The time delay integration charge coupled device(TDI CCD)is the key component in remote sensing systems.The paper analyzes the structure and the working principles of the device according to a customized TDI CCD chip....The time delay integration charge coupled device(TDI CCD)is the key component in remote sensing systems.The paper analyzes the structure and the working principles of the device according to a customized TDI CCD chip.Employing the special clock resources and large-scale phase locked logic(PLL)in field-programmable gate arrays(FPGA),a timing-driven approach is proposed,using which all timing signals including reset gate,horizontal and vertical timing signals,are implemented in one chip.This not only reduces printed circuit board(PCB)space,but also enhances the portability of the system.By studying and calculating CCD parameters thoroughly,load capacity and power consumption,package,etc,are compared between various candidates chips,and detailed comparison results are also listed in table.Experimental results show that clock generator and driving circuit satisfy the requirements of high speed TDI CCD.展开更多
The impact of the parasitic phenomenon on the performance of the analog accumulator in TDI CMOS image sensor is analyzed and resolved. A 128-stage optimized accumulator based on 0.18-μm one-poly four-metal 3.3 V CMOS...The impact of the parasitic phenomenon on the performance of the analog accumulator in TDI CMOS image sensor is analyzed and resolved. A 128-stage optimized accumulator based on 0.18-μm one-poly four-metal 3.3 V CMOS technology is designed and simulated. A charge injection effect from the top plate sampling is em- ployed to compensate the un-eliminated parasitics based on the accumulator with a decoupling switch, and then a calibration circuit is designed to restrain the mismatch and Process, Voltage and Temperature （PVT） variations. The post layout simulation indicates that the improved SNR of the accumulator upgrades from 17.835 to 21.067 dB, while an ideal value is 21.072 dB. In addition, the linearity of the accumulator is 99.62%. The simulation results of two extreme cases and Monte Carlo show that the mismatch and PVT variations are restrained by the calibration circuit. Furthermore, it is promising to design a higher stage accumulator based on the proposed structure.展开更多
基金National High Technology Research and Development Program of China(863 Program)(No.2009AA7010102)
文摘The time delay integration charge coupled device(TDI CCD)is the key component in remote sensing systems.The paper analyzes the structure and the working principles of the device according to a customized TDI CCD chip.Employing the special clock resources and large-scale phase locked logic(PLL)in field-programmable gate arrays(FPGA),a timing-driven approach is proposed,using which all timing signals including reset gate,horizontal and vertical timing signals,are implemented in one chip.This not only reduces printed circuit board(PCB)space,but also enhances the portability of the system.By studying and calculating CCD parameters thoroughly,load capacity and power consumption,package,etc,are compared between various candidates chips,and detailed comparison results are also listed in table.Experimental results show that clock generator and driving circuit satisfy the requirements of high speed TDI CCD.
基金supported by the National Natural Science Foundation of China(Nos.61404090,61434004)
文摘The impact of the parasitic phenomenon on the performance of the analog accumulator in TDI CMOS image sensor is analyzed and resolved. A 128-stage optimized accumulator based on 0.18-μm one-poly four-metal 3.3 V CMOS technology is designed and simulated. A charge injection effect from the top plate sampling is em- ployed to compensate the un-eliminated parasitics based on the accumulator with a decoupling switch, and then a calibration circuit is designed to restrain the mismatch and Process, Voltage and Temperature （PVT） variations. The post layout simulation indicates that the improved SNR of the accumulator upgrades from 17.835 to 21.067 dB, while an ideal value is 21.072 dB. In addition, the linearity of the accumulator is 99.62%. The simulation results of two extreme cases and Monte Carlo show that the mismatch and PVT variations are restrained by the calibration circuit. Furthermore, it is promising to design a higher stage accumulator based on the proposed structure.
