Si-PIN photodetectors having features such as low cost,small size,low weight,low voltage,and low power consumption are widely used as radiation detectors in electronic personal dosimeters(EPDs).The technical parameter...Si-PIN photodetectors having features such as low cost,small size,low weight,low voltage,and low power consumption are widely used as radiation detectors in electronic personal dosimeters(EPDs).The technical parameters of EPDs based on the Si-PIN photodetectors include photon energy response(PER),angular response,inherent error,and dose rate linearity.Among them,PER is a key parameter for evaluation of EPD measurement accuracy.At present,owing to the limitations of volume,power consumption,and EPD cost,the PER is usually corrected by a combination of single-channel counting techniques and filtering material methods.However,the above-mentioned methods have problems such as poor PER and low measurement accuracy.To solve such problems,in this study,a 1024-channel spectrometry system using a Si-PIN photodetector was developed and fullspectrum measurement in the reference radiation fields was conducted for radiation protection.The measurement results using the few-channel spectroscopy dose method showed that the PER could be controlled within±14%and±2%under the conditions of two and three energy intervals,respectively,with different channel numbers.The PER measured at 0°angle of radiation incidence meets the-29%to+67%requirements of IEC 61526:2010.Meanwhile,the channel number and counts-to-dose conversion factors formed in the experiment can be integrated into an EPD.展开更多
A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped...A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks.And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement setup.The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work.Finally,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.展开更多
基金This work was partly supported by the National Key Scientific Instruments to Develop Dedicated Program(Nos.2013YQ090811 and 2016YFF0103800)the National Key Research and Development Program(No.2017YFF0211100).
文摘Si-PIN photodetectors having features such as low cost,small size,low weight,low voltage,and low power consumption are widely used as radiation detectors in electronic personal dosimeters(EPDs).The technical parameters of EPDs based on the Si-PIN photodetectors include photon energy response(PER),angular response,inherent error,and dose rate linearity.Among them,PER is a key parameter for evaluation of EPD measurement accuracy.At present,owing to the limitations of volume,power consumption,and EPD cost,the PER is usually corrected by a combination of single-channel counting techniques and filtering material methods.However,the above-mentioned methods have problems such as poor PER and low measurement accuracy.To solve such problems,in this study,a 1024-channel spectrometry system using a Si-PIN photodetector was developed and fullspectrum measurement in the reference radiation fields was conducted for radiation protection.The measurement results using the few-channel spectroscopy dose method showed that the PER could be controlled within±14%and±2%under the conditions of two and three energy intervals,respectively,with different channel numbers.The PER measured at 0°angle of radiation incidence meets the-29%to+67%requirements of IEC 61526:2010.Meanwhile,the channel number and counts-to-dose conversion factors formed in the experiment can be integrated into an EPD.
基金Supported by National Natural Science Foundation of China(Nos.40974065 and 41025015)Scientific and Technological Innovative Team in Sichuan Province(No.2011JTD0013)"863"Program of China(No.2012AA063501)
文摘A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks.And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement setup.The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work.Finally,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.
