期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
A single lithium-ion battery protection circuit with high reliability and low power consumption
1
作者 江金光 李森 《Journal of Semiconductors》 EI CAS CSCD 2014年第11期154-160,共7页
A single lithium-ion battery protection circuit with high reliability and low power consumption is proposed. The protection circuit has high reliability because the voltage and current of the battery are controlled in... A single lithium-ion battery protection circuit with high reliability and low power consumption is proposed. The protection circuit has high reliability because the voltage and current of the battery are controlled in a safe range. The protection circuit can immediately activate a protective function when the voltage and current of the battery are beyond the safe range. In order to reduce the circuit's power consumption, a sleep state control circuit is developed. Additionally, the output frequency of the ring oscillation can be adjusted continuously and precisely by the charging capacitors and the constant-current source. The proposed protection circuit is fabricated in a 0.5 μm mixed-signal CMOS process. The measured reference voltage is 1.19 V, the overvoltage is 4.2 V and the undervoltage is 2.2 V. The total power is about 9 μW. 展开更多
关键词 lithium-ion battery: OV UV reference voltage: overcurrent (OCk short circuit (SC)
原文传递
A fully on-chip fast-transient NMOS low dropout voltage regulator with quasi floating gate pass element 被引量:2
2
作者 Han Wang Chao Gou Kai Luo 《Journal of Semiconductors》 EI CAS CSCD 2017年第4期88-93,共6页
This paper presents a fully on-chip NMOS low-dropout regulator(LDO) for portable applications with quasi floating gate pass element and fast transient response.The quasi floating gate structure makes the gate of the... This paper presents a fully on-chip NMOS low-dropout regulator(LDO) for portable applications with quasi floating gate pass element and fast transient response.The quasi floating gate structure makes the gate of the NMOS transistor only periodically charged or refreshed by the charge pump,which allows the charge pump to be a small economical circuit with small silicon area.In addition,a variable reference circuit is introduced enlarging the dynamic range of error amplifier during load transient.The proposed LDO has been implemented in a 0.35 μm BCD process.From experimental results,the regulator can operate with a minimum dropout voltage of 250 mV at a maximum 1 A load and Iq of 395 μA.Under full-range load current step,the voltage undershoot and overshoot of the proposed LDO are reduced to 50 and 26 mV,respectively. 展开更多
关键词 quasi floating gate variable reference circuit transient response low-dropout regulator(LDO)
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部