The authors applied the Secondary Ion Mass Spectrometry (SIMS) technique to the analysis of compositions and structures of vitrinites fusinites, fusinites bitumens and graptolites in the hydrocarbon source rocks with ...The authors applied the Secondary Ion Mass Spectrometry (SIMS) technique to the analysis of compositions and structures of vitrinites fusinites, fusinites bitumens and graptolites in the hydrocarbon source rocks with different maturities dscribed their SIMS spectral characteristics and found that different macerals have differnt spectra which, reflected the compositional and structural differences of macerals. Moreover, the change bod of parameter CH2+/CH3+ can be used for the evaluation of thermal evolution regularity of macerals in the hydrocarbon source rocks The study results show that the SIMS technique is a powerful means for microara analysis of macerals in coals and source rocks. It is certain that the study level of macerals can be raised by detailed study of SIMS results of SIMS results of macerals.展开更多
In this study, thin films were produced by magnetron sputtering NC （nanocrystalline） specimens of titanium saturated in hydrogen and were evaluated by layer-by-layer SIMS （secondary ion mass spectrometry） and Rama...In this study, thin films were produced by magnetron sputtering NC （nanocrystalline） specimens of titanium saturated in hydrogen and were evaluated by layer-by-layer SIMS （secondary ion mass spectrometry） and Raman spectroscopy. Due to magnetron sputtering, the chemical composition of the films was non-homogeneous and was variable among layers. Moreover, in the deposition of specimens saturated with hydrogen, hydrogen diffused throughout the depth of the film; diffusion, however, was restricted to the area near the film-substrate interface, affecting less than 50% of the thickness of the film.展开更多
自Benninghoven。A 提出静态二次离子质谱(Static Secondary Ion Mass Spectrometry或SSIMS)方法以来,它就成为一种极灵敏的表面分析技术。近年来,SSIMS技术在多相催化研究中的应用日益广泛。我们曾成功地用SSIMS表征过MoO_3-NiO-P_2O_5...自Benninghoven。A 提出静态二次离子质谱(Static Secondary Ion Mass Spectrometry或SSIMS)方法以来,它就成为一种极灵敏的表面分析技术。近年来,SSIMS技术在多相催化研究中的应用日益广泛。我们曾成功地用SSIMS表征过MoO_3-NiO-P_2O_5/γ-Al_2O_3催化剂的表面结构层次.本工作中,我们应用SSIMS,并结合XPS对新型催化剂MoO_-CoO/TiO_2-Al_2O_3的表面结构层次和表面状态作了研究.展开更多
介绍了二次离子质谱仪(Secondary Ion Mass Spectrometer,SIMS)的基本原理及其在焦平面红外半导体材料和器件制备工艺中发挥的重要作用。通过对掺砷碲镉汞和CdTe/InSb材料进行SIMS测试,研究了不同离子源和一次束流大小对测试结果的影响...介绍了二次离子质谱仪(Secondary Ion Mass Spectrometer,SIMS)的基本原理及其在焦平面红外半导体材料和器件制备工艺中发挥的重要作用。通过对掺砷碲镉汞和CdTe/InSb材料进行SIMS测试,研究了不同离子源和一次束流大小对测试结果的影响,为后续SIMS分析技术在红外探测器材料的进一步研究奠定了基础。展开更多
文摘The authors applied the Secondary Ion Mass Spectrometry (SIMS) technique to the analysis of compositions and structures of vitrinites fusinites, fusinites bitumens and graptolites in the hydrocarbon source rocks with different maturities dscribed their SIMS spectral characteristics and found that different macerals have differnt spectra which, reflected the compositional and structural differences of macerals. Moreover, the change bod of parameter CH2+/CH3+ can be used for the evaluation of thermal evolution regularity of macerals in the hydrocarbon source rocks The study results show that the SIMS technique is a powerful means for microara analysis of macerals in coals and source rocks. It is certain that the study level of macerals can be raised by detailed study of SIMS results of SIMS results of macerals.
文摘In this study, thin films were produced by magnetron sputtering NC （nanocrystalline） specimens of titanium saturated in hydrogen and were evaluated by layer-by-layer SIMS （secondary ion mass spectrometry） and Raman spectroscopy. Due to magnetron sputtering, the chemical composition of the films was non-homogeneous and was variable among layers. Moreover, in the deposition of specimens saturated with hydrogen, hydrogen diffused throughout the depth of the film; diffusion, however, was restricted to the area near the film-substrate interface, affecting less than 50% of the thickness of the film.
文摘自Benninghoven。A 提出静态二次离子质谱(Static Secondary Ion Mass Spectrometry或SSIMS)方法以来,它就成为一种极灵敏的表面分析技术。近年来,SSIMS技术在多相催化研究中的应用日益广泛。我们曾成功地用SSIMS表征过MoO_3-NiO-P_2O_5/γ-Al_2O_3催化剂的表面结构层次.本工作中,我们应用SSIMS,并结合XPS对新型催化剂MoO_-CoO/TiO_2-Al_2O_3的表面结构层次和表面状态作了研究.
文摘介绍了二次离子质谱仪(Secondary Ion Mass Spectrometer,SIMS)的基本原理及其在焦平面红外半导体材料和器件制备工艺中发挥的重要作用。通过对掺砷碲镉汞和CdTe/InSb材料进行SIMS测试,研究了不同离子源和一次束流大小对测试结果的影响,为后续SIMS分析技术在红外探测器材料的进一步研究奠定了基础。
