Theory and verification of moiréfringes for x-ray three-phase grating interferometer

Dual-phase and three-phase grating x-ray interference is a promising new technique for grating-based x-ray differential phase contrast imaging.Dual-phase grating interferometers have been relatively completely studied and discussed.In this paper,the corresponding imaging fringe formula of the three-phase grating interferometer is provided.At the same time,the similarities and differences between the three-phase grating interferometer and the dual-phase grating interferometer are investigated and verified,and that the three-phase grating interferometer can produce large-period moiréfringes without using the analyzing grating is demonstrated experimentally.Finally,a simple method of designing three-phase grating and multi-grating imaging systems from geometric optics based on the thin-lens theory of gratings is presented.These theoretical formulas and experimental results provide optimization tools for designing three-phase grating interferometer systems.

Carrier fringe method of moire interferometry for tiny strain measurements in micro-field

In this paper, we demonstrate a new optical method for tiny strain measurements based on the principle of carrier fringes of moire interferometry. A cross-line grating with frequency of 1200 lp/mm is replicated on the specimen surface, and the strain can be deduced from the changes in carrier fringes before and after the deformation of an object. Four coherent laser beams are used to obtain the carrier fringe patterns of field U and V. Both theoretical analysis and numerical simulation indicate that the ideal accuracy of strain can be controlled within a range of ±1με. Case study of a plane extension experiment shows that the measurement accuracy of strain can be controlled within the range of ±10με. The average strain values of every row of field U and every column of field V can be obtained by using this method, and approximated strain of every pixel in the whole-field can be further acquired, and thus it is possible to measure tiny strains occurred in a micro-field. The technology in this paper can provide comprehensive information for analyzing related mechanical content in the field of MEMS.

Optical/Digital Fringe Multiplication in Projection Moire

In this paper, the optical/digital fringe multiplication (O/DFM) is realized in projection moiré using digital image processing (DIP). Both deformed grating and reference grating are captured using a CCD camera. The reference grating can also be produced using DIP. With the O/DFM, the pattern is multiplied with an image processing software, which is developed using MATLAB 6.5. Also with DIP, the phase shifting can become much simpler, and the automation can be adopted. The multiplied pattern is much thinner and easier to read, and sensitivity of measurement can be enhanced.

计算机模拟Moire条纹现象

利用计算机图像技术产生周期性条纹方法模拟光栅叠加实现Moire条纹现象.考察Moire条纹的空间放大作用,研究一块光栅相对另一块平移时产生的Moire条纹移动过程,计算Moire条纹在平移过程中探测器的输出变化关系.

用Moire条纹偏转技术测量金属杆的线膨胀系数

推导用 Moire 条纹偏转技术测量金属杆的线膨胀系数的计算公式,并且作了实验。和手册中的数据作了比较,证明了这种方法是可行的,且测量精度也是满意的。

Fourier方法分析Moire条纹

该文用Fourier光学方法分析了分离一定距离的2个Ronchi光栅产生的Moire条纹。在第二块光栅后面直接观察,所得Moire条纹实质上为多光束干涉条纹。在第二块光栅后面加上滤波系统,适当滤波后,Moire条纹成为三光束干涉条纹或双光束干涉条纹。文中对滤波后的Moire条件进行了理论分析,给出了零号频谱滤波和Ⅰ号频谱滤频波下Moire条纹的方程和对比度,得到条纹的方程和对比度与两光栅间距的关系,并给出了与理论相一致的实验结果。

SIMULTANEOUS RECORDING OF FRINGE PATTERNS WITH ONE CAMERA

A novel method to separate and simultaneously record the Moiréinterferometry fringe patterns of three deformation fields with only one CCD camera is developed;details of its operation principle,key points and error analysis are presented.With this technique,the deformation in U,V and W fields can be measured simultaneously,so dynamic test with comprehensive information can be performed.The advantage of this technique over other similar techniques lies in its simplicity,easy implementation and low cost.An application of this technique is given to show its feasibility.Technical problems that may be caused with this technique are also analyzed.

基于Talbot-Moiré效应长焦测焦仪的设计及校准技术研究

为了满足100m^3km特长焦距参量的测试校准需求,采用Talbot-Moiré条纹技术法,设计了一套长焦测焦仪.针对影响仪器测量不确定度的系统参量,分别设计了校准方法,并对仪器测量不确定度评定结果进行了实验比对验证.结果表明,校准后仪器测量不确定度评定为6.4%;校准后的长焦测焦仪测量结果与刀口仪测量结果满足测量不确定度比对公式;对比结果最大为0.64,小于1;长焦测焦仪测量不确定度评定合理.该研究验证了长焦测焦仪系统参量校准方法的可行性.

Moiré条纹密度对条纹图噪声及相位混频的影响

分析了Moiré条纹密度对条纹图噪声及相位混频的影响,提出了一种调整Moiré条纹密度的方法以有效减少条纹图噪声与包裹相位图噪声,并消除条纹过密产生的相位混频。试验测量表明,该方法能够获得可靠的测量结果,具有较好的测量精度。

Three-Dimensional Shape Measuring Method Based on Dual-Frequency Digital Moiré Fringe

A dual-frequency digital Moiré measurement method(DFDM) is proposed for the three-dimensional(3D) shape measurement of an object.The high-and low-frequency fringes are modulated separately along orthogonal direction using different carrier frequencies before being projected onto the measured object.After collecting and demodulating the composite fringe,the digital π phase shift is used to remove the DC component of the demodulated fringes,resulting in high-precision Moiré fringes for calculating the wrapped phase.The unwrapping of the high-frequency wrapped phase is guided by the low-frequency phase to further realistically reconstruct the surface of the measured object.When compared with existing single-shot digital Moiré profilometry,DFDM effectively removes the DC component of the fringe and calculates the phase more accurately.

Research on the Real-Time Phase Jump Process Method for Plasma Electron Density Measurement in HL-2A Tokamak

In the real-time plasma electron density measurement using far infrared （FIR） laser interferometry, the plasma electron density can be calculated by measuring the real time phase difference between the reference signal and the probe signal. A novel Real-time Phase Jump Process （RPJP） method is applied to the HL-2A tokamak. With this method, the phase difference 1 precision is up to 1/3600 fringe （1 fringe is equal to a phase shift of 2π）, and the dynamic measure- ment range is extensible 65536 fringes. The time resolution of the phase difference is 80 ns, while the feedback delay is 180 its.

Comparative research and its significance of deformation measurements by technologies of laser real-time holographic interferome-try and radar differential interferometry

The principles and applications of laser real-time holographic interferometry （LRTHI） and radar differential interferometry （RDI） technologies are described in this paper, respectively. By using LRTHI, we can observe the deformation of samples under pressure in the lab and study the anomaly characteristics relating to different strain fields in different fracture-developing areas; while by using RDI, we can observe the landform and surface deformation. The results of deformation observed before and after the Ms=7.9 Mani earthquake （Tibet） and Ms=6.2 Shangyi-Zhangbei earthquake in China are obtained. It is pointed out that LRTHI and RDi are similar, which study the characteristics of anomalous deformation field by fringe variations for both of them. Therefore, the observation of deformation field in the seismogenic process, especially in the period impending an earthquake by RDI, and the comparative study in the lab by LRTHI are of great significance.

基于全局优化的实时高精度模型重建

三维形貌测量在先进制造、航空航天、生物医学等领域发挥着重要的应用。凭借高精度、全视场、非接触等优点,条纹投影轮廓术是目前使用最广泛的一种光学三维测量手段。为了获得物体全局三维信息,通常需要将待测物置于转台之上,通过不断地扫描和拼接来获得物体的全局信息。然而,传统的扫描和拼接是以离线的方式进行的,导致整个三维模型的重建速度缓慢。现有的实时点云配准方法虽然能够有效提高点云扫描与拼接的速度,但实时点云拼接的精度依然受待测物的运动状态影响。本文针对上述问题进行优化改进,提出一种基于全局优化的实时高精度模型重建方法。首先,介绍了一种由粗配准到精配准的快速点云配准算法并提出了基于点云法向量约束的点云初始化算法,能够提升粗配准过程中点云初始位姿计算的稳定性与精度。其次,在精配准阶段引入了图优化算法以获得全局点云位姿的最优解,进一步提升了全局点云配准的精度。实验结果表明,所提方法相比于现有实时模型重建方法,能够实现更高精度且稳定的全局点云配准。特别地,针对动态场景中由于抖动等因素引起的被测物体速度突变等情况,本方法依然能够鲁棒地完成三维模型重建,全方位模型重建的精度达84μm。

基于反正切法细分的光栅编码器设计

介绍了一种数字处理技术实现对光栅编码器所产生莫尔条纹信号的细分。莫尔信号经过光电转换后输出两路正余弦信号并通过光栅解码电路对其AD(analog to digital)采样,利用正切值消除正余弦信号的非线性误差,根据正余弦信号的正负将一个周期信号分割成8份,通过反正切角度值实现对每一份的细分。最后将此设计应用于单轴转台。实验结果表明,光栅编码器输出的的静态位置精度可以达到0.000 1°,动态位置及速度曲线无跳变,满足使用要求。

A digital moiré fringe method for displacement sensors

In this study, a displacement measurement method based on digital moiré fringe is described and experimentally demonstrated. The method is formed by only one grating with a constant pitch. First, the magnified grating image is received by an imaging array and is sent to a computer. Then, the digital moiré fringes are generated by overlaying the grating image with its mirrored one. Finally, a specifically designed algorithm is used to obtain the fringes' phase difference before and after movement and calculate the displacement. This method has the effects of amplifying displacement and averaging the grating lines error, the same as the traditional moiré technique using two pieces of gratings. At the same time, the proposed system is much easier to assemble and the measurement resolution can be set more flexibly. One displacement measuring system based on this method was built up. Experiment results show that its measurement errors are less than 0.3 μm and less than 0.12 μm at the resolutions of 0.1 μm and 0.03 μm, respectively.

莫尔条纹光电信号正交性偏差的实时补偿

为了提高光电轴角编码器的精度,提出了一种实时补偿莫尔条纹光电信号正交性偏差的方法。利用希尔伯特变换原理,构造了同频光电信号正交性偏差的动态测量算法。根据莫尔条纹光电信号的数学模型,揭示了由正交性偏差引起的细分误差的空间分布特征并建立角度补偿模型。鉴于编码器的实际工作特点,采用同步处理方式,在补偿光电信号的同时动态更新了角度代码补偿查找表;通过细分查找表的切换,实现信号正交性偏差的实时补偿。采用该方法对存在约18°正交性偏差的23位光电编码器进行了补偿处理,结果显示:补偿后的编码器的细分误差峰值由4.79"降低到1.26"。该方法可实际应用于编码器系统,能够提高编码器的细分精度、环境适应性和可靠性。

光测方法在岩石力学实验观测中的应用述评

综述了常用光测方法在岩石力学实验观测中的应用,总结了这些光测方法相对于岩石力学中常用的其他方法的特点。最后在分析岩石力学实验观测新趋势的基础上,指出发展一种以数字散斑相关方法(DSCM)为基础的岩石力学观测系统,将可以满足岩石力学观测中的新的需要。

莫尔条纹正交偏差的智能补偿方法

提出了一种新的编码器莫尔条纹正交偏差的补偿方法及实现方式。通过比较分析,采用相关函数分析法测量各精码周期莫尔条纹的正交偏差,并基于系统自身的粗码信息,构造一种智能采样算法,保证莫尔条纹采样均匀性;在工作中对所有精码周期的莫尔条纹实行数字式实时补偿,并可以通过模式间的切换自适应地更新正交偏差补偿参数,持续地保证补偿的精确性,降低编码器在各种恶劣环境下的误码率。实验结果表明,正交偏差10度以内时,补偿后的信号正交性提高了93%以上,保证了编码器测量精度。

一种新型纳米光栅传感器的理论研究

为了开发结构简单,抗干扰能力强的纳米测量精度光栅传感器,对基于二次莫尔条纹信号的纳米测量精度光栅传感器的测量原理进行了理论分析,通过仿真计算,其测量分辨力可达到5.40×10-10m,测量精度可达到纳米级。此外,对指示光栅和标尺光栅不平行时对二次莫尔条纹信号质量的影响进行了理论分析和仿真计算。

莫尔条纹信号相位误差补偿

为减小莫尔条纹信号不正交时的正切法细分误差,提出了一种可对任意相位滞后误差进行实时补偿的新算法。在分析了相位不正交对细分精度的影响后,通过对信号过零点的准确采样,计算出余弦信号相位滞后的角度值,进而确定了实际的相位计算公式。根据存在相位滞后信号的极性和幅值信息,对完整的短周期信号进行相位分段补偿,并分析了影响算法实现的各个因素。仿真实验表明,本算法可实现对相位滞后误差的实时补偿,有效降低信号相位不正交对细分精度的影响,使细分误差仅为未补偿误差的10%,极大地提高了莫尔条纹信号细分精度和位移检测精度。