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Microstructures and magnetic properties of [SiO_2/FePt]_5/Ag thin films 被引量:2
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作者 范九萍 许小红 +2 位作者 江凤仙 田宝强 武海顺 《Journal of Central South University of Technology》 EI 2008年第1期11-14,共4页
[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied... [SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO2/FePt]5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO]FePt]5/Ag films are changed into L10 and (111) mixed texture. The variation of the SiO2 nonmagnetic layer thickness in [SiO2/FePt]5/Ag films indicates that SiO2-doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO2 (0.6 nm)/FePt (3 nm)]5/Ag (50 nm) films and highly (001)-oriented films can be obtained in the [SiO2 (2 nm)/FePt (3 nm)]5/Ag (50 nm) films. 展开更多
关键词 [sio2/FePt]5 multilayer films sio2-doping Ag underlayer (001) orientation
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Laser-induced damage threshold in HfO_2/SiO_2 multilayer films irradiated by β-ray 被引量:1
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作者 Mei-Hua Fang Peng-Yu Tian +4 位作者 Mao-Dong Zhu Hong-Ji Qi Tao Fei Jin-Peng Lv Hui-Ping Liu 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第2期294-298,共5页
Post-processing can effectively improve the resistance to laser damage in multilayer films used in a high power laser system. In this work, HfO_2/SiO_2 multilayer films are prepared by e-beam evaporation and then β-r... Post-processing can effectively improve the resistance to laser damage in multilayer films used in a high power laser system. In this work, HfO_2/SiO_2 multilayer films are prepared by e-beam evaporation and then β-ray irradiation is employed as the post-processing method. The particle irradiation affects the laser induced damage threshold(LIDT),which includes defects, surface roughness, packing density and residual stress. The residual stress that is relaxed during irradiation changes from compressive stress into tensile stress. Our results indicate that appropriate tensile stress can improve LIDT remarkably. In view of the fact that LIDT rises from 8 J/cm^2 to 12 J/cm^2, i.e., 50% increase, after the film has been irradiated by 2.2×10^(13)/cm^2 β-ray, the particle irradiation can be used as a controllable and desirable postprocessing method to improve the resistance to laser induced damage. 展开更多
关键词 Β-RAY IRRADIATION HFO2/sio2 multilayer film residual stress LASER-INDUCED damage threshold
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Optical and Magnetic Properties of Fe_2O_3/SiO_2 Nano-composite Films 被引量:1
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作者 关飞飞 姚兰芳 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2010年第2期206-209,共4页
Fe2O3/SiO2 nano-composite films were prepared by sol-gel technique combining heat treatment in the range of 100-900 ℃. The particle size was observed by FE-SEM. Optical properties of the films were investigated by UV... Fe2O3/SiO2 nano-composite films were prepared by sol-gel technique combining heat treatment in the range of 100-900 ℃. The particle size was observed by FE-SEM. Optical properties of the films were investigated by UV-visible spectra. Structural and magnetic characteristics were investigated through FT-IR and VSM. The transparency of the Fe2O3/SiO2 nano-composite films decreased with the content of the Fe2O3. Water and organic solvent in the films were evaporated with heat treatment, so the transparency of the films was enhanced under high temperature. It is also found that the saturation magnetization (Ms) of the films increases with the temperature. As the content of the Fe2O3 increases, when the content of the Fe2O3 is around 30wt%, the Ms of the films has a maximum value. 展开更多
关键词 sol-gel technique Fe2O3/sio2 nano-composite films MAGNETISM
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The effects of radiation damage on power VDMOS devices with composite SiO_2-Si_3N_4 films 被引量:1
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作者 高博 刘刚 +5 位作者 王立新 韩郑生 宋李梅 张彦飞 腾瑞 吴海舟 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第3期393-398,共6页
Total dose effects and single event effects on radiation-hardened power vertical double-diffusion metal oxide semiconductor(VDMOS) devices with composite SiO2-Si3N4 film gates are investigated.The relationships amon... Total dose effects and single event effects on radiation-hardened power vertical double-diffusion metal oxide semiconductor(VDMOS) devices with composite SiO2-Si3N4 film gates are investigated.The relationships among the important electrical parameters of the samples with different thickness SiO2-Si3N4 films,such as threshold voltage,breakdown voltage,and on-state resistance in accumulated dose,are discussed.The total dose experiment results show that the breakdown voltage and the on-state resistance barely change with the accumulated dose.However,the relationships between the threshold voltages of the samples and the accumulated dose are more complex,and not only positively drift,but also negatively drift.At the end of the total dose experiment,we select the group of samples which have the smaller threshold voltage shift to carry out the single event effect studies.We find that the samples with appropriate thickness ratio SiO2-Si3N4 films have a good radiation-hardening ability.This method may be useful in solving both the SEGR and the total dose problems with the composite SiO2-Si3N4 films. 展开更多
关键词 power VDMOS device total dose effects single event effects composite sio2-Si3N4 films
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Antireflective and Self-cleaning Properties of SiO2/TiO2 Double-Layer Films Prepared by Cost-Effective Sol-Gel Process
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作者 Hui Zhang Duo-wang Fan +1 位作者 Tian-zhi Yu Cheng-long Wang 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2015年第6期-,共4页
关键词 sio2/TiO2 double-layer films ANTIREFLECTIVE SELF-CLEANING Sol-gel process
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Enhanced nonlinear optical absorption of Au/SiO_2 nano-composite thin films
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作者 赵翠华 张波萍 尚鹏鹏 《Chinese Physics B》 SCIE EI CAS CSCD 2009年第12期5539-5543,共5页
Nano metal-particle dispersed glasses are the attractive candidates for nonlinear optical material applications. Au/SiO2 nano-composite thin films with 3 vol% to 65 vol% Au are prepared by inductively coupled plasma s... Nano metal-particle dispersed glasses are the attractive candidates for nonlinear optical material applications. Au/SiO2 nano-composite thin films with 3 vol% to 65 vol% Au are prepared by inductively coupled plasma sputtering. Au particles as perfect spheres with diameters between 10 nm and 30 nm are uniformly dispersed in the SiO2 matrix. Optical absorption peaks due to the surface plasmon resonance of Au particles are observed. The absorption property is enhanced with the increase of Au content, showing a maximum value in the films with 37 vol% Au. The absorption curves of the Au/SiO2 thin films with 3 vol% to 37 vol% Au accord well with the theoretical optical absorption spectra obtained from Mie resonance theory. Increasing Au content over 37 vol% results in the partial connection of Au particles, whereby the intensity of the absorption peak is weakened and ultimately replaced by the optical absorption of the bulk. The band gap decreases with Au content increasing from 3 vol% to 37 vol % but increases as Au content further increases. 展开更多
关键词 Au/sio2 nano-composite film plasma sputtering optical absorption spectra
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Crystallization Process of Superlattice-Like Sb/SiO_2 Thin Films for Phase Change Memory Application
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作者 Xiao-Qin Zhu Rui Zhang +4 位作者 Yi-Feng Hu Tian-Shu Lai Jian-Hao Zhang Hua Zou Zhi-Tang Song 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第5期99-103,共5页
After compositing with SiO_2 layers, it is shown that superlattice-like Sb/SiO_2 thin films have higher crystallization temperature(~240°C), larger crystallization activation energy(6.22 e V), and better data... After compositing with SiO_2 layers, it is shown that superlattice-like Sb/SiO_2 thin films have higher crystallization temperature(~240°C), larger crystallization activation energy(6.22 e V), and better data retention ability(189°C for 10 y). The crystallization of Sb in superlattice-like Sb/SiO_2 thin films is restrained by the multilayer interfaces. The reversible resistance transition can be achieved by an electric pulse as short as 8 ns for the Sb(3 nm)/SiO_2(7 nm)-based phase change memory cell. A lower operation power consumption of 0.09 m W and a good endurance of 3.0 × 10~6 cycles are achieved. In addition, the superlattice-like Sb(3 nm)/SiO_2(7 nm) thin film shows a low thermal conductivity of 0.13 W/(m·K). 展开更多
关键词 Sb Crystallization Process of Superlattice-Like Sb/sio2 Thin films for Phase Change Memory Application sio
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Study of SiO_2 Films Prepared by Electron CyclotronResonant Microwave Plasma
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作者 张劲松 任兆杏 +2 位作者 梁荣庆 隋毅峰 刘卫 《Plasma Science and Technology》 SCIE EI CAS CSCD 2000年第2期199-205,共7页
Microwave electron cyclotron resonance plasma enhanced chemical vapor depositionwas used to grow silicon dioxide films on crystalline silicon substrate for planar optical waveguides.The relationship between plasma par... Microwave electron cyclotron resonance plasma enhanced chemical vapor depositionwas used to grow silicon dioxide films on crystalline silicon substrate for planar optical waveguides.The relationship between plasma parameters and deposition rates was investigated, and the influ-ence of radio frequency substrate bias on properties of SiO2 films was also preliminarily studied.X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, scanning electron mi-croscopy, atomic force microscopy and elllipsometry were used to characterize the deposited films,showing that SiO2 films with good structural and optical properties prepared at low temperaturehave been achieved. They can basically meet the requirements of integrated optical waveguides. 展开更多
关键词 OA OO Study of sio2 films Prepared by Electron CyclotronResonant Microwave Plasma
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Controlling Shell Thickness of PS/SiO_2 Core-Shell Particles and Their Crystallization into 3-D Ordered Thin Film 被引量:1
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作者 武晓峰 陈运法 +1 位作者 魏连启 王奇 《过程工程学报》 CAS CSCD 北大核心 2006年第z2期285-289,共5页
PS/SiO2 particles with core-shell structure were synthesized by coating silica on surface of polystyrene(PS) colloidal particles.The reaction parameters,such as initial tetraethyl orthosilicate(TEOS) concentration,wat... PS/SiO2 particles with core-shell structure were synthesized by coating silica on surface of polystyrene(PS) colloidal particles.The reaction parameters,such as initial tetraethyl orthosilicate(TEOS) concentration,water concentration and reaction temperature,have been investigated to control the thickness of silica shells.The shell thickness was prepositional to the square root of the initial concentration of TEOS and first increased with increasing water concentration,reached a maximum at about 2.0 mol/L and then started decreasing beyond that concentration.It was also found that the shell thickness decreased firstly with the reaction temperature added,then tended to a constant.The so-synthesized PS/SiO2 core-shell particles were directly crystallized into 3-D ordered thin film,then sintered at 570℃ into the ordered macroporous thin film.Compared with the conditional method,the present approach avoids repeatedly filling the precursor in the templetes and save time more. 展开更多
关键词 PS/sio2 CORE-SHELL PARTICLES ORDERED THIN film
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Morphology and Structure of SiO_2 Film Using Thermal Oxidation Process on(111)Silicon Crystals in Dry Oxygen Atmosphere
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作者 TaokaT. 《Rare Metals》 SCIE EI CAS CSCD 1989年第1期32-38,共7页
By means of scanning electron microscope(SEM)and high voltage electron microscope(HVEM)we have observed and analysed morphology and micro-structure of silicon oxide film with different thickness formed on(111)silicon ... By means of scanning electron microscope(SEM)and high voltage electron microscope(HVEM)we have observed and analysed morphology and micro-structure of silicon oxide film with different thickness formed on(111)silicon monocrystal under dry oxygen atmosphere at 1100℃.Compared with their oxidation kinetic curves consisted of three stages,we suggested a mechanism on forming silicon oxide film.According to electron and X-ray diffraction analyses the silicon oxide films consisted of silica with different crystal structure.We also have discussed a stacking fault and a dislocation formed in the Si-Sio_2 interface region simulaneously forming silicon oxide film. 展开更多
关键词 Silicon Crystals in Dry Oxygen Atmosphere Morphology and Structure of sio2 film Using Thermal Oxidation Process on sio
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Fe^(3+)-TiO_2/SiO_2光催化降解罗丹明B的研究 被引量:26
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作者 王建强 辛柏福 +3 位作者 于海涛 任志宇 曲鹏飞 付宏刚 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2003年第6期1093-1096,共4页
以硅胶为载体 ,采用溶胶 -凝胶法制备了不同掺杂量的 Fe3 +-Ti O2 /Si O2 光催化剂 ,并采用 SEM,Raman和 DRS等手段对其进行了分析和表征 .以氙灯为光源 ,通过对可溶性染料罗丹明 B的降解反应 ,考察了 Fe3 +-Ti O2 /Si O2 催化剂的光催... 以硅胶为载体 ,采用溶胶 -凝胶法制备了不同掺杂量的 Fe3 +-Ti O2 /Si O2 光催化剂 ,并采用 SEM,Raman和 DRS等手段对其进行了分析和表征 .以氙灯为光源 ,通过对可溶性染料罗丹明 B的降解反应 ,考察了 Fe3 +-Ti O2 /Si O2 催化剂的光催化活性 ,探讨了光催化反应中溶液 p H值和起始浓度对催化反应的影响 . 展开更多
关键词 光催化降解 罗丹明B 光催化剂 硅胶 载体 二氧化钛 三价铁离子 溶胶-凝胶法 制备 光催化活性 有机污染物 染料
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超亲水TiO_2和TiO_2-SiO_2表面的动态润湿性 被引量:10
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作者 冯文辉 管自生 +3 位作者 蒋峰芝 张金彪 宋延林 江雷 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2003年第4期745-747,共3页
The dynamic wetting of water spreading on TiO 2 and TiO 2 SiO 2 films prepared by sol gel method and subsequently treated by air plasma and UV irradiation was investigated. Water completely spread on TiO 2 surface wit... The dynamic wetting of water spreading on TiO 2 and TiO 2 SiO 2 films prepared by sol gel method and subsequently treated by air plasma and UV irradiation was investigated. Water completely spread on TiO 2 surface within 3 s and its dynamic contact angles can be expressed by a power law θ d= k(t+a) -n with the n value 0.98. Less than 50%(molar fraction) SiO 2 addition can accelerate the dynamic water spreading rate on the TiO 2 SiO 2 films and the optimum molar fraction of SiO 2 amount corresponding to as annealed, air plasma, and UV irradiation treatment process is 15%, 10% and 20%, respectively. 展开更多
关键词 TIO2 sio2 动态润湿性 超亲水表面 二氧化钛 二氧化硅
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热处理对离子束溅射SiO_2薄膜结构特性的影响分析 被引量:12
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作者 季一勤 姜玉刚 +6 位作者 刘华松 王利栓 刘丹丹 姜承慧 羊亚平 樊荣伟 陈德应 《红外与激光工程》 EI CSCD 北大核心 2013年第2期418-422,共5页
采用离子束溅射沉积技术,在熔融石英基底上制备了SiO2薄膜,研究了热处理对离子束溅射SiO2薄膜结构特性的影响。热处理温度对表面粗糙度影响较大,低温热处理可降低表面粗糙度,高温热处理则增大表面粗糙度,选择合适的热处理温度,可以使表... 采用离子束溅射沉积技术,在熔融石英基底上制备了SiO2薄膜,研究了热处理对离子束溅射SiO2薄膜结构特性的影响。热处理温度对表面粗糙度影响较大,低温热处理可降低表面粗糙度,高温热处理则增大表面粗糙度,选择合适的热处理温度,可以使表面粗糙度几乎不变。采用X射线衍射仪(XRD)物相分析方法,分析了热处理对离子束溅射SiO2薄膜的无定形结构特性的影响,当退火温度为550℃,离子束溅射SiO2薄膜的短程有序范围最大、最近邻原子平均距离最小,与熔融石英基底很接近,结构稳定。实验结果表明,采用合适的热处理温度,能大大改善离子束溅射SiO2薄膜的结构特性。 展开更多
关键词 sio2薄膜 热处理 表面粗糙度 XRD 无定形结构
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SiO_2纳米粉掺杂对薄膜光催化剂结构和活性的影响 被引量:6
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作者 陈中颖 余刚 +1 位作者 张彭义 蒋展鹏 《环境科学》 EI CAS CSCD 北大核心 2002年第6期40-44,共5页
针对固定膜光催化剂吸附能力差的缺陷 ,在催化剂的涂覆溶胶中掺杂具有较大比表面积的SiO2 纳米粉制备了一种新的TiO2 薄膜 .通过X射线衍射 (XRD)、扫描电镜 (TEM)和红外光谱 (FTIR)等手段对催化剂进行表征发现 ,催化剂的晶相以锐钛矿为... 针对固定膜光催化剂吸附能力差的缺陷 ,在催化剂的涂覆溶胶中掺杂具有较大比表面积的SiO2 纳米粉制备了一种新的TiO2 薄膜 .通过X射线衍射 (XRD)、扫描电镜 (TEM)和红外光谱 (FTIR)等手段对催化剂进行表征发现 ,催化剂的晶相以锐钛矿为主 ,并含有少量的金红石 ,平均晶粒尺寸为 2 7nm左右 .其中掺杂的SiO2 以十几到几十纳米的无定型团簇形式分散于薄膜中 ,除了能增大薄膜的表面积外 ,对TiO2 的晶体结构和表面基团等性质几乎没有影响 .光催化降解试验表明 ,SiO2 掺杂后薄膜的活性大大改善 ,并受掺杂SiO2 的原始粒径和掺杂量影响很大 .此外 ,该催化剂还具有很好的稳定性 ,在连续 3 0多天的使用中 ,对活性艳红X 3B的去除率一直维持在80 %左右 ,活性未见降低 . 展开更多
关键词 光催化剂 光催化氧化 TIO2薄膜 稳定性 水处理
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TiO_2-SiO_2系统凝胶玻璃薄膜折射率的研究 被引量:7
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作者 樊先平 郝霄鹏 +1 位作者 姚华文 王民权 《功能材料》 EI CAS CSCD 北大核心 2002年第2期215-217,共3页
应用光度法研究了溶胶 凝胶系统组成、热处理温度对TiO2 SiO2 系统凝胶玻璃薄膜折射率的影响规律。随薄膜中TiO2 含量的增加以及热处理温度的升高 ,薄膜的折射率逐渐增大。通过调整TiO2 SiO2 系统的组成及适当的热处理温度 ,可实现Ti... 应用光度法研究了溶胶 凝胶系统组成、热处理温度对TiO2 SiO2 系统凝胶玻璃薄膜折射率的影响规律。随薄膜中TiO2 含量的增加以及热处理温度的升高 ,薄膜的折射率逐渐增大。通过调整TiO2 SiO2 系统的组成及适当的热处理温度 ,可实现TiO2 SiO2 系统薄膜折射率在 1.5~ 2 . 展开更多
关键词 溶胶-凝胶 折射率 TiO2-sio2薄膜 平面光波导
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SiO_2溶胶及其静电自组装薄膜的制备 被引量:6
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作者 许丕池 姜德生 +2 位作者 余海湖 李小甫 李鸿辉 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 北大核心 2004年第2期165-170,共6页
采用HCl催化、NH3 ·H2 O催化、HCl与NH3 ·H2 O分步催化三种途径制备了SiO2 胶体 ,用透射电镜观察了胶体粒子的形貌 .用静电自组装 (ESAM)法制备了聚电解质PDDA与SiO2 胶体粒子的有机 /无机复合光学薄膜 .实验结果表明 ,用HCl... 采用HCl催化、NH3 ·H2 O催化、HCl与NH3 ·H2 O分步催化三种途径制备了SiO2 胶体 ,用透射电镜观察了胶体粒子的形貌 .用静电自组装 (ESAM)法制备了聚电解质PDDA与SiO2 胶体粒子的有机 /无机复合光学薄膜 .实验结果表明 ,用HCl催化制备的SiO2 透明溶胶不适合于用ESAM法制备薄膜 ,用HCl与NH3 ·H2 O分步催化以及用NH3 ·H2 O单独催化制备的SiO2 胶体适合于用ESAM法制备光学薄膜 .薄膜的透射电镜微观察结果表明 ,以HCl与NH3 ·H2 O分步催化的SiO2 胶体制备的PDDA/SiO2 薄膜为连续结构 ,NH3 ·H2 O单独催化的为颗粒堆积 .研究了薄膜透光率与薄膜层数的关系 ,考察了薄膜的机械强度 .结果显示 ,以NH3 ·H2 O单独催化的SiO2 胶体制备的光学薄膜的增透效果较好 。 展开更多
关键词 sio2 溶胶 静电自组装 复合薄膜
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ZrO_2-SiO_2膜的制备和结构研究 被引量:13
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作者 黄永前 郑昌琼 +1 位作者 胡英 张育林 《功能材料》 EI CAS CSCD 北大核心 2000年第2期204-206,共3页
以正硅酸乙酯和氧氯化锆为原料 ,用溶胶 -凝胶法制备了无支撑ZrO2 -SiO2 膜。应用DTA -TG、XRD、SEM和BET等测试技术对无支撑ZrO2 -SiO2 膜的结构、表面形貌和孔径进行了表征 ,结果表明ZrO2 -SiO2 凝胶膜虽在 46 7℃开始出现少量单斜ZrO... 以正硅酸乙酯和氧氯化锆为原料 ,用溶胶 -凝胶法制备了无支撑ZrO2 -SiO2 膜。应用DTA -TG、XRD、SEM和BET等测试技术对无支撑ZrO2 -SiO2 膜的结构、表面形貌和孔径进行了表征 ,结果表明ZrO2 -SiO2 凝胶膜虽在 46 7℃开始出现少量单斜ZrO2 ,但在 5 0 0℃和 12 0 0℃热处理后的主晶相均为四方ZrO2 ,显然SiO2 的存在阻碍了四方相ZrO2 向单斜相ZrO2 转变的过程 ,ZrO2 -SiO2 膜具有比ZrO2 膜更高的热稳定性 ,在95 0℃烧结的无支撑ZrO2 -SiO2 膜孔径稍呈双峰分布 ,其最可几孔径为 3 .3 5nm。 展开更多
关键词 ZrO2-sio2 溶胶-凝胶 制备 结构 热稳定性
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纳米多孔SiO_2薄膜的结构控制与强化 被引量:11
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作者 吴广明 陈炎 +1 位作者 沈军 周斌 《同济大学学报(自然科学版)》 EI CAS CSCD 北大核心 2004年第6期836-840,共5页
报道了采用溶胶 -凝胶技术 ,结合碱 /酸两步催化和氨与水蒸气混合气体热处理技术 ,成功地制备了高孔隙率、耐磨和附着力好的纳米多孔SiO2 薄膜 .使用透射电镜 (TEM )、扫描电镜 (SEM)、原子力显微镜、椭偏仪等方法测量和分析了薄膜的特... 报道了采用溶胶 -凝胶技术 ,结合碱 /酸两步催化和氨与水蒸气混合气体热处理技术 ,成功地制备了高孔隙率、耐磨和附着力好的纳米多孔SiO2 薄膜 .使用透射电镜 (TEM )、扫描电镜 (SEM)、原子力显微镜、椭偏仪等方法测量和分析了薄膜的特性 .实验结果表明 :通过控制实验条件实现了SiO2 纳米结构的人工控制 ,形成的薄膜折射率在 1.18~1.4 1之间连续可调 ;采用碱 /酸两步催化法明显提高了薄膜的力学性能 ,混合气体中的热处理进一步改善了薄膜的力学性能 ;薄膜增强归因于SiO2 展开更多
关键词 溶胶-凝胶技术 SI02 薄膜 纳米多孔结构
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溶胶-凝胶法制备TiO_2-SiO_2复合薄膜的研究 被引量:9
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作者 翟继卫 张良莹 姚熹 《功能材料》 EI CAS CSCD 北大核心 1998年第3期284-286,共3页
采用溶胶-凝胶方法在单晶Si基片上制备了TiO2-SiO2复合薄膜,研究了溶剂、pH值对先体溶液成胶时间的作用,溶液的浓度、甩胶时的旋转速度、涂覆层数以及热处理温度对薄膜厚度、光学性能的影响。薄膜的折射率随温度增大,... 采用溶胶-凝胶方法在单晶Si基片上制备了TiO2-SiO2复合薄膜,研究了溶剂、pH值对先体溶液成胶时间的作用,溶液的浓度、甩胶时的旋转速度、涂覆层数以及热处理温度对薄膜厚度、光学性能的影响。薄膜的折射率随温度增大,其主要贡献来自于薄膜中结构的变化。并测量了薄膜的I-V、C-f特性,由于薄膜中的热击穿效应而使得TiO2含量较高的薄膜2的I-V呈非线性变化。 展开更多
关键词 溶胶-凝胶 薄膜 电学特性 二氧化硅 二氧化钛
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射频磁控溅射沉积SiO_2膜的研究 被引量:5
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作者 刘艳红 郭宝海 马腾才 《大连理工大学学报》 EI CAS CSCD 北大核心 1997年第2期204-207,共4页
研究以射频磁控溅射法在Si衬底上沉积SiO2膜.这一方法避免了高温氧化法对器件性能的损害.在结构和物理性能上对SiO2进行了多方面的测试和分析.结果表明,SiO2膜具有:1)微晶结构,结构致密、表面均匀、无针孔等.2... 研究以射频磁控溅射法在Si衬底上沉积SiO2膜.这一方法避免了高温氧化法对器件性能的损害.在结构和物理性能上对SiO2进行了多方面的测试和分析.结果表明,SiO2膜具有:1)微晶结构,结构致密、表面均匀、无针孔等.2)优良的物理性能,腐蚀速率(在P腐蚀液中)0.20~0.24nm/s,击穿场强2.6×107~4.4×107V/cm.可以得出结论:射频磁控溅射法沉积的SiO2膜与热氧化法沉积的SiO2膜具有相同的物理性质. 展开更多
关键词 沉积 硅器件 二氧化硅 薄膜 射频磁控溅射法
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