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Estimation of detection threshold in multiple ship target situations with HF ground wave radar
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作者 Li Hongbo Shen Yiying Liu Yongtan 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2007年第4期739-744,共6页
A credible method of calculating the detection threshold is presented for the multiple target situations, which appear frequently in the lower Doppler velocity region during the surveillance of sea with HF ground wave... A credible method of calculating the detection threshold is presented for the multiple target situations, which appear frequently in the lower Doppler velocity region during the surveillance of sea with HF ground wave radar. This method defines a whole-peak-outlier elimination (WPOE) criterion, which is based on in-peak-samples correlation of each target echo spectra, to trim off the target signals and abnormal disturbances with great amplitude from the complex spectra. Therefore, cleaned background noise samples are obtained to improve the accuracy and reliability of noise level estimation. When the background noise is nonhomogeneous, the detection samples are limited and often occupied heavily with outliers. In this case, the problem that the detection threshold is overvalued can be solved. In applications on experimental data, it is verified that this method can reduce the miss alarm rate of signal detection effectively in multiple target situations as well as make the adaptability of the detector better. 展开更多
关键词 HF ground wave radar multiple target detection outlier elimination threshold estimation
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Comparative Methodical Assessment of Established MOSFET Threshold Voltage Extraction Methods at 10-nm Technology Node 被引量:1
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作者 Yashu Swami Sanjeev Rai 《Circuits and Systems》 2016年第13期4248-4279,共33页
Threshold voltage (V<sub>TH</sub>) is the most evocative aspect of MOSFET operation. It is the crucial device constraint to model on-off transition characteristics. Precise V<sub>TH</sub> value... Threshold voltage (V<sub>TH</sub>) is the most evocative aspect of MOSFET operation. It is the crucial device constraint to model on-off transition characteristics. Precise V<sub>TH</sub> value of the device is extracted and evaluated by several estimation techniques. However, these assessed values of V<sub>TH</sub> diverge from the exact values due to various short channel effects (SCEs) and non-idealities present in the device. Numerous prevalent V<sub>TH</sub> extraction methods are discussed. All the results are verified by extensive 2-D TCAD simulation and confirmed through analytical results at 10-nm technology node. Aim of this research paper is to explore and present a comparative study of largely applied threshold extraction methods for bulk driven nano-MOSFETs especially at 10-nm technology node along with various sub 45-nm technology nodes. Application of the threshold extraction methods to implement noise analysis is briefly presented to infer the most appropriate extraction method at nanometer technology nodes. 展开更多
关键词 threshold Voltage Constant Current Source Technique Linear Extrapolation Technique threshold Voltage estimation Techniques Short Channel Effects Drift Diffusion Model Resistive Load Inverter Noise Margin Analysis
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Threshold reweighted Nadaraya-Watson estimation of jump-diffusion models
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作者 Kunyang Song Yuping Song Hanchao Wang 《Probability, Uncertainty and Quantitative Risk》 2022年第1期31-44,共14页
In this paper,we propose a new method to estimate the diffusion function in the jump-diffusion model.First,a threshold reweighted Nadaraya-Watson-type estimator is introduced.Then,we establish asymptotic normality for... In this paper,we propose a new method to estimate the diffusion function in the jump-diffusion model.First,a threshold reweighted Nadaraya-Watson-type estimator is introduced.Then,we establish asymptotic normality for the estimator and conduct Monte Carlo simulations through two examples to verify the better finite-sampling properties.Finally,our estimator is demonstrated through the actual data of the Shanghai Interbank Offered Rate in China. 展开更多
关键词 Jump-diffusion model threshold reweighted Nadaraya-Watson estimation Empirical likelihood
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