Single event upsets(SEUs) induced by heavy ions were observed in 65 nm SRAMs to quantitatively evaluate the applicability and effectiveness of single-bit error correcting code(ECC) utilizing Hamming Code.The results s...Single event upsets(SEUs) induced by heavy ions were observed in 65 nm SRAMs to quantitatively evaluate the applicability and effectiveness of single-bit error correcting code(ECC) utilizing Hamming Code.The results show that the ECC did improve the performance dramatically,with the SEU cross sections of SRAMs with ECC being at the order of 10^(-11) cm^2/bit,two orders of magnitude higher than that without ECC(at the order of 10^(-9) cm^2/bit).Also,ineffectiveness of ECC module,including 1-,2- and 3-bits errors in single word(not Multiple Bit Upsets),was detected.The ECC modules in SRAMs utilizing(12,8) Hamming code would lose work when 2-bits upset accumulates in one codeword.Finally,the probabilities of failure modes involving 1-,2- and 3-bits errors,were calcaulated at 39.39%,37.88%and 22.73%,respectively,which agree well with the experimental results.展开更多
Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Si...Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.展开更多
目的建立高效毛细管电泳(HPCE)法研究土鳖虫Eupolyphaga seu Steleophaga镇痛作用与其指纹图谱的关系。方法分析采用熔融硅胶毛细管(75μm,30 cm×21 cm);10 mmol/L硼砂(p H=9.7)为缓冲液;进样电压5 k V10 s;分离电压15 k V;检测波...目的建立高效毛细管电泳(HPCE)法研究土鳖虫Eupolyphaga seu Steleophaga镇痛作用与其指纹图谱的关系。方法分析采用熔融硅胶毛细管(75μm,30 cm×21 cm);10 mmol/L硼砂(p H=9.7)为缓冲液;进样电压5 k V10 s;分离电压15 k V;检测波长214 nm。然后,通过醋酸致小鼠扭体实验来探索各组分对镇痛作用的影响。结果土鳖虫指纹图谱中有7个特征峰,其中有2个为尿囊素与氯氮卓。两者的含有量与土鳖虫的镇痛作用成正比关系。结论各批次土鳖虫样品间存在差异,其镇痛作用可用于质量评价。展开更多
基金Supported by the National Natural Science Foundation of China(Nos.11079045 and 11179003)the Important Direction Project of the CAS Knowledge Innovation Program(No.KJCX2-YW-N27)
文摘Single event upsets(SEUs) induced by heavy ions were observed in 65 nm SRAMs to quantitatively evaluate the applicability and effectiveness of single-bit error correcting code(ECC) utilizing Hamming Code.The results show that the ECC did improve the performance dramatically,with the SEU cross sections of SRAMs with ECC being at the order of 10^(-11) cm^2/bit,two orders of magnitude higher than that without ECC(at the order of 10^(-9) cm^2/bit).Also,ineffectiveness of ECC module,including 1-,2- and 3-bits errors in single word(not Multiple Bit Upsets),was detected.The ECC modules in SRAMs utilizing(12,8) Hamming code would lose work when 2-bits upset accumulates in one codeword.Finally,the probabilities of failure modes involving 1-,2- and 3-bits errors,were calcaulated at 39.39%,37.88%and 22.73%,respectively,which agree well with the experimental results.
文摘Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.
文摘目的建立高效毛细管电泳(HPCE)法研究土鳖虫Eupolyphaga seu Steleophaga镇痛作用与其指纹图谱的关系。方法分析采用熔融硅胶毛细管(75μm,30 cm×21 cm);10 mmol/L硼砂(p H=9.7)为缓冲液;进样电压5 k V10 s;分离电压15 k V;检测波长214 nm。然后,通过醋酸致小鼠扭体实验来探索各组分对镇痛作用的影响。结果土鳖虫指纹图谱中有7个特征峰,其中有2个为尿囊素与氯氮卓。两者的含有量与土鳖虫的镇痛作用成正比关系。结论各批次土鳖虫样品间存在差异,其镇痛作用可用于质量评价。
