Solder balls, which are used in advanced electronics packages such as BGA (Ball Grid Array) and CSP (Chip Scale Package) to substitute the leads and realize the electrical and mechanical connections between substrate ...Solder balls, which are used in advanced electronics packages such as BGA (Ball Grid Array) and CSP (Chip Scale Package) to substitute the leads and realize the electrical and mechanical connections between substrate and chip,have severe specifications in diameter tolerance, roundness and surface quality, and therefore challenge the traditional technologies for fabrication of metallic particles and powders. The present work made a survey of perturbed molten metal jet break-up process, observed the formation and growth of capillary wave of tin-lead melt jet by way of rapid solidification, and on the basis of the above research, successfully obtained tin-lead eutectic and Sn-4.0Ag-0.5Cu lead free solder balls with tight distribution and good sphericity of particles through optimization of processing parameters, forming a solid base for cost effectively producing solder balls.展开更多
Laser and hot air reflow soldering of PBGA solder ball was investigated. Experimental results showed that surface quality and shear strength of solder bump reflowed by laser was superior than the solder bump by hot ai...Laser and hot air reflow soldering of PBGA solder ball was investigated. Experimental results showed that surface quality and shear strength of solder bump reflowed by laser was superior than the solder bump by hot air, and the microstructure within the solder bump reflowed by laser was much finer. Analysis on interfacial reaction showed that eutectic solder reacted with Au/Ni/Cu pad shortly after the solder was melted. Interface of solder bump reflowed by laser consists of a continuous AuSn 4 layer and remnant Au element. Needle like AuSn 4 grew sidewise from interface, and then spread out to the entire interface region. A thin layer of Ni 3Sn 4 intermetallic compound was found at the interface of solder bump reflowed by hot air, and AuSn 4 particles distributed within the whole solder bump randomly. The combination effect of the continuous AuSn 4 layer and finer eutectic microstructure contributes to the higher shear strength of solder bump reflowed by laser.展开更多
A survey of solder ball production processes especially focusing on disturbed molten metal jet breakup process was made. Then the formation of capillary wave on tin melt jet in the way of rapid solidification was stud...A survey of solder ball production processes especially focusing on disturbed molten metal jet breakup process was made. Then the formation of capillary wave on tin melt jet in the way of rapid solidification was studied. A semi-empirical formula, which can be written as λ=C_ vib(σ/ρ) 1/3f -2/3 to predict the relationship between wavelength of capillary wave and frequency of imposed vibration was obtained. Sn-4.0Ag-0.5Cu lead free solder ball was successfully produced with tight distribution and good sphericity. The excited jet breakup process is promising for cost effectively producing solder ball.展开更多
Four process parameters, pad diameter, stencil thickness, ball diameter and stand-off were chosen as four control factors. By using an L25 （5^6 ） orthogonal array the ceramic ball grid array （ CBGA ） solder joints...Four process parameters, pad diameter, stencil thickness, ball diameter and stand-off were chosen as four control factors. By using an L25 （5^6 ） orthogonal array the ceramic ball grid array （ CBGA ） solder joints which have 25 different combinations of process parameters were designed. The numerical models of all the 25 CBGA solder joints were developed using the Sugrace Evolver. Utilizing the sugrace coordinate exported from the 25 CBGA solder joints numerical models, the finite element analysis models were set up and the nonlinear finite element analysis of the CBGA solder joints under thermal cycles were pegrormed by ANSYS. The thermal fatigue life of CBGA solder joint was calculated using Coffin-Manson equation. Based on the calculated thermal fatigue life results, the range analysis and the variance analysis were pegrormed. The results show that the fatigue life of CBGA solder joint is affected by the pad diameter, the stencil thickness, the ball diameter and the stand-off in a descending order, the best combination of process parameters results in the longest fatigue life is 0.07 mm stand-off, 0.125 mm stencil thickness of, 0.85 mm ball diameter and 0. 89 mm pad diameter. With 95% confidence the pad diameter has a significant effect on the reliability of CBGA solder joints whereas the stand-off, the stencil thickness and the ball diameter have little effect on the reliability of CBGA solder joints.展开更多
Nanoindentation test is performed on study the plastic and creep properties of the Sn-Ag-Cu （SAC） lead-free ball grid array （ BGA ） solder joints. The dynamic hardness of two kinds of solder joints decreases with ...Nanoindentation test is performed on study the plastic and creep properties of the Sn-Ag-Cu （SAC） lead-free ball grid array （ BGA ） solder joints. The dynamic hardness of two kinds of solder joints decreases with indentation depth increase. SACO705 BiNi/ Cu exhibits a higher ultimate dynamic hardness and a smaller indentation depth than SAC305/ Cu. Then the strain hardening phenomenon of SAC305/ Cu is more obvious compared to that of SACO705 BiNi/ Cu. The indentation creep of SACO705BiNi/ Cu solder joint is lower than that of SAC305/ Cu solder joint before and after thermal shock. The creep rate sensitive index of SACBiNi/Cu solder joint is lower than that of solder joint. SACO705BiNi/Cu solder joint is superior to SAC305/Cu solder joint in the anti-creep property. The plasticity of SACOTOSBiNi/Cu and SAC305/Cu solder joints are similar. Compared with SAC305 solder, the SACO705 BiNi solder pe^forms higher hardness and solder creep resistance and still maintains a good plasticity.展开更多
文中针对封装结构中焊球模型与基板微通道等模型的跨尺度现象,设计了基于微通道散热技术实现的包含球形栅格阵列(Ball Grid Array,BGA)封装的系统级封装(System in Package,SiP)结构。BGA封装中的焊球尺寸小、数量多,使得封装结构在有...文中针对封装结构中焊球模型与基板微通道等模型的跨尺度现象,设计了基于微通道散热技术实现的包含球形栅格阵列(Ball Grid Array,BGA)封装的系统级封装(System in Package,SiP)结构。BGA封装中的焊球尺寸小、数量多,使得封装结构在有限元建模时的跨尺度问题更为严重。文中生成焊球子结构,并通过算例对焊球子结构建模的准确性进行验证。结果表明:采用子结构方法得到的计算结果不仅与使用常规有限元建模方法得到的结果相差较小,并且还减少了计算时间,为封装结构仿真模型中跨尺度问题提供了方案。展开更多
文摘Solder balls, which are used in advanced electronics packages such as BGA (Ball Grid Array) and CSP (Chip Scale Package) to substitute the leads and realize the electrical and mechanical connections between substrate and chip,have severe specifications in diameter tolerance, roundness and surface quality, and therefore challenge the traditional technologies for fabrication of metallic particles and powders. The present work made a survey of perturbed molten metal jet break-up process, observed the formation and growth of capillary wave of tin-lead melt jet by way of rapid solidification, and on the basis of the above research, successfully obtained tin-lead eutectic and Sn-4.0Ag-0.5Cu lead free solder balls with tight distribution and good sphericity of particles through optimization of processing parameters, forming a solid base for cost effectively producing solder balls.
文摘Laser and hot air reflow soldering of PBGA solder ball was investigated. Experimental results showed that surface quality and shear strength of solder bump reflowed by laser was superior than the solder bump by hot air, and the microstructure within the solder bump reflowed by laser was much finer. Analysis on interfacial reaction showed that eutectic solder reacted with Au/Ni/Cu pad shortly after the solder was melted. Interface of solder bump reflowed by laser consists of a continuous AuSn 4 layer and remnant Au element. Needle like AuSn 4 grew sidewise from interface, and then spread out to the entire interface region. A thin layer of Ni 3Sn 4 intermetallic compound was found at the interface of solder bump reflowed by hot air, and AuSn 4 particles distributed within the whole solder bump randomly. The combination effect of the continuous AuSn 4 layer and finer eutectic microstructure contributes to the higher shear strength of solder bump reflowed by laser.
文摘A survey of solder ball production processes especially focusing on disturbed molten metal jet breakup process was made. Then the formation of capillary wave on tin melt jet in the way of rapid solidification was studied. A semi-empirical formula, which can be written as λ=C_ vib(σ/ρ) 1/3f -2/3 to predict the relationship between wavelength of capillary wave and frequency of imposed vibration was obtained. Sn-4.0Ag-0.5Cu lead free solder ball was successfully produced with tight distribution and good sphericity. The excited jet breakup process is promising for cost effectively producing solder ball.
基金This work was supported by Science Foundation of Guangxi Zhuang Autonomous Region (Contract No. 02336060).
文摘Four process parameters, pad diameter, stencil thickness, ball diameter and stand-off were chosen as four control factors. By using an L25 （5^6 ） orthogonal array the ceramic ball grid array （ CBGA ） solder joints which have 25 different combinations of process parameters were designed. The numerical models of all the 25 CBGA solder joints were developed using the Sugrace Evolver. Utilizing the sugrace coordinate exported from the 25 CBGA solder joints numerical models, the finite element analysis models were set up and the nonlinear finite element analysis of the CBGA solder joints under thermal cycles were pegrormed by ANSYS. The thermal fatigue life of CBGA solder joint was calculated using Coffin-Manson equation. Based on the calculated thermal fatigue life results, the range analysis and the variance analysis were pegrormed. The results show that the fatigue life of CBGA solder joint is affected by the pad diameter, the stencil thickness, the ball diameter and the stand-off in a descending order, the best combination of process parameters results in the longest fatigue life is 0.07 mm stand-off, 0.125 mm stencil thickness of, 0.85 mm ball diameter and 0. 89 mm pad diameter. With 95% confidence the pad diameter has a significant effect on the reliability of CBGA solder joints whereas the stand-off, the stencil thickness and the ball diameter have little effect on the reliability of CBGA solder joints.
基金This work was supported by National Natural Science Foundation of China （ Grant No. 51174069 and 51075107） and Research Special Funds for Technology Creative Talents of Harbin （Grant No. 2013RFQXJ166）.
文摘Nanoindentation test is performed on study the plastic and creep properties of the Sn-Ag-Cu （SAC） lead-free ball grid array （ BGA ） solder joints. The dynamic hardness of two kinds of solder joints decreases with indentation depth increase. SACO705 BiNi/ Cu exhibits a higher ultimate dynamic hardness and a smaller indentation depth than SAC305/ Cu. Then the strain hardening phenomenon of SAC305/ Cu is more obvious compared to that of SACO705 BiNi/ Cu. The indentation creep of SACO705BiNi/ Cu solder joint is lower than that of SAC305/ Cu solder joint before and after thermal shock. The creep rate sensitive index of SACBiNi/Cu solder joint is lower than that of solder joint. SACO705BiNi/Cu solder joint is superior to SAC305/Cu solder joint in the anti-creep property. The plasticity of SACOTOSBiNi/Cu and SAC305/Cu solder joints are similar. Compared with SAC305 solder, the SACO705 BiNi solder pe^forms higher hardness and solder creep resistance and still maintains a good plasticity.
文摘文中针对封装结构中焊球模型与基板微通道等模型的跨尺度现象,设计了基于微通道散热技术实现的包含球形栅格阵列(Ball Grid Array,BGA)封装的系统级封装(System in Package,SiP)结构。BGA封装中的焊球尺寸小、数量多,使得封装结构在有限元建模时的跨尺度问题更为严重。文中生成焊球子结构,并通过算例对焊球子结构建模的准确性进行验证。结果表明:采用子结构方法得到的计算结果不仅与使用常规有限元建模方法得到的结果相差较小,并且还减少了计算时间,为封装结构仿真模型中跨尺度问题提供了方案。
