Nowadays,radiation engineering is a promising direction in the creation of semiconductor devices.The proton irradiation is used to controllably change the optical,electrical,recombination,mechanical and structural pro...Nowadays,radiation engineering is a promising direction in the creation of semiconductor devices.The proton irradiation is used to controllably change the optical,electrical,recombination,mechanical and structural properties of the semiconductors.Low-energy protons make it possible to purposefully change material properties near the surface where the n^(+)-p junction is located.In this paper,the impact of low-energy protons on the electro physical parameters of n+-p-p+silicon photoelectric converters(SPC)is analyzed.The current-voltage characteristics and switching time of these SPCs are measured.The switching time is determined using rectangular bipolar voltage pulses with an amplitude of 10 mV,a frequency of 200 kHz,or a frequency of 1 MHz.A theoretical and experimental analysis of the obtained results is performed.The comparison of experimental data with the results of calculations shows that protons with an energy of 180 keV and a dose of 10×15 cm^(-2) create two regions in the space charge region of the n^(+)-p junction with different switching times of 4.2×10^(-7) s and 5.5×10^(-8) s.SPC frequency characteristics have been improved by reducing the effective lifetime by 5-10 times.This effect can be used to create high-speed photodiodes with an operating modulation frequency of 18 MHz.展开更多
High-performance Ge n~＋/p junctions were fabricated at a low formation temperature from 325℃ to 400℃ with a metal（nickel）-induced dopant activation technique. The obtained Ni Ge electroded Ge n＋/p junction has a...High-performance Ge n~＋/p junctions were fabricated at a low formation temperature from 325℃ to 400℃ with a metal（nickel）-induced dopant activation technique. The obtained Ni Ge electroded Ge n＋/p junction has a rectification ratio of 5.6×10~4 and a forward current of 387 A/cm^2at -1 V bias. The Ni-based metal-induced dopant activation technique is expected to meet the requirement of the shallow junction of Ge MOSFET.展开更多
ZnO micro-prisms are prepared on the p-type and n-type Si substrates, separately. The Ⅰ-Ⅴ curves analysed by AFM show that the interface junctions between the ZnO micro-prisms and the p-type substrate and between th...ZnO micro-prisms are prepared on the p-type and n-type Si substrates, separately. The Ⅰ-Ⅴ curves analysed by AFM show that the interface junctions between the ZnO micro-prisms and the p-type substrate and between the ZnO micro-prisms and the n-type Si substrate exhibit p-n junction behaviour and ohmic contuct behuviour, respectively. The formation of the p-n heterojunction and ohmic contact is ascribed to the intrinsic n-type conduction of ZnO material. Better field emission performance （lower onset voltage and larger emission current） is observed from an individual ZnO micro-prism grown on the n-type Si substrate. It is suggested that the n-Si/n-ZnO interracial ohmic contact benefits the electron emission; while the p-Si/n-ZnO interface heterojunction deteriorates the electron emission.展开更多
Monolayer transition-metal dichalcogenides （TMDs） are considered to be fantastic building blocks for a wide variety of optical and optoelectronic devices such as sensors, photodetectors, and quantum emitters, owing ...Monolayer transition-metal dichalcogenides （TMDs） are considered to be fantastic building blocks for a wide variety of optical and optoelectronic devices such as sensors, photodetectors, and quantum emitters, owing to their direct band gap, transparency, and mechanical flexibility. The core element of many conventional electronic and optoelectronic devices is the p-n junction, in which the p- and n-types of the semiconductor are formed by chemical doping in different regions. Here, we report a series of optoelectronic studies on a monolayer WSe2 in-plane p-n photodetector, demonstrating a low- power dissipation by showing an ambipolar behavior with a reduced threshold voltage by a factor of two compared with the previous results on a lateral electrostatically doped WSe2 p-n junction. The fabrication of the device is based on a polycarbonates （PC） transfer technique and hence no electron-beam exposure induced damage to the monolayer WSe2 is expected. Upon optical excitation, the photodetector demonstrates a photoresponsivity of 0.12 mA.W-1 and a maximum external quantum efficiency of 0.03%. Our study provides an alternative platform for a flexible and transparent two- dimensional photodetector, from which we expect to further promote the development of next-generation optoelectronic devices.展开更多
We investigate the electronic-transport properties of two-dimensional monolayer films from Au-P-Au molecular junction to Au-Si-Au molecular junction using elastic scattering Green＇s function theory. In the process of...We investigate the electronic-transport properties of two-dimensional monolayer films from Au-P-Au molecular junction to Au-Si-Au molecular junction using elastic scattering Green＇s function theory. In the process of replacing the P atoms with Si atoms every other line from the middle of monolayer blue phosphorus molecular structure, the substitution of Si atoms changes the properties of Au-P-Au molecular junction significantly. Interestingly, the current value has a symmetric change as a parabolic curve with the peak appearing in Au-Si_1P_1-Au molecular junction, which provides the most stable current of 15.00 nA in a wide voltage range of 0.70-2.70 V.Moreover, the current-voltage characteristics of the structures indicate that the steps tend to disappear revealing the property similar to metal when the Si atoms dominate the molecular junction.展开更多
文摘Nowadays,radiation engineering is a promising direction in the creation of semiconductor devices.The proton irradiation is used to controllably change the optical,electrical,recombination,mechanical and structural properties of the semiconductors.Low-energy protons make it possible to purposefully change material properties near the surface where the n^(+)-p junction is located.In this paper,the impact of low-energy protons on the electro physical parameters of n+-p-p+silicon photoelectric converters(SPC)is analyzed.The current-voltage characteristics and switching time of these SPCs are measured.The switching time is determined using rectangular bipolar voltage pulses with an amplitude of 10 mV,a frequency of 200 kHz,or a frequency of 1 MHz.A theoretical and experimental analysis of the obtained results is performed.The comparison of experimental data with the results of calculations shows that protons with an energy of 180 keV and a dose of 10×15 cm^(-2) create two regions in the space charge region of the n^(+)-p junction with different switching times of 4.2×10^(-7) s and 5.5×10^(-8) s.SPC frequency characteristics have been improved by reducing the effective lifetime by 5-10 times.This effect can be used to create high-speed photodiodes with an operating modulation frequency of 18 MHz.
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61176092 and 61474094)the National Natural Science Foundation of China–National Research Foundation of Korea Joint Research Project(Grant No.11311140251)the National Basic Research Program of China(Grant Nos.2012CB933503 and 2013CB632103)
文摘High-performance Ge n~＋/p junctions were fabricated at a low formation temperature from 325℃ to 400℃ with a metal（nickel）-induced dopant activation technique. The obtained Ni Ge electroded Ge n＋/p junction has a rectification ratio of 5.6×10~4 and a forward current of 387 A/cm^2at -1 V bias. The Ni-based metal-induced dopant activation technique is expected to meet the requirement of the shallow junction of Ge MOSFET.
文摘ZnO micro-prisms are prepared on the p-type and n-type Si substrates, separately. The Ⅰ-Ⅴ curves analysed by AFM show that the interface junctions between the ZnO micro-prisms and the p-type substrate and between the ZnO micro-prisms and the n-type Si substrate exhibit p-n junction behaviour and ohmic contuct behuviour, respectively. The formation of the p-n heterojunction and ohmic contact is ascribed to the intrinsic n-type conduction of ZnO material. Better field emission performance （lower onset voltage and larger emission current） is observed from an individual ZnO micro-prism grown on the n-type Si substrate. It is suggested that the n-Si/n-ZnO interracial ohmic contact benefits the electron emission; while the p-Si/n-ZnO interface heterojunction deteriorates the electron emission.
基金Project supported by the National Key Research and Development Program of China(Grant No.2016YFA0301700)the National Natural Science Foundation of China(Grant Nos.61590932,11774333,61674132,11674300,11575172,and 11625419)+2 种基金the Anhui Provincial Initiative in Quantum Information Technologies,China(Grant Nos.AHY080000 and AHY130300)the Strategic Priority Research Program of the Chinese Academy of Sciences(Grant No.XDB24030601)the Fundamental Research Funds for the Central Universities,China
文摘Monolayer transition-metal dichalcogenides （TMDs） are considered to be fantastic building blocks for a wide variety of optical and optoelectronic devices such as sensors, photodetectors, and quantum emitters, owing to their direct band gap, transparency, and mechanical flexibility. The core element of many conventional electronic and optoelectronic devices is the p-n junction, in which the p- and n-types of the semiconductor are formed by chemical doping in different regions. Here, we report a series of optoelectronic studies on a monolayer WSe2 in-plane p-n photodetector, demonstrating a low- power dissipation by showing an ambipolar behavior with a reduced threshold voltage by a factor of two compared with the previous results on a lateral electrostatically doped WSe2 p-n junction. The fabrication of the device is based on a polycarbonates （PC） transfer technique and hence no electron-beam exposure induced damage to the monolayer WSe2 is expected. Upon optical excitation, the photodetector demonstrates a photoresponsivity of 0.12 mA.W-1 and a maximum external quantum efficiency of 0.03%. Our study provides an alternative platform for a flexible and transparent two- dimensional photodetector, from which we expect to further promote the development of next-generation optoelectronic devices.
基金Project supported by the National Natural Science Foundation of China （Grant No 60606021）, the Specialized Research Fund for the Doctoral Program of Higher Education of China （Grant No 20060003067） and the Key Fundamental Research Foundation of Tsinghua University of China （Grant No Jz2001010）.
基金Supported by the National Natural Science Foundation of China under Grant Nos 11374033,11774030,51735001 and 61775016the Fundamental Research Funds for the Central Universities under Grant No 2017CX10007
文摘We investigate the electronic-transport properties of two-dimensional monolayer films from Au-P-Au molecular junction to Au-Si-Au molecular junction using elastic scattering Green＇s function theory. In the process of replacing the P atoms with Si atoms every other line from the middle of monolayer blue phosphorus molecular structure, the substitution of Si atoms changes the properties of Au-P-Au molecular junction significantly. Interestingly, the current value has a symmetric change as a parabolic curve with the peak appearing in Au-Si_1P_1-Au molecular junction, which provides the most stable current of 15.00 nA in a wide voltage range of 0.70-2.70 V.Moreover, the current-voltage characteristics of the structures indicate that the steps tend to disappear revealing the property similar to metal when the Si atoms dominate the molecular junction.
