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FOURIER TRANSFORMATION AND SINGULAR INTEGRALS ON SELF-SIMILAR MEASURE
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作者 Wu Baoyi Su Weiyi, Nanjing University, China Department of Mathematics Nanjing University Nanjing 210093 PRC 《Analysis in Theory and Applications》 1998年第4期102-114,共13页
This paper serves two purposes. One is to modify Strichartz's results with respect to the asymptotic averages of the Fourier transform of μ on , self-similar measure defined by Hutchinson. Another purpose is to c... This paper serves two purposes. One is to modify Strichartz's results with respect to the asymptotic averages of the Fourier transform of μ on , self-similar measure defined by Hutchinson. Another purpose is to consider a singular integral operator on μ and show that this op- erator is of type (p,p)(1<p<∞). 展开更多
关键词 SHOW FOURIER transformation AND SINGULAR INTEGRALS ON SELF-SIMILAR MEASURE MATH APPI
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ABOUT THE FOURIER TRANSFORMS OF NON-SMOOTH MEASURES ON HYPERSPHERES
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作者 Sun Limin(Hangzhou University, China) 《Analysis in Theory and Applications》 1995年第1期10-15,共6页
If dμ is the Fourier transform of a smooth measure,dμ on the hypersphere Sn-1(n≥2)the there exists a constant C dependent only on n such that |dμ(y) |≤C(1+ |y |)-(n-1) /2 for all y∈Rn. In this paper, we show tha... If dμ is the Fourier transform of a smooth measure,dμ on the hypersphere Sn-1(n≥2)the there exists a constant C dependent only on n such that |dμ(y) |≤C(1+ |y |)-(n-1) /2 for all y∈Rn. In this paper, we show that the above statement is false for non-smooth measures. And we present the corresponding estimations far the Fourier transforms of certain non-smooth measures on Sn-1. 展开更多
关键词 ABOUT THE FOURIER TRANSFORMS OF NON-SMOOTH measures ON HYPERSPHERES
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Combining Cubic Spline Interpolation and Fast Fourier Transform to Extend Measuring Range of Reflectometry
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作者 Ju Cheng Jian Lu +7 位作者 Hong-Chao Zhang Feng Lei Maryam Sardar Xin-Tian Bian Fen Zuo Zhong-Hua Shen Xiao-Wu Ni Jin Shi 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第5期20-24,共5页
The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the refle... The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the reflectometer.We present a simple method, using cubic spline interpolation to resample the spectrum with a high resolution,to extend the measurable transparent film thickness. A large measuring range up to 385 m in optical thickness is achieved with the commonly used system. The numerical calculation and experimental results demonstrate that using the FFT method combined with cubic spline interpolation resampling in reflectrometry, a simple,easy-to-operate, economic measuring system can be achieved with high measuring accuracy and replicability. 展开更多
关键词 FIGURE FFT Combining Cubic Spline Interpolation and Fast Fourier Transform to Extend Measuring Range of Reflectometry
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Quantum entanglement swapping of two arbitrary biqubit pure states
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作者 ChuanMei Xie YiMin Liu +2 位作者 JianLan Chen XiaoFeng Yin ZhanJun Zhang 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS CSCD 2016年第10期33-41,共9页
In this paper, the issue of swapping quantum entanglements in two arbitrary biqubit pure states via a local bipartite entangledstate projective measure in the middle node is studied in depth, especially with regard to... In this paper, the issue of swapping quantum entanglements in two arbitrary biqubit pure states via a local bipartite entangledstate projective measure in the middle node is studied in depth, especially with regard to quantitative aspects. Attention is mainly focused on the relation between the measure and the final entanglement obtained via swapping. During the study, the entanglement of formation(EoF) is employed as a quantifier to characterize and quantify the entanglements present in all involved states. All concerned EoFs are expressed analytically; thus, the relation between the final entanglement and the measuring state is established.Through concrete analyses, the measure demands for getting a certain amount of a final entanglement are revealed. It is found that a maximally entangled final state can be obtained from any two given initial entangled states via swapping with a certain probability;however, a peculiar measure should be performed. Moreover, some distinct properties are revealed and analyzed. Such a study will be useful in quantum information processes. 展开更多
关键词 entanglement swapping arbitrary biqubit pure state bipartite Von Neumann measurement local unitary transformation
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