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Synthesis of Aligned ZnO Nanorod Array on Silicon and Sapphire Substrates by Thermal Evaporation Technique 被引量:7
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作者 K.M.K. Srivatsa Deepak Chhikara M. Senthil Kumar 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2011年第8期701-706,共6页
High density ZnO nanorods were grown by thermal evaporation of Zn powder at 700℃ on Si (100) and sapphire (0001) substrates at atmospheric pressure without adding any catalyst. The nanorods were characterizated i... High density ZnO nanorods were grown by thermal evaporation of Zn powder at 700℃ on Si (100) and sapphire (0001) substrates at atmospheric pressure without adding any catalyst. The nanorods were characterizated in terms of their structural and optical properties. The nanorods grown on Si have a diameter of 350-400 nm and a length of 1.2 μm while those on sapphire have a diameter of 600-800 nm and a length of 2.5 μm. During the structural characterization, it is noticed that the rods grow along the (0002) plane with perfect hexagonal facet. The room temperature photoluminescence spectrum showed a strong UV emission peak at 385 nm with a weak green band emission, which confirms that nanorods have good optical properties. It is observed that the oxygen partial pressure plays an important role to control the shape and size of the nanorods in thermal evaporation growth technique. 展开更多
关键词 thermal evaporation technique ZnO nanorods X-ray diffraction PHOTOLUMINESCENCE
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A novel approach to fabricate Zn coating on Mg foam through a modified thermal evaporation technique 被引量:2
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作者 Xingfu Wang Xinfu Wang +2 位作者 Dan Wang Modi Zhao Fusheng Han 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2018年第9期1558-1563,共6页
Zn enriched coatings with distinct microstructures and properties were fabricated on Mg foams by a modified thermal evaporation technique using a tubular resistance furnace. As the temperature and kinetic energy of Zn... Zn enriched coatings with distinct microstructures and properties were fabricated on Mg foams by a modified thermal evaporation technique using a tubular resistance furnace. As the temperature and kinetic energy of Zn vapor varied along the tubular system, a spatial variation of preparation conditions was created and the obtained coatings were found to follow two growth mechanisms: a thermal diffusion pattern in high-temperature zone and the a relatively low-temperature deposition model. AZn-based deposition coating with dense texture and nearly uniform structure was acquired while Mg foam was placed 20 cm far from the evaporation source, where the Zn vapor deposition model dominated the coating growth.Mechanical properties and bio-corrosion behaviors of the samples were investigated. Results showed that the Zn coatings brought dramatic improvements in compression strength, but exhibited differently in biodegradation performance. It was confirmed that the diffusion layer accelerated corrosion of Mg foam due to the galvanic effect, while the Zn-based deposition coating displayed excellent anti-corrosion performance, showing great potential as bone implant materials. This technique provides a novel and convenient approach to tailor the biodegradability of Mg foams for biomedical applications. 展开更多
关键词 BIOMATERIALS Mg foams thermal evaporation technique COATINGS BIODEGRADABILITY
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Structural Morphological and Optical Properties of SnSb_2S_4 Thin Films Grown by Vacuum Evaporation Method
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作者 N.Khedmi M.Ben Rabeh M.Kanzari 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2014年第10期1006-1011,共6页
SnSb2S4 thin films were prepared from powder by thermal evaporation under vacuum of 1.33 × 10^-4 Pa ( 10^-6 Torr) on unheated glass substrates. The effect of thickness on the structural, morphological and optic... SnSb2S4 thin films were prepared from powder by thermal evaporation under vacuum of 1.33 × 10^-4 Pa ( 10^-6 Torr) on unheated glass substrates. The effect of thickness on the structural, morphological and optical properties of SnSb2S4 thin films was investigated. Films thickness measured by interference fringes method varied from 50 to 700 nm. X-ray diffraction analysis revealed that all the SnSb2S4 films were polycrystalline in spite without heating the substrates and the crystallinity was improved with increasing film thickness. The microstructure parameters: crystallite size, strain and dislocation density were calculated. It was observed that the crystallite size increased and the crystal defects decreased with increasing film thickness. In addition, by increasing the film thickness, an enhancement in the surface roughness root-mean-square (RMS) increased from 2.0 to 6.6 nm. The fundamental optical parameters like band gap, absorption and extinction coefficient were calculated in the strong absorption region of transmittance and reflectance spectrum. The optical absorption measurements indicated that the band (Eg) gap of the thin films decreased from 2.10 to 1.65 eV with increasing film thickness. The refractive indexes were evaluated in transparent region in terms of envelope method, which was suggested by Swanepoul. It was observed that the refractive index increased with increasing film thickness. 展开更多
关键词 Ternary system thermal evaporation technique Thin films Thickness Atomic force microscopy (AFM)
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Substrate Temperature-Dependent Physical Properties of Thermally Evaporated Sn4Sb6S13 Thin Films
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作者 A. Harizi M. Ben Rabeh M. Kanzari 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2016年第1期79-88,共10页
In this work, the homogenous thin films of sulfosalt Sn4Sb6S13 were successfully synthesized by the thermal evaporation technique onto coming 7059 glass substrates heated at various temperatures in the range of 30--2... In this work, the homogenous thin films of sulfosalt Sn4Sb6S13 were successfully synthesized by the thermal evaporation technique onto coming 7059 glass substrates heated at various temperatures in the range of 30--200 ℃. The surface morphology and structural characteristics of Sn4Sb6S13 films were analyzed by atomic force microscopy, X-ray diffraction, and energy-dispersive X-ray, respectively. The X-ray diffraction analysis revealed that Sn4Sb6S13 thin films crystallized in monoclinic structure according to a preferential direction (6 11). An improvement in the structural properties by increasing the substrate temperature was observed. The values of some important parameters such as absorption coefficient (x), band gap (Eg), refractive index (n), extinction coefficient (k), and dielectric constant (Eg) of thin film were determined. The absorption coefficient was larger than 105 cm-l in the visible range. The electron transition of Sn4Sb6S13 films was direct allowed with the values that decreased (2-1.69 eV) by increasing substrate temperature from 30 to 200 ℃,The dispersion data obeyed the single oscillator relation of the Wemple-DiDomenico model and Cauchy model. The electrical free carrier susceptibility and the carrier concentration of the effective mass ratio were estimated according to the model of Spitzer and Fan. 展开更多
关键词 Thin film thermal evaporation technique X-ray diffraction Optical parameters
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