ADVANCED FREQUENCY-DIRECTED RUN-LENTH BASED CODING SCHEME ON TEST DATA COMPRESSION FOR SYSTEM-ON-CHIP

Test data compression and test resource partitioning （TRP） are essential to reduce the amount of test data in system-on-chip testing. A novel variable-to-variable-length compression codes is designed as advanced fre- quency-directed run-length （AFDR） codes. Different [rom frequency-directed run-length （FDR） codes, AFDR encodes both 0- and 1-runs and uses the same codes to the equal length runs. It also modifies the codes for 00 and 11 to improve the compression performance. Experimental results for ISCAS 89 benchmark circuits show that AFDR codes achieve higher compression ratio than FDR and other compression codes.

An Efficient Test Data Compression Technique Based on Codes

This paper presents a new test data compression/decompression method for SoC testing,called hybrid run length codes. The method makes a full analysis of the factors which influence test parameters：compression ratio,test application time, and area overhead. To improve the compression ratio, the new method is based on variable-to-variable run length codes,and a novel algorithm is proposed to reorder the test vectors and fill the unspecified bits in the pre-processing step. With a novel on-chip decoder, low test application time and low area overhead are obtained by hybrid run length codes. Finally, an experimental comparison on ISCAS 89 benchmark circuits validates the proposed method

System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code

System-on-a-chips with intellectual property cores need a large volume of data for testing. The large volume of test data requires a large testing time and test data memory. Therefore new techniques are needed to optimize the test data volume, decrease the testing time, and conquer the ATE memory limitation for SOC designs. This paper presents a new compression method of testing for intellectual property core-based system-on-chip. The proposed method is based on new split- data variable length (SDV) codes that are designed using the split-options along with identification bits in a string of test data. This paper analyses the reduction of test data volume, testing time, run time, size of memory required in ATE and improvement of compression ratio. Experimental results for ISCAS 85 and ISCAS 89 Benchmark circuits show that SDV codes outperform other compression methods with the best compression ratio for test data compression. The decompression architecture for SDV codes is also presented for decoding the implementations of compressed bits. The proposed scheme shows that SDV codes are accessible to any of the variations in the input test data stream.

On Test Data Compression Using Selective Don＇t-Care Identification

This paper proposes an effective method for reducing test data volume undermultiple scan chain designs. The proposed method is based on reduction of distinct scan vectorsusing selective don't-care identification. Selective don't-care identification is repeatedlyexecuted under condition that each bit of frequent scan vectors is fixed to binary values (0 or 1).Besides, a code extension technique is adopted for improving compression efficiency with keepingdecompressor circuits simple in the manner that the code length for infrequent scan vectors isdesigned as double of that for frequent ones. The effectiveness of the proposed method is shownthrough experiments for ISCAS'89 and ITC'99 benchmark circuits.

A Novel Variable Shifting Code for Test Compression of SoC

The test vector compression is a key technique to reduce IC test time and cost since the explosion of the test data of system on chip （SoC） in recent years. To reduce the bandwidth requirement between the automatic test equipment （ATE） and the CUT （circuit under test） effectively, a novel VSPTIDR （variable shifting prefix-tail identifier reverse） code for test stimulus data compression is designed. The encoding scheme is defined and analyzed in detail, and the decoder is presented and discussed. While the probability of 0 bits in the test set is greater than 0.92, the compression ratio from VSPTIDR code is better than the frequency-directed run-length （FDR） code, which can be proved by theoretical analysis and experiments. And the on-chip area overhead of VSPTIDR decoder is about 15.75 % less than the FDR decoder.

Improved Data Compression Scheme for Multi-Scan Designs

This paper presents an improved test data compression scheme based on a combination of test data compatibility and dictionary for multi-scan designs to reduce test data volume and thus test cost. The proposed method includes two steps. First a drive bit matrix with less columns is generated by the compatibilities between the columns of the initial scan bit matrix, also the inverse compatibilities and the logic dependencies between the columns of mid bit matrixes. Secondly a dictionary bit matrix with limited rows is constructed, which has the properties that for each row of the drive bit matrix, a compatible row exists or can be generated by XOR operation of multiple rows in the dictionary bit matrix and the total number of rows used to compute all compatible rows is minimal. The rows in the dictionary matrix are encoded to further reduce the number of ATE channels and test data volume. Experimental results for the large ISCAS 89 benchmarks show that the proposed method significantly reduces test data volume for multi-scan designs.

Low Cost Scan Test by Test Correlation Utilization

Scan-based testing methodologies remedy the testability problem of sequential circuits; yet they suffer from prolonged test time and excessive test power due to numerous shift operations. The correlation among test data along with the high density of the unspecified bits in test data enables the utilization of the existing test data in the scan chain for the generation of the subsequent test stimulus, thus reducing both test time and test data volume. We propose a pair of scan approaches in this paper; in the first approach, a test stimulus partially consists of the preceding stimulus, while in the second approach, a test stimulus partially consists of the preceding test response bits. Both proposed scan-based test schemes access only a subset of scan cells for loading the subsequent test stimulus while freezing the remaining scan cells with the preceding test data, thus decreasing scan chain transitions during shift operations. The proposed scan architecture is coupled with test data manipulation techniques which include test stimuli ordering and partitioning algorithms, boosting test time reductions. The experimental results confirm that test time reductions exceeding 97%, and test power reductions exceeding 99% can be achieved by the proposed scan-based testing methodologies on larger ISCAS89 benchmark circuits.

Scan Cell Positioning for Boosting the Compression of Fan-Out Networks

Ensuring a high manufacturing test quality of an integrated electronic circuit mandates the application of a large volume test set. Even if the test data can be fit into the memory of an external tester, the consequent increase in test application time reflects into elevated production costs. Test data compression solutions have been proposed to address the test time and data volume problem by storing and delivering the test data in a compressed format, and subsequently by expanding the data on-chip. In this paper, we propose a scan cell positioning methodology that accompanies a compression technique in order to boost the compression ratio, and squash the test data even further. While we present the application of the proposed approach in conjunction with the fan-out based decompression architecture, this approach can be extended for application along with other compression solutions as well. The experimental results also confirm the compression enhancement of the proposed methodology.