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Thermoelastic stresses in SiC single crystals grown by the physical yapor transport method 被引量:1
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作者 Zibing Zhang Jing Lu +1 位作者 Qisheng Chen V. Prasad 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 2006年第1期40-45,共6页
A finite element-based thermoelastic anisotropic stress model for hexagonal silicon carbide polytype is developed for the calculation of thermal stresses in SiC crystals grown by the physical vapor transport method. T... A finite element-based thermoelastic anisotropic stress model for hexagonal silicon carbide polytype is developed for the calculation of thermal stresses in SiC crystals grown by the physical vapor transport method. The composite structure of the growing SiC crystal and graphite lid is considered in the model. The thermal expansion match between the crucible lid and SiC crystal is studied for the first time. The influence of thermal stress on the dislocation density and crystal quality is discussed. 展开更多
关键词 Silicon carbide Physical vapor transport thermal stress Thermoelastic thermal expansion match
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