

The principle of laser optical feedback microscope was presented and demonstrated. Three methods to advance the vertical resolution of laser optical feedback microscope were experimentally studied. The first one is to detect the two polarized lights’ intensities separately with a Wollaston prism instead of to detect the whole light’s intensity. The second is that both of the two orthogonally polarized lights of a birefringent dual frequency laser are fed back. The third one is that only one of the orthogonally polarized lights is fed back. The experimental results show that the modes competition between orthogonally polarized lights can be used to improve the vertical resolution of laser optical feedback microscope effectively.

Standing-wave spectrometry in silicon nano-waveguides using reflection-based near-field scanning optical microscopy

Utilizing reflection-based near-field scanning optical microscopy(NSOM) to image and analyze standing-wave patterns, we present a characterization technique potentially suitable for complex photonic integrated circuits. By raster scanning along the axis of a straight nano-waveguide in tapping mode and sweeping wavelength, detailed information of propagating waves in that waveguide has been extracted from analyses in both space and wavelength domains. Our technique needs no special steps for phase stabilization, thus allowing long-duration and environment-insensitive measurements. As a proof-of-concept test, in a silicon single-mode waveguide with a few of etched holes, the locations and reflection strengths of the inner defects have been quantified. The measurement uncertainty of the reflection amplitude is less than 25% at current stage. Our technique paves the way for non-destructively diagnosing photonic circuits on a chip with sub-wavelength spatial resolution and detailed information extraction.

Micro-Scanning Error Correction Technique for an Optical Micro-Scanning Thermal Microscope Imaging System

An error correction technique for the micro-scanning instrument of the optical micro-scanning thermal microscope imaging system is proposed. The technique is based on micro-scanning technology combined with the proposed second-order oversampling reconstruction algorithm and local gradient image reconstruction algorithm. In this paper, we describe the local gradient image reconstruction model, the error correction technique, down-sampling model and the error correction principle. In this paper, we use a Lena original image and four low-resolution images obtained from the standard half-pixel displacement to simulate and verify the effectiveness of the proposed technique. In order to verify the effectiveness of the proposed technique, two groups of low-resolution thermal microscope images are collected by the actual thermal microscope imaging system for experimental study. Simulations and experiments show that the proposed technique can reduce the optical micro-scanning errors, improve the imaging effect of the system and improve the system's spatial resolution. It can be applied to other electro-optical imaging systems to improve their resolution.

Microstructure Investigation on Refractories Under Optical Microscopes

Optical microscopes with polishing equipment possess high performance/cost ratio for refractories industry. Here, the preparation of polishing sections of refractory materials and products and their observation under microscopes were introduced in detail. The observation of microstructures helps to improve and optimize production process. Optical microscopes can observe （1） homogenous or inhomogeneous composition distribution to improve mixing intensity; （2） coarse grains contact or not and contacted grain edges broken or intact to adjust the pressing parameters to avoid overpressure ; （ 3 ） the filling degree of components to optimize the particle size distribution; （4） the sintering necks and bridges and matrix shrinkage status to adjust sintering intensity or sintering atmosphere; （5） the crack edge in round or sharp to know when the cracks formed （ before or after entering sintering zone） and take countermeasures ; （6） used refractories to find the wear mechanism.

Optical polarization response at gold nanosheet edges probed by scanning near-field optical microscopy

Optical properties of metallic edge-like structures known as knife-edges are a topic of interest and possess potential applications in enhanced Raman scattering, optical trapping, etc. In this work, we investigate the near-field optical polar- ization response at the edge of a triangular gold nanosheet, which is synthesized by a wet chemical method. A homemade scanning near-field optical microscope （SNOM） in collection mode is adopted, which is able to accurately locate its probe at the edge during experiments. An uncoated straight fiber probe is used in the SNOM, because it s611 preserves the prop- erty of light polarization though it has the depolarization to some extent. By comparing near-field intensities at the edge and glass substrate, detected in different polarization directions of incident light, the edge-induced depolarization is found, which is supported by the finite differential time domain （FDTD） simulated results. The depolarized phenomenon in the near-field is similar to that in the far-field.

Remote-mode microsphere nano-imaging：new boundaries for optical microscope

Remote-mode microsphere nanoscope can observe the nano-structures with 23 nm feature size. It does not require samplepreparation and functions in both ambient air and liquid environments. Compared with the scientific characterizationtools listed in Table S1, the simple and portable nature makes the microsphere nanoscope a favorable solution forgeneral purpose imaging in practical fields, like hospitals, food industry, semiconductor production lines, schools andenvironment agencies.

Influence of the probe-sample interaction on scanning near-field optical microscopic images in the far field

We have studied the influence of probe-sample interaction in a scanning near-field optical microscopy （SNOM） in the far field by using samples with a step structure. For a sample with a step height of - λ/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of-λ/2, the image contrast remains approximately the same. The probe-sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.

Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System

Based on a strong inter-diagonal matrix and Taylor series expansions,an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2 ×2 microscanning undersampling images from the real irregular undersampling images,and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system＇s spatial resolution. The algorithm is simple,fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.

Scanning Head for the Apertureless near Field Optical Microscope

The design and characterization of a tip control unit for an apertureless scanning near field optical microscope (ASNOM) is reported. To make the instrument operation easier, the cantilever control parts (piezo excitation of the cantilever vibration for the dynamic mode feedback and the parts necessary for the optical lever scheme of the vibration control) were placed in a separate detachable assembly. To suppress the influence of vibrations of the setup, the assembly was made lightweight. Good optical access to the ASNOM tip from various directions is provided in the system. High long-term mechanical stability of the system (~50 nm lateral drift in 18 hours) as well as low sensitivity to seismic vibrations (~400 pm RMS) is demonstrated. It is shown that external sound is not a main source of noise in the topography image (~200 pm RMS). The light field distribution (with its amplitude and phase) around the ASNOM tip was acquired by scanning the focal spot around the tip, and a high optical quality of the system is demonstrated.

Development of a portable reflectance confocal microscope and its application in the noninvasive in vivo evaluation of mesenchymal stem cell-promoted cutaneous wound healing

The process of wound healing is routinely evaluated by histological evaluation in the clinic,which may cause scarring and secondary injury.Reflectance confocal microscopy(RCM)represents a noninvasive,real-time imaging technique that allows in vivo evaluation of the skin.Traditional RCM was wide-probe-based,which limited its application on uneven and covered skin.In this study,we report the development of a portable reflectance confocal microscope(PRCM)in which all components were assembled in a handheld shell.Although the size and weight of the PRCM were reduced based on the use of a microelectromechanical system,the resolution was kept at 0.91μm,and the field of view of the system was 343μm×532μm.When used in vivo,the PRCM was able to visualize cellular and nuclear morphology for both mouse and human skin.PRCM evaluations were then performed on wounds after topically applied mesenchymal stem cells(MSCs)or saline treatment.The PRCM allowed visualization of the formation of collagen bundles,re-epithelization from the wound edge to the wound bed,and hair follicle regeneration,which were consistent with histological evaluations.Therefore,we offer new insights into monitoring the effects of topically applied MSCs on the process of wound healing by using PRCM.This study illustrates that the newly developed PRCM represents a promising device for real-time,noninvasive monitoring of the dynamic process of wound healing,which demonstrates its potential to diagnose,monitor,or predict disease in clinical wound therapy.

IN-SITU DISTANCE RESOLVED OPTICALLY TRANSPARENT THIN-LAYER MICROSCOPIC FTIR SPECTROELECTROCEMISTRY.ESTIMATION OF THE ELECTROCHEMICAL CONCENTRATION-DISTANCE PROFILE

An in-situ optically transparent thin-layer microscopic FTIR spectroelectro- chemical cell was constructed.Using this cell,we characterize a concentration-distance profile in the electrochemical diffusion thin-layer by in-situ adjusting the focal point at different distances to the electrode surface.

Influence of InAs deposition thickness on the structural and optical properties of InAs quantum wires

The influence of InAs deposition thickness on the structural and optical properties of InAs/InA1As quantum wires （QWR） superlattices （SLS） was studied. The transmission electron microscopy （TEM） results show that with increasing the InAs deposited thickness, the size uniformity and spatial ordering of InAs QWR SLS was greatly improved, but threading dislocations initiated from InAs nanowires for the sample with 6 monolayers （MLs） InAs deposition. In addition, the zig-zag features along the extending direc- tion and lateral interlink of InAs nanowires were also observed. The InAs nanowires, especially for the first period, were laterally compact. These structural features may result in easy tunneling and coupling of charge carders between InAs nanowires and will hamper their device applications to some extent. Some suggestions are put forward for further improving the uniformity of the stacked InAs QWRs, and for suppressing the formation of the threading dislocations in InAs QWR SLS.

Effect of Heat Treatment on the Nanoscale Structure and Optical Properties of Cd₂SnO₄Thin Films Deposited by RF Magnetron Sputtering

Cadmium tin oxide Cd2SnO4 thin films with a thickness of 228.5 nm were prepared by RF magnetron sputtering technique on glass substrates at room temperature. AFM has been utilized to study the morphology of these films as a function of annealing temperature at the nanoscale. The optical properties of these films, such as the transmittance, T(λ), and reflectance, R(λ), have been studied as a function of annealing temperature. The optical constants, such as optical energy gap, width of the band tails of the localized states, refractive index, oscillatory energy, dispersion energy, real and imaginary parts of both dielectric constant and optical conductivity have been found to be affected by changing the annealing temperature of the films.