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Effects of atomic corrugations on electronic structures in Pb_(1-x)Bi_(x) thin films
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作者 李鹏举 谢鹍 +2 位作者 夏玉敏 蔡德胜 秦胜勇 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第6期391-394,共4页
We carried out experimental investigations of the geometric effect on the electronic behavior in Pb_(1-x)Bi_(x) thin films by scanning tunneling microscopy and spectroscopy.Single crystal monolayer Pb_(0.74)Bi_(0.26) ... We carried out experimental investigations of the geometric effect on the electronic behavior in Pb_(1-x)Bi_(x) thin films by scanning tunneling microscopy and spectroscopy.Single crystal monolayer Pb_(0.74)Bi_(0.26) and two-monolayer Pb_(0.75)Bi_(0.25)Pb_(1-x)Bi_(x) thin films were fabricated by molecular beam epitaxy,where large surface corrugations were observed.Combined with tunneling spectroscopic measurements,it is found that atomic corrugations can widely change the electronic behaviors.These findings show that the Pb_(1-x)Bi_(x) system can be a promising platform to further explore geometry-decorated electronic behavior in two-dimensional metallic thin films. 展开更多
关键词 electronic contribution geometric corrugation scanning tunneling microscopy pbbi alloy films
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