A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped...A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks.And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement setup.The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work.Finally,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.展开更多
A semi-empirical detector response function （DRF） model of Si （PIN） detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic （SDA） method. The model for ...A semi-empirical detector response function （DRF） model of Si （PIN） detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic （SDA） method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements＇ characteristic X-ray spectra are obtained by Si （PIN） detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.展开更多
The silicon-based diodes coated with a thin film of neutron reactive materials have been shown to produce excellent neutron detectors. We have fabricated the thin-film-coated single Si-PIN neutron detectors and stacke...The silicon-based diodes coated with a thin film of neutron reactive materials have been shown to produce excellent neutron detectors. We have fabricated the thin-film-coated single Si-PIN neutron detectors and stacked ones coupled in series and parallel in this work. The stacked detectors show the advantage of improving the detection efficiency of neutron detecting, which essentially attributes to the increase of the effective detection area. It is shown that the stacked detector in series has more superior performance than the parallel one. This work provides a feasible method to develop solid-state semiconductor neutron detectors with high neutron detection efficiency and high response speed.展开更多
基金Supported by National Natural Science Foundation of China(Nos.40974065 and 41025015)Scientific and Technological Innovative Team in Sichuan Province(No.2011JTD0013)"863"Program of China(No.2012AA063501)
文摘A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks.And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement setup.The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work.Finally,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.
基金Supported by National Natural Science Foundation of China(40974065, 41025015)Scientific and Technological Innovative Team in Sichuan Province(2011JTD0013)"863" Program of China(2012AA063501)
文摘A semi-empirical detector response function （DRF） model of Si （PIN） detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic （SDA） method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements＇ characteristic X-ray spectra are obtained by Si （PIN） detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.
文摘The silicon-based diodes coated with a thin film of neutron reactive materials have been shown to produce excellent neutron detectors. We have fabricated the thin-film-coated single Si-PIN neutron detectors and stacked ones coupled in series and parallel in this work. The stacked detectors show the advantage of improving the detection efficiency of neutron detecting, which essentially attributes to the increase of the effective detection area. It is shown that the stacked detector in series has more superior performance than the parallel one. This work provides a feasible method to develop solid-state semiconductor neutron detectors with high neutron detection efficiency and high response speed.
