Effects of Fatigue Characteristics on Static and Dynamic Performance of Eucommia Rubber Isolators

This study aimed to investigate the effect of fatigue characteristics on the static and dynamic performance of Eucommia ulmoides gum isolators, and to explore the performance changes of Eucommia ulmoides gum isolators with different formulations. For this purpose, we used five formulations of Eucommia ulmoides gum isolators and set different fatigue test methods to study the static and dynamic performance changes of Eucommia ulmoides gum isolators with different formulations by changing the amplitude. The experimental results showed that the addition of Eucommia ulmoides gum had an impact on the performance of the isolator, and the number of fatigue cycles would lead to the hardening of the Eucommia ulmoides gum isolator and changes in its static and dynamic performance. In the range of two million vibrations, the performance change of the isolator was significant in the early stage and then tended to be flat, indicating that the impact of fatigue on the performance of the isolator would not continue to persist. It is worth noting that the study found that the addition of 30% Eucommia ulmoides gum had the least impact on the performance of the isolator under fatigue. Therefore, for long-term use of Eucommia ulmoides gum isolators, attention should be paid to their fatigue characteristics to ensure their stability and reliability. Additionally, this study provides a reference for the design and application of Eucommia ulmoides gum isolators. In summary, this study provides important reference value for a deeper understanding of the fatigue characteristics of Eucommia ulmoides gum isolators and for ensuring their stable and reliable performance. .

Static performance model of GaN MESFET based on the interface state

This paper presents a new model to study the static performances of a GaN metal epitaxial-semiconductor field effect transistor（MESFET） based on the metal-semiconductor interface state of the Schottky junction.The I-V performances of MESFET under different channel lengths and different operating systems（pinch-off or not） have been achieved by our model, which strictly depended on the electrical parameters, such as the drain-gate capacity Cgd, the source-gate capacity C;, the transconductance, and the conductance. To determine the accuracy of our model, root-mean-square（RMS） errors were calculated. In the experiment, the experimental data agree with our model. Also, the minimum value of the electrical parameter has been calculated to get the maximum cut-off frequency for the GaN MESFET.

Flexural failure experiment on cracked PC simply supported box girders

Long-term load and flexural failure experiments are carried out on two prestressed concrete(PC) simply supported box girders. In the long-term load experiment, girder-1(G1) is in an elastic state, while girder-2(G2) is in a cracking state. To investigate the influence of cracking on the flexural behaviors of PC simply supported box beams, the experiment results are analyzed from many aspects, such as load–deflection, load–strain, and failure mode. Experiment results show the following: 1) the shrinkage and creep of concrete have considerable influences on the long-term deflection and strain of the two girders; 2) in the flexural failure experiment, the cracks and ultimate loads of the two girders are close. The rigidity degeneration of G2 is significantly faster than that of G1, and thus G2 shows nonlinear characteristics earlier; 3) to prove the validity and rationality of the current code, the cracking load and ultimate load of the two girders are calculated according to the current code.

A 12-bit current steering DAC with 2-dimensional gradient-error tolerant switching scheme

A 12-bit intrinsic accuracy digital-to-analog converter integrated into standard digital 0.18μm CMOS technology is proposed. It is based on a current steering segmented 6＋6 architecture and requires no calibration. By dividing one most significant bit unary source into 16 elements located in 16 separated regions of the array, the linear gradient errors and quadratic errors can be averaged and eliminated effectively. A novel static performance testing method is proposed. The measured differential nonlinearity and integral nonlinearity are 0.42 and 0.39 least significant bit, respectively. For 12-bit resolution, the converter reaches an update rate of 100 MS/s. The chip operates from a single 1.8 V voltage supply, and the core die area is 0.28 mm^2.