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Large-area atomic-smooth polyvinylidene fluoride Langmuir-Blodgett film exhibiting significantly improved ferroelectric and piezoelectric responses 被引量:3
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作者 Shan He Mengfan Guo +8 位作者 Zhenkang Dan Shun Lan Weibin Ren Le Zhou Yue Wang Yuhan Liang Yunpeng Zheng Jiayu Pan Yang Shen 《Science Bulletin》 SCIE EI CSCD 2021年第11期1080-1090,M0003,共12页
Large roughness and structure disorder in ferroelectric ultrathin Langmuir-Blodgett(LB)film results in severe space scatter in electrical,ferroelectric and piezoelectric characteristics,thus limiting the nanoscale res... Large roughness and structure disorder in ferroelectric ultrathin Langmuir-Blodgett(LB)film results in severe space scatter in electrical,ferroelectric and piezoelectric characteristics,thus limiting the nanoscale research and reliability of nano-devices.However,no effective method aiming at large-area uniform organic ferroelectric LB film has ever been reported to date.Herein,we present a facile hot-pressing strategy to prepare relatively large-area poly(vinylidene fluoride)(PVDF)LB film with ultra-smooth surface root mean square(RMS)roughness is 0.3 nm in a 30μm×30μm area comparable to that of metal substrate,which maximized the potential of LB technique to control thickness distribution.More importantly,compared with traditionally annealed LB film,the hot-pressed LB film manifests significantly improved structure uniformity,less fluctuation in ferroelectric characteristics and higher dielectric and piezoelectric responses,owing to the uniform dipole orientation and higher crystalline quality.Besides,different surface charge relaxation behaviors are investigated and the underlying mechanisms are explained in the light of the interplay of surface charge and polarization charge in the case of nanoscale non-uniform switching.We believe that our work not only presents a novel strategy to endow PVDF LB film with unprecedented reliability and improved performance as a competitive candidate for future ferroelectric tunnel junctions(FTJs)and nano electro mechanical systems(NEMS),but also reveals an attracting coupling effect between the surface potential distribution and nanoscale non-uniform switching behavior,which is crucial for the understanding of local transport characterization modulated by band structure,bit signal stability for data-storage application and the related surface charge research,such as charge gradient microscopy(CGM)based on the collection of surface charge on the biased ferroelectric domains. 展开更多
关键词 poly(vinylidene fluoride)(pvdf) Langmuir-Blodgett film Roughness FERROELECTRIC PIEZORESPONSE Charge relaxation
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基于PVDF的三维纳米谐振触发测头及定位系统 被引量:4
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作者 李志渤 黄强先 +2 位作者 史科迪 韩彬 余惠娟 《机械工程学报》 EI CAS CSCD 北大核心 2015年第2期1-6,共6页
微纳米三坐标测量机(Coordinate measuring machining,CMM)是目前微纳米三维测量领域的一个研究热点,针对微纳米CMM中三维纳米测头的研究瓶颈,提出一种与现有机械接触式测头和光学非接触式测头工作原理完全不同的、可达到纳米/亚纳米量... 微纳米三坐标测量机(Coordinate measuring machining,CMM)是目前微纳米三维测量领域的一个研究热点,针对微纳米CMM中三维纳米测头的研究瓶颈,提出一种与现有机械接触式测头和光学非接触式测头工作原理完全不同的、可达到纳米/亚纳米量级触发分辨力的新型谐振测头。利用聚偏氟乙烯(Poly vinylidene fluoride,PVDF)薄膜的压电特性和其谐振参数对微小作用力的高敏感性,PVDF薄膜与一体式光纤微测杆测球相结合构建成了基于PVDF薄膜的三维纳米谐振触发测头。该测头在z向以轻敲模式接触,在x、y向以摩擦模式接触。经过试验验证,由该测头与三维纳米定位平台、数据处理及反馈控制系统相结合构建成的三维谐振纳米触发定位系统在x、y、z三个方向的触发分辨力都达到了亚纳米量级,分别为0.12 nm、0.10 nm、0.12 nm;三维重复性误差分别为26 nm、36 nm、10 nm。试验结果证实了新型三维谐振测头及其系统的有效性。 展开更多
关键词 微纳米三坐标测量机 三维纳米测头 聚偏氟乙烯薄膜 三维谐振触发测头 三维谐振触发定位系统
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基于聚偏二氟乙烯步态智能检测的乘客计数系统 被引量:2
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作者 谢瑜 胡昕彤 +1 位作者 孟希赟 刘云杰 《计算机应用》 CSCD 北大核心 2015年第12期3602-3606,共5页
针对现有的以低成本、耐损耗的聚偏二氟乙烯(PVDF)为压电材料的客流计数传感器存在的误计数、漏计数而导致精度不够的问题,提出了一种基于PVDF步态智能检测技术的乘客计数系统。采用ANSYS软件对乘客上下车步态作应力分析,观察PVDF压电... 针对现有的以低成本、耐损耗的聚偏二氟乙烯(PVDF)为压电材料的客流计数传感器存在的误计数、漏计数而导致精度不够的问题,提出了一种基于PVDF步态智能检测技术的乘客计数系统。采用ANSYS软件对乘客上下车步态作应力分析,观察PVDF压电信号的分布规律,设计多输入信号调理电路获取多通道足底信号,结合信号处理算法,设计了传感器机械结构和基于实验室虚拟仪器集成环境(Lab VIEW)的公交车人数统计系统。实验结果表明,该系统平均计数误差为5.3%,与已有的PVDF客流计数传感器相比,提高了精度;与视频图像计数和人体红外检测技术相比,大大降低了成本,具有很高的实用性,可以广泛应用于我国公共交通客运车。 展开更多
关键词 自动乘客计数 聚偏二氟乙烯薄膜 受力分析 电路设计 实验室虚拟仪器集成环境
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