Polycapillary X-ray lens for the secondary focusing Beijing synchrotron radiation source

According to intensity distribution of the synchrotron radiation source focused by a toroidal mirror at the Beijing synchrotron radiation biological macromolecule station, theoretical modeling of the Beijing synchrotron radiation source is developed for capillary optics. Using this theoretical modeling, the influences of the configuration curve of the polycapillary X-ray lens on transmission efficiency and working distance are analyzed. The experimental results of the transmission efficiency and working distance at the biological macromolecule station are in good agreement with the theoretical results.

Detailed characterization of polycapillary focusing x-ray lenses by a charge-coupled device detector and a pinhole

A method to measure the detailed performance of polycapillary x-ray optics by a pinhole and charge coupled device(CCD)detector was proposed in this study.The pinhole was located between the x-ray source and the polycapillary x-ray optics to determine the illuminating region of the incident x-ray beam on the input side of the optics.The CCD detector placed downstream of the polycapillary x-ray optics ensured that the incident x-ray beam controlled by the pinhole irradiated a specific region of the input surface of the optics.The intensity of the output beam of the polycapillary x-ray optics was obtained from the far-field image of the output beam of the optics captured by CCD detector.As an application example,the focal spot size,gain in power density,transmission efficiency,and beam divergence of different parts of a polycapillary focusing x-ray lenses(PFXRL)were measured by a pinhole and CCD detector.Three pinholes with diameters of 500,1000,and 2000μm were used to adjust the diameter of the incident x-ray beam illuminating the PFXRL from 500μm to the entire surface of the input side of the PFXRL.The focal spot size of the PFXRL,gain in power density,transmission efficiency,and beam divergence ranged from 27.1μm to 34.6μm,400 to 3460,26.70%to 5.38%,and 16.8 mrad to 84.86 mrad,respectively.

X-ray focusing using an x-ray lens composed of multi-square polycapillary slices

A new type of x-ray lens composed of multi-square polycapillary slices(ASPXRL)used in focusing parallel x-ray beam was presented in this paper.Compared with conventional x-ray polycapillary lens,ASPXRL can provide smaller and brighter focus.The effects of the manufacturing imperfections on focusing quality of ASPXRL were evaluated with the values of transmission efficiency and discussed.It is suggested that ASPXRL has application prospects as a condenser lens for x-ray microscopy and flux collectors for x-ray analytical instruments.

Hard X-ray focusing resolution and efficiency test with a thickness correction multilayer Laue lens

The multilayer Laue lens(MLL) is a diffractive focusing optical element which can focus hard X-rays down to the nanometer scale. In this study, a WSi_(2)/Si multilayer structure consisting of 1736 layers, with a 7.2-nm-thick outermost layer and a total thickness of 17 μm, is prepared by DC magnetron sputtering. Regarding the thin film growth rate calibration, we correct the long-term growth rate drift from 2 to 0.6%, as measured by the grazing incidence X-ray reflectivity(GIXRR). A one-dimensional line focusing resolution of 64 nm was achieved,while the diffraction efficiency was 38% of the-1 order of the MLL Shanghai Synchrotron Radiation Facility(SSRF) with the BL15U beamline.

Focusing high-energy x-rays by a P MMA compound x-ray lens on Beijing synchrotron radiation facility

The x-ray compound lens is a novel refractive x-ray optical device. This paper reports the authors＇ recent research on a polymethyl methacrylate （PMMA） compound x-ray lens. Firstly the designing and LIGA fabrication process for the PMMA compound x-ray lens are briefly described. Then, a method for theoretical analysis, as well as the experimental system for measurement is also introduced. Finally, the focusing spots for 8keV monochromatic x-rays by the PMMA compound x-ray lens are measured and analysed. According to the experimental results, it is concluded that the PMMA compound x-ray lens promises a good focusing performance under the high-energy x-rays.

Property of slice square polycapillary x-ray optics

A geometrical description of square polycapillary x-ray optics and the basic theory of the transmission of x-rays are presented. A method of numerical calculation is developed based on ray-tracing theory. The method simulates the intensity distribution of x-rays propagating through slice square polycapillary x-ray optics. The simulation results are compared with the experimental results.

基于整体毛细管会聚透镜在氦气环境下的X射线荧光技术

当X射线荧光(XRF)技术被用于分析空气环境中样品的元素组成时,由于空气对低原子序数(Z)元素(如Cl、K、Ca等)中能量较低的特征X射线吸收较大,从而影响探测效果,因此为了避免空气对低Z元素特征X射线的吸收,经常采用真空条件下XRF技术,但它需要复杂昂贵的真空系统。另外,一般实验室光源功率较低,所以入射光强度较弱,从而也影响探测效果。为解决上述这些问题,设计了基于整体毛细管X射线透镜(PCXRL)和转靶光源并在氦气环境下的密闭XRF简易分析系统。利用透镜聚焦获得的高功率密度增益X射线照射样品,获得较强的XRF信号,并使激发通道和探测通道处于稳定的氦气环境,以降低空气对低Z元素特征X射线的吸收。通过实验对整个XRF分析系统进行了表征,然后测定了互花米草、盐地碱蓬样品。研究表明,在氦气环境中,利用旋转钼靶光源并使工作电压和电流分别为29 kV和20 mA的条件下,所探测到的Cl、K、Ca、Fe等元素特征峰强度高于空气环境下的强度,针对植物中X射线特征峰能量低于8 keV的元素而言,在氦气环境中探测到的特征峰强度为空气中的1.1~5.5倍。这有利于高效无损分析样品中的低原子序数元素成分。

X-ray nanometer focusing at the SSRF based on a multilayer Laue lens

We designed and fabricated a multilayer Laue lens （MLL） as a hard X-ray focusing device. WSi2/Si multilayers were chosen owing to their excellent optical properties and relatively sharp interface. The multilayer sample was fabricated by using direct current （DC） magnetron sputtering technology and then was sliced and thinned to form an MLL. The thickness of each layer was determined by scanning electron microscopy （SEM） image analysis with marking layers. The focusing property of the MLL was measured at Beamline 15U, Shanghai Synchrotron Facility （SSRF）. One-dimensional （1D） focusing resolutions of 92 nm are obtained at photon energy of 14 keV.

Hard X-ray one dimensional nano-focusing at the SSRF using a WSi_2 /Si multilayer Laue lens

The multilayer Laue lens （MLL） is a novel diffraction optics which can realize nanometer focusing of hard X-rays with high efficiency. In this paper, a 7.9 μm-thick MLL with the outmost layer thickness of 15 nm is designed based on dynamical diffraction theory. The MLL is fabricated by first depositing the depth-graded multilayer using direct current （DC） magnetron sputtering technology. Then, the multilayer sample is sliced, and both cross-sections are thinned and polished to a depth of 35–41 μm. The focusing property of the MLL is measured at the Shanghai Synchrotron Facility （SSRF）. One-dimensional （1D） focusing resolutions of 205 nm and 221 nm are obtained at E=14 keV and 18 keV, respectively. It demonstrates that the fabricated MLL can focus hard X-rays into nanometer scale.

Design and fabrication of one-dimensional focusing X-ray compound lens with A1 material

A method based on Fourier spectrum analysis for predicting the performances of the X-ray compound lenses is briefly introduced, the theoretical result obtained is the same as that of Fresnel-Kirchhoff approach. A kind of technique named moulding is developed for fabricating the one-dimensional (1D) compound X-ray lens with Al material and the fabrication process is presented. In addition, a two-time coating method is used to improve the numerical apertures of the compound lenses. Furthermore, the focusing performance of the Al compound X-ray lens under the high energy X-rays is measured.

X光透镜应用于蛋白大分子晶体衍射

X光透镜能以较大的收集角收集X光 ,并以准平行光出射 .X光透镜应用于生物蛋白大分子晶体衍射 ,替代单色仪双聚焦镜 ,照射晶体样品的光强提高数倍乃至 1到 2个数量级 ,衍射强度的提高远大于 5倍 ,大大缩短了测试时间 ,分辨能力改善 0 .0 2～ 0 .0 5nm 。

一种针对组合材料研究的高通量X射线结构、成分表征方法

将X射线毛细管聚焦技术和能量色散X射线衍射技术相结合,提出了一种新的针对组合材料研究的高通量X射线结构、成分分析方法,并实际构建了一个样机,测试了样机的性能,验证了此方法的可行性及优缺点。

一种新型的微束XRF谱仪

本文介绍一种新型高能量分辨微束 X 荧光分析谱仪,它由导管 X 光透镜和使用位置灵敏正比计数管的波长色散谱仪组成。实验结果表明本谱仪使用的 X 光透镜形成的 X 光微束的最小束径对 Cu Kα线为 50 μm,一次测量同时覆盖的能量范围可达 800 eV 以上,而对 Ti Kα线的能量分辨达到 4.4 eV。

整体平行束X光透镜在实验室EXAFS谱仪中的应用研究

结合整体平行束X光透镜在实验室EXAFS谱仪中应用研究 ,利用整体平行束X光透镜和粉末衍射仪设计了一种实验室EXAFS谱仪 .工作电压和电流分别为 2 5kV和 10 0mA时 ,该谱仪在 9.92keV能量点处 ,计数率为 3.12× 10 4 s- 1,在钨杂质的特征谱线Lβ1能量点处 ,能量分辨率为15 .4eV .整体平行束X光透镜在该谱仪中既起到会聚X射线的作用又可实现高能滤波器的功能 .对实验现象进行了理论分析 .

利用毛细管X光透镜共聚焦微束X射线荧光技术对单根头发中元素空间分布进行无损扫描分析

头发中的元素与人的饮食和健康状况有关,对头发中元素的分析,不仅可用于刑事物证鉴别,还可为疾病的预防和治疗提供依据,因此,如何检测头发中元素分布等信息倍受人们关注。本文利用基于毛细管X光透镜和实验室普通X射线光源的共聚焦微束X射线荧光技术对单根头进行了无损扫描分析,分析了单根头发中元素的空间分布。在该毛细管X光透镜共聚焦微束X射线荧光技术中,毛细管X光会聚透镜的出口焦斑和毛细管X光平行束透镜的入口焦斑处在共聚焦状态,从而形成共聚焦微元,探测器只能探测到来自该共聚焦微元中的X射线信号,降低了背底信号对X射线荧光谱的影响,从而有利于提高该共聚焦X射线荧光技术的分析精度。该共聚焦技术中采用了具有高功率密度增益的毛细管X光会聚透镜,降低了该共聚焦X射线荧光技术对X射线光源功率的要求,从而保证了该共聚焦技术可以采用实验室普通X射线光源,降低了实验成本。实验表明,毛细管X光透镜共聚焦微束X射线荧光技术在单根头发元素分布检测中具有应用价值。

毛细管X光透镜共聚焦技术在测厚中的应用

为了实现对薄膜和镀层材料厚度的微区无损分析,利用多毛细管X光会聚透镜和多毛细管X光平行束透镜设计并搭建了普通实验室X射线光源的共聚焦微束X射线荧光测厚仪,对该共聚焦测厚仪的性能进行了系统表征。利用该测厚仪测定了厚度约为25μm的Ni独立薄膜样品和压于硅基表面厚度约为15μm的Ni薄膜样品厚度,对应它们的相对测量误差分别为3.7%和6.7%。另外,还对厚度约为10μm Ni薄膜样品的厚度均匀性进行了测量。该共聚焦测厚仪可以对样品进行微区深度分析,并且具有元素分辨能力,从而使得该谱仪可以测量多层膜样品不同层的膜厚,在薄膜和镀层厚度表征领域具有潜在的应用。

X光透镜在同轴X光位相成像中的应用

介绍了同轴X光位相成像的基本原理,说明了位相成像与普通吸收成像的区别;初步研究了X光透镜在位相衬度成像中的应用,利用整体会聚X光透镜将大焦斑光源汇聚为微焦斑,从而使出射的X光满足位相衬度成像所需的空间相干条件,得到了较好的实验结果,为进一步研究X光透镜在该领域的应用打下了基础.

掠出射微区X射线荧光分析系统的建立及其在薄膜分析中的应用

建立了应用导管X光透镜的掠出射微区X射线荧光分析系统,并将该系统应用于纳米薄膜的分析。为了提高入射X射线的强度并提高系统的空间分辨率,选用焦斑为41.7μm的会聚透镜对原级X射线进行会聚,并在探测器前加上50μm的狭缝以提高掠出射角扫描的角度分辨率。为了提高工作效率,编写了该系统的自动控制软件,实现了样品的自动扫描。利用该系统对采用金属蒸汽真空电弧(MEVVA)源离子束和薄膜沉积技术制备的纳米薄膜进行了掠入射X射线荧光和二维扫描分析。实验结果表明:该系统能有效地分析纳米厚度的薄膜,通过对薄膜进行掠出射角扫描分析和表面的二维扫描分析,得到了薄膜的厚度,密度及均匀性等信息。微区分析的空间分辨率可达到41.7μm,实际空间分辨率为扫描步长50μm。系统可用于分析薄膜样品,且荧光强度高,所需时间短,获得的信息全面丰富,数据可靠。

一种基于方形多毛细管透镜的X射线探测系统设计

设计了一种基于方形多毛细管X射线透镜的X射线探测系统,该系统具有较小的X射线收集角。方形多毛细管X射线透镜是一种基于X射线全反射的X射线调控器件,可将大面积范围内的X射线汇聚至X射线CCD探测器。通过测定X射线在方形多毛细管X射线透镜中的传输特性、建立数据模型,可校正X射线CCD所测数据并还原透镜入口端的入射X射线信息。通过光线轨迹追踪方法模拟了方形多毛细管X射线透镜的传输特性。结果表明,该系统适合探测能量低于21.5 ke V的X射线,用于大面积成像;也适合探测能量低于14.6 ke V的X射线,用于提高探测效率。该系统不仅可用于诸如X射线脉冲星导航等特殊应用,也可用于常规X射线探测。

整体X光透镜对点源、面源、线源的传输效率的计算

系统阐述了如何由有限大小面源测得的透镜传输效率计算点源的传输效率 ,并进而由点源的传输效率计算各种规格面源和线源的传输效率 .