Karma alloy thin film strain gauges were fabricated on alumina substrates by magnetron sputtering. The electrical properties of strain gauges annealed at different temperatures were then tested. The surface morphology...Karma alloy thin film strain gauges were fabricated on alumina substrates by magnetron sputtering. The electrical properties of strain gauges annealed at different temperatures were then tested. The surface morphology and phase structure of the Karma alloy thin films were analyzed using X-ray diffraction and scanning electron microscopy. The effect of the annealing temperature on the performance of the Karma alloy thin film strain gauge was also investigated. As the annealing temperature increased, it was found that the resistivity of the thin films decreased, whereas the temperature coefficient of resistance (TCR) of the thin films increased. A Karma alloy thin film strain gauge was annealed at 200 °C, thereby obtaining a gauge factor of 1.7 and a corresponding TCR of 64.8 × 10−6 K−1. The prepared Karma alloy thin film strain gauge had a lower TCR than other strain gauges at room temperature. This result can provide a reference for the preparation and application of Karma alloy thin film strain gauges in specific scenarios.展开更多
Varying the film thickness is a precise route to tune the interfacial strain to manipulate the properties of the multiferroic materials.Here,to explore the effects of the interfacial strain on the properties of the mu...Varying the film thickness is a precise route to tune the interfacial strain to manipulate the properties of the multiferroic materials.Here,to explore the effects of the interfacial strain on the properties of the multiferroic BiFeO_3films,we investigated thickness-dependent structural and polarization evolutions of the BiFeO_3 films.The epitaxial growth with an atomic stacking sequence of BiO/TiO_2 at the interface was confirmed by scanning transmission electron microscopy.Combining X-ray diffraction experiments and first-principles calculations,a thickness-dependent structural evolution was observed from a fully strained tetragonality to a partially relaxed one without any structural phase transition or rotated twins.The tetragonality(c/a) of the BiFeO_3 films increases as the film thickness decreases,while the polarization is in contrast with this trend,and the size effect including the depolarization field plays a crucial role in this contradiction in thinner films.These findings offer an alternative strategy to manipulate structural and polarization properties by tuning the interfacial strain in epitaxial multiferroic thin films.展开更多
An easy calibration method was presented for in-situ measurement of displacement in the order of nanometer during micro-tensile test for thin films by using CCD camera as a sensing device. The calibration of the sensi...An easy calibration method was presented for in-situ measurement of displacement in the order of nanometer during micro-tensile test for thin films by using CCD camera as a sensing device. The calibration of the sensing camera in the system is a central element part to measure displacement in the order of nanometer using images taken with the camera. This was accomplished by modeling the optical projection through the camera lens and relative locations between the object and camera in 3D space. A set of known 3D points on a plane where the film is located on is projected to an image plane as input data. These points, known as a calibration points, are then used to estimate the projection parameters of the camera. In the measurement system of the micro-scale by CCD camera, the calibration data acquisition and one-to-one matching steps between the image and 3D planes need precise data extraction procedures and repetitive user's operation to calibrate the measuring devices. The lack of the robust image feature extraction and easy matching prevent the practical use of these methods. A data selection method was proposed to overcome these limitations and offer an easy and convenient calibration of a vision system that has the CCD camera and the 3D reference plane with calibration marks of circular type on the surface of the plane. The method minimizes the user's intervention such as the fine tuning of illumination system and provides an efficient calibration method of the vision system for in-situ axial displacement measurement of the micro-tensile materials.展开更多
Many distinguished properties of epitaxial ferroelectric thin films can be tunable through the misfit strain.The strain tunability of ferroelectric and dielectric properties in epitaxial lead titanate ultrathin films ...Many distinguished properties of epitaxial ferroelectric thin films can be tunable through the misfit strain.The strain tunability of ferroelectric and dielectric properties in epitaxial lead titanate ultrathin films is numerically investigated by using a phase field model,in which the surface effect of polarization is taken into account.The response of polarization to the applied electric field in the thickness direction is examined with different misfit strains at room temperature.It is found that a compressive misfit strain increases the coercive field and the remanent polarization while a tensile misfit strain decreases both of them.The nonlinear dielectric constants of the thin films with tensile misfit strains are much larger than those of the thin films without misfit strains,which are attributed to the existence of the a/c/a/c multiple domains in the thin films under tensile misfit strains.展开更多
SrTiO3 (STO) thin films of different thicknesses were deposited on MgAl2O4 (MAO) substrates to investigate the in-plane strain effect on the soft-mode frequency of the STO films. X-ray reciprocal space mapping (X-RSM)...SrTiO3 (STO) thin films of different thicknesses were deposited on MgAl2O4 (MAO) substrates to investigate the in-plane strain effect on the soft-mode frequency of the STO films. X-ray reciprocal space mapping (X-RSM) results indicate that there was no relaxation of the in-plane lattice strain of the STO films on MAO. Shifts in the soft-mode frequencies with a decrease in the film thickness were observed using terahertz time-domain spectroscopy (THz-TDS). However, despite the larger lattice mismatch between STO and MAO than that between STO and DyScO3 (DSO), the shifts in the soft-mode frequencies of the STO films on MAO were smaller than those on DSO. The results indicate that the soft-mode frequencies of the STO films on MAO are affected by the c-axis (out-of-plane) lengths.展开更多
Stretchable electronics represents a direction of recent development in next-generation semiconductor devices.Such systems have the potential to offer the performance of conventional wafer-based technologies,but they ...Stretchable electronics represents a direction of recent development in next-generation semiconductor devices.Such systems have the potential to offer the performance of conventional wafer-based technologies,but they can be stretched like a rubber band,twisted like a rope, bent over a pencil,and folded like a piece of paper.Isolating the active devices from strains associated with such deformations is an important aspect of design.One strategy involves the shielding of the electronics from deformation of the substrate through insertion of a compliant adhesive layer. This paper establishes a simple,analytical model and validates the results by the finite element method.The results show that a relatively thick,compliant adhesive is effective to reduce the strain in the electronics,as is a relatively short film.展开更多
We present the specific ab-initio calculations that detail the variations of perovskite BaZrO3 caused by in-plane strain. Specifically, the internal relaxation, which was not captured in the widely used biaxial strain...We present the specific ab-initio calculations that detail the variations of perovskite BaZrO3 caused by in-plane strain. Specifically, the internal relaxation, which was not captured in the widely used biaxial strain model, was included in a complementary manner to lattice relaxation. Density functional theory as well as a hybrid functional method based on a plane wave basis set was employed to calculate the lattice structure, elastic constants, electronic properties and optical properties of perovskite BaZrO3. The lattice parameter c exhibited a clear linear dependence on the imposed in-plane strain, but the Poisson＇s ratio caused by internal relaxation was smaller than the elastic deformation, indicating an ＂inelastic＂ or ＂plastic＂ relaxation manner caused by the introduction of internal relaxation. As a result, the related electronic and optical properties of perovskite BaZrO3 were also strongly affected by the in-plane strain, which revealed an effective way to adjust the properties of perovskite BaZrO3 via internal relaxation.展开更多
文摘Karma alloy thin film strain gauges were fabricated on alumina substrates by magnetron sputtering. The electrical properties of strain gauges annealed at different temperatures were then tested. The surface morphology and phase structure of the Karma alloy thin films were analyzed using X-ray diffraction and scanning electron microscopy. The effect of the annealing temperature on the performance of the Karma alloy thin film strain gauge was also investigated. As the annealing temperature increased, it was found that the resistivity of the thin films decreased, whereas the temperature coefficient of resistance (TCR) of the thin films increased. A Karma alloy thin film strain gauge was annealed at 200 °C, thereby obtaining a gauge factor of 1.7 and a corresponding TCR of 64.8 × 10−6 K−1. The prepared Karma alloy thin film strain gauge had a lower TCR than other strain gauges at room temperature. This result can provide a reference for the preparation and application of Karma alloy thin film strain gauges in specific scenarios.
基金supported by the National Basic Research Program of China(Grant Nos.2012CB921403 and 2013CB328706)the National Natural Science Foundation of China(Grant Nos.10904030,11004238,11205235,11134012, 11404380,and 11474349)the Strategic Priority Research Program(B) of the Chinese Academy of Sciences(Grant No. XDB07030200)
文摘Varying the film thickness is a precise route to tune the interfacial strain to manipulate the properties of the multiferroic materials.Here,to explore the effects of the interfacial strain on the properties of the multiferroic BiFeO_3films,we investigated thickness-dependent structural and polarization evolutions of the BiFeO_3 films.The epitaxial growth with an atomic stacking sequence of BiO/TiO_2 at the interface was confirmed by scanning transmission electron microscopy.Combining X-ray diffraction experiments and first-principles calculations,a thickness-dependent structural evolution was observed from a fully strained tetragonality to a partially relaxed one without any structural phase transition or rotated twins.The tetragonality(c/a) of the BiFeO_3 films increases as the film thickness decreases,while the polarization is in contrast with this trend,and the size effect including the depolarization field plays a crucial role in this contradiction in thinner films.These findings offer an alternative strategy to manipulate structural and polarization properties by tuning the interfacial strain in epitaxial multiferroic thin films.
基金supported by a grant (08-K1401-00610) from the Center of Nanoscale Mechatronics and Manufacturingone of the 21st Century Frontier Research Programs which are supported by the Ministry of Education,Science and Technology in Korea,Industry-University Partnership Laboratory Supporting Business"New Professor Support Program from Seoul National University of Technology"
文摘An easy calibration method was presented for in-situ measurement of displacement in the order of nanometer during micro-tensile test for thin films by using CCD camera as a sensing device. The calibration of the sensing camera in the system is a central element part to measure displacement in the order of nanometer using images taken with the camera. This was accomplished by modeling the optical projection through the camera lens and relative locations between the object and camera in 3D space. A set of known 3D points on a plane where the film is located on is projected to an image plane as input data. These points, known as a calibration points, are then used to estimate the projection parameters of the camera. In the measurement system of the micro-scale by CCD camera, the calibration data acquisition and one-to-one matching steps between the image and 3D planes need precise data extraction procedures and repetitive user's operation to calibrate the measuring devices. The lack of the robust image feature extraction and easy matching prevent the practical use of these methods. A data selection method was proposed to overcome these limitations and offer an easy and convenient calibration of a vision system that has the CCD camera and the 3D reference plane with calibration marks of circular type on the surface of the plane. The method minimizes the user's intervention such as the fine tuning of illumination system and provides an efficient calibration method of the vision system for in-situ axial displacement measurement of the micro-tensile materials.
基金the financial support from the National Nature Science Foundation of China (Grants Nos.11002123 and 10832009)Zhejiang Provincial Qianjiang Talent Fund(E9027)Key Innovation Fund(2009R50025)
文摘Many distinguished properties of epitaxial ferroelectric thin films can be tunable through the misfit strain.The strain tunability of ferroelectric and dielectric properties in epitaxial lead titanate ultrathin films is numerically investigated by using a phase field model,in which the surface effect of polarization is taken into account.The response of polarization to the applied electric field in the thickness direction is examined with different misfit strains at room temperature.It is found that a compressive misfit strain increases the coercive field and the remanent polarization while a tensile misfit strain decreases both of them.The nonlinear dielectric constants of the thin films with tensile misfit strains are much larger than those of the thin films without misfit strains,which are attributed to the existence of the a/c/a/c multiple domains in the thin films under tensile misfit strains.
文摘SrTiO3 (STO) thin films of different thicknesses were deposited on MgAl2O4 (MAO) substrates to investigate the in-plane strain effect on the soft-mode frequency of the STO films. X-ray reciprocal space mapping (X-RSM) results indicate that there was no relaxation of the in-plane lattice strain of the STO films on MAO. Shifts in the soft-mode frequencies with a decrease in the film thickness were observed using terahertz time-domain spectroscopy (THz-TDS). However, despite the larger lattice mismatch between STO and MAO than that between STO and DyScO3 (DSO), the shifts in the soft-mode frequencies of the STO films on MAO were smaller than those on DSO. The results indicate that the soft-mode frequencies of the STO films on MAO are affected by the c-axis (out-of-plane) lengths.
基金supported by NSF(DMI-0328162 and ECCS-0824129)the National Natural Science Foundation of China (10820101048)Ministry of Education of China,and the National Basic Research Program of China(2007CB936803).
文摘Stretchable electronics represents a direction of recent development in next-generation semiconductor devices.Such systems have the potential to offer the performance of conventional wafer-based technologies,but they can be stretched like a rubber band,twisted like a rope, bent over a pencil,and folded like a piece of paper.Isolating the active devices from strains associated with such deformations is an important aspect of design.One strategy involves the shielding of the electronics from deformation of the substrate through insertion of a compliant adhesive layer. This paper establishes a simple,analytical model and validates the results by the finite element method.The results show that a relatively thick,compliant adhesive is effective to reduce the strain in the electronics,as is a relatively short film.
基金Funded by the National Natural Science Foundation of China(No.51502179)the Colleges and Universities in Hebei Province Science and Technology Research Project(No.YQ2014033)the Hebei Key Discipline Construction Project(B2012210004 and E2013210038)
文摘We present the specific ab-initio calculations that detail the variations of perovskite BaZrO3 caused by in-plane strain. Specifically, the internal relaxation, which was not captured in the widely used biaxial strain model, was included in a complementary manner to lattice relaxation. Density functional theory as well as a hybrid functional method based on a plane wave basis set was employed to calculate the lattice structure, elastic constants, electronic properties and optical properties of perovskite BaZrO3. The lattice parameter c exhibited a clear linear dependence on the imposed in-plane strain, but the Poisson＇s ratio caused by internal relaxation was smaller than the elastic deformation, indicating an ＂inelastic＂ or ＂plastic＂ relaxation manner caused by the introduction of internal relaxation. As a result, the related electronic and optical properties of perovskite BaZrO3 were also strongly affected by the in-plane strain, which revealed an effective way to adjust the properties of perovskite BaZrO3 via internal relaxation.
