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Fast X-ray imaging beamline at SSRF
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作者 Ke Li Hong-Lan Xie +5 位作者 Ya-Nan Fu Fei-Xiang Wang Guo-Hao Du Jian-Feng ji Biao Deng Ti-Qiao Xiao 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2024年第9期68-81,共14页
The fast X-ray imaging beamline(BL16U2)at Shanghai Synchrotron Radiation Facility(SSRF)is a new beamline that provides X-ray micro-imaging capabilities across a wide range of time scales,spanning from 100 ps toμs and... The fast X-ray imaging beamline(BL16U2)at Shanghai Synchrotron Radiation Facility(SSRF)is a new beamline that provides X-ray micro-imaging capabilities across a wide range of time scales,spanning from 100 ps toμs and ms.This beamline has been specifically designed to facilitate the investigation of a wide range of rapid phenomena,such as the deformation and failure of materials subjected to intense dynamic loads.In addition,it enables the study of high-pressure and high-speed fuel spray processes in automotive engines.The light source of this beamline is a cryogenic permanent magnet undulator(CPMU)that is cooled by liquid nitrogen.This CPMU can generate X-ray photons within an energy range of 8.7-30 keV.The beamline offers two modes of operation:monochromatic beam mode with a liquid nitrogen-cooled double-crystal monochromator(DCM)and pink beam mode with the first crystal of the DCM out of the beam path.Four X-ray imaging methods were implemented in BL16U2:single-pulse ultrafast X-ray imaging,microsecond-resolved X-ray dynamic imaging,millisecond-resolved X-ray dynamic micro-CT,and high-resolution quantitative micro-CT.Furthermore,BL16U2 is equipped with various in situ impact loading systems,such as a split Hopkinson bar system,light gas gun,and fuel spray chamber.Following the completion of the final commissioning in 2021 and subsequent trial operations in 2022,the beamline has been officially available to users from 2023. 展开更多
关键词 Multiple time-scale x ray imaging Single-pulse x ray imaging Dynamic 2D imaging Dynamic micro-CT
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Resistive switching behavior and mechanism of HfO_(x) films with large on/off ratio by structure design
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作者 黄香林 王英 +2 位作者 黄慧香 段理 郭婷婷 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第1期660-665,共6页
Different bilayer structures of HfO_(x)/Ti(TiO_(x)) are designed for hafnium-based memory to investigate the switching characteristics. The chemical states in the films and near the interface are characterized by x-ra... Different bilayer structures of HfO_(x)/Ti(TiO_(x)) are designed for hafnium-based memory to investigate the switching characteristics. The chemical states in the films and near the interface are characterized by x-ray photoelectron spectroscopy,and the oxygen vacancies are analyzed. Highly improved on/off ratio(~104) and much uniform switching parameters are observed for bilayer structures compared to single layer HfO_(x) sample, which can be attributed to the modulation of oxygen vacancies at the interface and better control of the growth of filaments. Furthermore, the reliability of the prepared samples is investigated. The carrier conduction behaviors of HfO_(x)-based samples can be attributed to the trapping and de-trapping process of oxygen vacancies and a filamentary model is proposed. In addition, the rupture of filaments during the reset process for the bilayer structures occur at the weak points near the interface by the recovery of oxygen vacancies accompanied by the variation of barrier height. The re-formation of fixed filaments due to the residual filaments as lightning rods results in the better switching performance of the bilayer structure. 展开更多
关键词 HfO_(x)film resistive switching structure design interface modulation
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High-Performance and Large-Area Inverted Perovskite Solar Cells Based on NiO_(x) Films Enabled with A Novel Microstructure-Control Technology
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作者 Guibin Shen Xin Li +7 位作者 Yuqin Zou Hongye Dong Dongping Zhu Yanglin Jiang Xin Ren Ng Fen Lin Peter Müller-Buschbaum Cheng Mu 《Energy & Environmental Materials》 SCIE EI CAS CSCD 2024年第1期153-159,共7页
The improvement in the efficiency of inverted perovskite solar cells(PSCs)is significantly limited by undesirable contact at the NiO_(x)/perovskite interface.In this study,a novel microstructure-control technology is ... The improvement in the efficiency of inverted perovskite solar cells(PSCs)is significantly limited by undesirable contact at the NiO_(x)/perovskite interface.In this study,a novel microstructure-control technology is proposed for fabrication of porous NiO_(x)films using Pluronic P123 as the structure-directing agent and acetylacetone(AcAc)as the coordination agent.The synthesized porous NiO_(x)films enhanced the hole extraction efficiency and reduced recombination defects at the NiO_(x)/perovskite interface.Consequently,without any modification,the power conversion efficiency(PCE)of the PSC with MAPbl_(3)as the absorber layer improved from 16.50%to 19.08%.Moreover,the PCE of the device composed of perovskite Cs0.05(MA_(0.15)FA_(0.85))_(0.95)Pb(I_(0.85)Br_(0.15))_(3)improved from 17.49%to 21.42%.Furthermore,the application of the fabricated porous NiO_(x)on fluorine-doped tin oxide(FTO)substrates enabled the fabrication of large-area PSCs(1.2 cm^(2))with a PCE of 19.63%.This study provides a novel strategy for improving the contact at the NiO_(x)/perovskite interface for the fabrication of high-performance large-area perovskite solar cells. 展开更多
关键词 interfacial contact inverted and large-area perovskite solar cells photovoltaic materials porous NiO_(x)films renewable energy
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Comparison of efficacy of lung ultrasound and chest X-ray in diagnosing pulmonary edema and pleural effusion in ICU patients: A single centre, prospective, observational study
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作者 Kunal Tewari Sumanth Pelluru +5 位作者 Deepak Mishra Nitin Pahuja Akash Ray Mohapatra Jyotsna Sharma Om Bahadur Thapa Manjot Multani 《Open Journal of Anesthesiology》 2024年第3期41-50,共10页
Background and Aims While chest X-ray (CXR) has been a conventional tool in intensive care units (ICUs) to identify lung pathologies, computed tomography (CT) scan remains the gold standard. Use of lung ultrasound (LU... Background and Aims While chest X-ray (CXR) has been a conventional tool in intensive care units (ICUs) to identify lung pathologies, computed tomography (CT) scan remains the gold standard. Use of lung ultrasound (LUS) in resource-rich ICUs is still under investigation. The present study compares the utility of LUS to that of CXR in identifying pulmonary edema and pleural effusion in ICU patients. In addition, consolidation and pneumothorax were analyzed as secondary outcome measures. Material and Methods This is a prospective, single centric, observational study. Patients admitted in ICU were examined for lung pathologies, using LUS by a trained intensivist;and CXR done within 4 hours of each other. The final diagnosis was ascertained by an independent senior radiologist, based on the complete medical chart including clinical findings and the results of thoracic CT, if available. The results were compared and analyzed. Results Sensitivity, specificity and diagnostic accuracy of LUS was 95%, 94.4%, 94.67% for pleural effusion;and 98.33%, 97.78%, 98.00% for pulmonary edema respectively. Corresponding values with CXR were 48.33%, 76.67%, 65.33% for pleural effusion;and 36.67%, 82.22% and 64.00% for pulmonary edema respectively. Sensitivity, specificity and diagnostic accuracy of LUS was 91.30%, 96.85%, 96.00% for consolidation;and 100.00%, 79.02%, 80.00% for pneumothorax respectively. Corresponding values with CXR were 60.87%, 81.10%, 78.00% for consolidation;and 71.3%, 97.20%, 96.00% for pneumothorax respectively. Conclusion LUS has better diagnostic accuracy in diagnosis of pleural effusion and pulmonary edema when compared with CXR and is thus recommended as an effective alternative for diagnosis of these conditions in acute care settings. Our study recommends that a thoracic CT scan can be avoided in most of such cases. 展开更多
关键词 Chest x ray (CxR) CONSOLIDATION Pulmonary edema Pleural effusion Lung ultrasound (LUS) PNEUMOTHORAx
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Investigation of Sprayed Lu2O3 Thin Films Using XPS
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作者 Towhid Adnan Chowdhury 《Advances in Materials Physics and Chemistry》 2023年第11期197-205,共9页
Spray pyrolysis method was used to deposit Lutetium Oxide (Lu<sub>2</sub>O<sub>3</sub>) thin films using lutetium (III) chloride as source material and water as oxidizer. Annealing was carried ... Spray pyrolysis method was used to deposit Lutetium Oxide (Lu<sub>2</sub>O<sub>3</sub>) thin films using lutetium (III) chloride as source material and water as oxidizer. Annealing was carried out in argon atmosphere at 450°C for 60 minutes of the films. To investigate the composition and stoichiometry of sprayed as-deposited and annealed Lu<sub>2</sub>O<sub>3</sub> thin films, depth profile studies using X-ray photoelectron spectroscopy (XPS) was done. Nearly stoichiometric was observed for both annealed and as-deposited films in inner and surface layers. 展开更多
关键词 Lu2O3 Depth Profiling x-ray Photoelectron Spectroscopy Thin films
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XPS Depth Profile Study of Sprayed Ga2O3 Thin Films
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作者 Towhid Adnan Chowdhury 《Engineering(科研)》 2023年第8期459-466,共8页
Ga<sub>2</sub>O<sub>3</sub> thin films were fabricated by spray pyrolysis method using gallium acetylacetonate as source material and water as oxidizer. The films were annealed at 450°C fo... Ga<sub>2</sub>O<sub>3</sub> thin films were fabricated by spray pyrolysis method using gallium acetylacetonate as source material and water as oxidizer. The films were annealed at 450°C for 60 minutes in argon atmosphere. X-ray photoelectron spectroscopy (XPS) depth profile studies were carried out to analyze the stoichiometry and composition of sprayed as-deposited and annealed Ga<sub>2</sub>O<sub>3</sub> thin films. Surface layers and the inner layers of as-deposited and annealed films were found nearly stoichiometric. 展开更多
关键词 Ga2O3 Thin films x-ray Photoelectron Spectroscopy Depth Profiling
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X线片测量肱骨大结节角与肩袖撕裂的相关性研究
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作者 陈一二 柯群 《医疗装备》 2024年第11期10-12,16,共4页
目的 探讨X线片测量肱骨大结节角(GTA)与肩袖撕裂的相关性,为肩袖撕裂的预防、早期诊断和治疗提供依据和指导。方法 回顾性分析2020年1月至2023年12月医院收治的138例因肩部疼痛不适行肩部X线检查患者的病历资料。根据临床诊断结果将发... 目的 探讨X线片测量肱骨大结节角(GTA)与肩袖撕裂的相关性,为肩袖撕裂的预防、早期诊断和治疗提供依据和指导。方法 回顾性分析2020年1月至2023年12月医院收治的138例因肩部疼痛不适行肩部X线检查患者的病历资料。根据临床诊断结果将发生肩袖撕裂的患者纳入试验组(64例),未发生肩袖撕裂的患者纳入对照组(74例)。比较两组GTA的差异;考察GTA预测肩袖撕裂的临界值和预测能力;评价2名放射科医师测量结果的一致性和相关性。结果 试验组GTA大于对照组,差异有统计学意义(P<0.05)。区分试验组与对照组患者的GTA最佳临界值为≥70°,受试者工作特征(ROC)曲线下面积为0.826,灵敏度和特异度分别为0.88和0.81。2名放射科医师测量GTA结果的组内相关系数(ICC)为0.677,Pearson’s相关性系数r=0.547。结论 采用X线片测量GTA对肩袖撕裂具有较好的预测价值和较高的测量一致性,可为肩袖撕裂的预防、早期诊断和治疗提供依据和指导。 展开更多
关键词 肱骨大结节角 肩袖撕裂 x线片 肱骨近端骨形态
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零维金属卤化物(C_(24)H_(2)0P)CuI_(2)的发光性能及X射线成像
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作者 曹思骏 王忆家 +4 位作者 安康 唐孝生 赖俊安 冯鹏 何鹏 《发光学报》 EI CAS CSCD 北大核心 2024年第4期568-578,共11页
闪烁体发光材料广泛地应用于医疗诊断、工业安全和无损检测领域,铜基(Cu(Ⅰ))金属卤化物作为新一代高性能闪烁体发光材料受到了研究者的广泛关注。本文采用简单的反溶剂法制备了一种新型铜基闪烁体材料(C_(24)H_(2)0P)CuI_(2)(C_(24)H_(... 闪烁体发光材料广泛地应用于医疗诊断、工业安全和无损检测领域,铜基(Cu(Ⅰ))金属卤化物作为新一代高性能闪烁体发光材料受到了研究者的广泛关注。本文采用简单的反溶剂法制备了一种新型铜基闪烁体材料(C_(24)H_(2)0P)CuI_(2)(C_(24)H_(20)P=四苯基膦)。(C_(24)H_(2)0P)CuI_(2)在414 nm蓝光激发下显示出黄色宽带发光,与典型硅基光敏传感器的最佳光谱响应范围一致,同时具有45.84%的高光致发光量子产率(Photoluminescence quantum yield,PLQY)和148 nm的大斯托克斯位移。高PLQY和可忽略不计的自吸收使(C_(24)H_(2)0P)CuI_(2)在X射线激发下表现出极佳的闪烁性能,光产额为~21000 photons/MeV,检测限低至0.869μGy/s,远低于射线测试标准5.5μGy/s。此外,(C_(24)H_(2)0P)CuI_(2)表现出极佳的热稳定性,可耐415℃的高温。由于(C_(24)H_(2)0P)CuI_(2)优异的发光性能,可以通过将其与聚二甲基硅氧烷(Polydimethylsiloxane,PDMS)混合制备基于(C_(24)H_(2)0P)CuI_(2)的柔性薄膜用于X射线成像,在射线探测与成像方面具有巨大的潜力。这项工作凸显了杂化铜基碘化物可作为非常理想的X射线闪烁体,具有无毒、成本低、光产率高和热稳定性良好的多重优点,为高性能X射线成像提供了新的可能。 展开更多
关键词 Cu基金属卤化物 闪烁体 柔性薄膜 x射线成像
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X射线自由电子激光与金属钌相互作用双温模型的数值分析
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作者 海雪 张斐斐 +3 位作者 温阿利 殷亚茹 任翠兰 怀平 《核技术》 EI CAS CSCD 北大核心 2024年第7期15-24,共10页
金属钌(Ru)具有优异的力学性能和化学稳定性,同时具有高反射率、较大临界角等优异性能,是自由电子激光装置中光学元件的候选镀层材料之一。本文对X射线自由电子激光(X-ray Free-electron Lasers,XFEL)脉冲与金属钌薄膜相互作用过程进行... 金属钌(Ru)具有优异的力学性能和化学稳定性,同时具有高反射率、较大临界角等优异性能,是自由电子激光装置中光学元件的候选镀层材料之一。本文对X射线自由电子激光(X-ray Free-electron Lasers,XFEL)脉冲与金属钌薄膜相互作用过程进行了模拟,采用数值方法求解双温模型(Two-temperature Model,TTM),得到了电子和晶格温度随时间的演化规律。获得激光的脉冲宽度、能量密度、穿透深度、材料的电声子耦合系数等对激光与金属钌相互作用过程中热效应的影响规律。通过对X射线自由电子激光脉冲与金属相互作用过程的双温模型数值解,可以获得材料中电子和晶格温度随时间的演化规律,并探究光源的参数对其热传输过程的影响。研究发现,金属钌晶格平衡温度与能量密度呈正相关;金属钌电子最高温度随脉冲宽度的增加而降低;金属钌的晶格平衡温度随穿透深度的减小而增加,最终趋于稳定;电子-声子平衡时间与电声子耦合系数呈负相关。本文获得X射线自由电子激光脉冲与金属钌相互作用的相关数据及基本演化规律,有助于进一步理解金属钌在激光辐照作用下材料的热效应演化机制,为自由电子激光装置光学元件薄膜材料的选取及辐照性能分析提供理论依据。 展开更多
关键词 x射线自由电子激光 金属钌薄膜 双温模型 数值分析
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X-ray absorption near the edge structure and x-ray photoelectron spectroscopy studies on pyrite prepared by thermally sulfurizing iron films 被引量:1
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作者 张辉 刘应书 +3 位作者 王宝义 魏龙 奎热西 钱海杰 《Chinese Physics B》 SCIE EI CAS CSCD 2009年第7期2734-2738,共5页
This paper reports how pyrite films were prepared by thermal sulfurization of magnetron sputtered iron films and characterized by X-ray absorption near edge structure spectra and X-ray photoelectron spectroscopy on a ... This paper reports how pyrite films were prepared by thermal sulfurization of magnetron sputtered iron films and characterized by X-ray absorption near edge structure spectra and X-ray photoelectron spectroscopy on a 4B9B beam line at the Beijing Synchrotron Radiation Facility. The band gap of the pyrite agrees well with the optical band gap obtained by a spectrophotometer. The octahedral symmetry of pyrite leads to the splitting of the d orbit into t2g and eg levels. The high spin and low spin states were analysed through the difference of electron exchange interaction and the orbital crystal field. Only when the crystal field splitting is higher than 1.5 eV, the two weak peaks above the white lines can appear, and this was approved by experiments in the present work. 展开更多
关键词 x-ray absorption near the edge structure spectra x-ray photoelectron spectroscopy iron pyrite films solar cells
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X-ray Photoelectron Spectroscopy Studies of Ti_(x)Al_(1-x)N Thin Films Prepared by RF Reactive Magnetron Sputtering 被引量:1
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作者 Rui XIONG Jing SHI 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2005年第4期541-544,共4页
TixAl1-xN films have been prepared by RF reactive magnetron sputtering. X-ray diffraction results showed that TixAl1-xN thin films in this study were hexagonal wurtzite structure with the Ti content up to 0.18. X-ray ... TixAl1-xN films have been prepared by RF reactive magnetron sputtering. X-ray diffraction results showed that TixAl1-xN thin films in this study were hexagonal wurtzite structure with the Ti content up to 0.18. X-ray photoelectron spectrocopy studies provided that the Nls core-electron spectrum of TixAl1-xN thin film brodend with increasing Ti content, and the difference of the chemical shifts for Ti2p3/2 line between TiN and TixAl1-xN th77pj in film was 0.7 eV. 展开更多
关键词 TixAl1-xN films x-ray photoelectron spectroscopy Core-electron spectrum
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Silicon Field Emission Arrays Coated with CN_x Thin Films
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作者 Chen Ming\|an, Li Jin\|chai , Liu Chuan\|sheng, Ma You\|peng, Lu Xian\|feng, Ye Ming\|sheng School of Physics and Technology, Wuhan University, Wuhan 430072, Hubei, China 《Wuhan University Journal of Natural Sciences》 CAS 2003年第03A期825-828,共4页
Arrays of silicon micro\|tips were made by etching the p\|type (1 0 0) silicon wafers which had SiO 2 masks with alkaline solution. The density of the micro\|tips is 2×10 4 cm -2 . The Scanning Elect... Arrays of silicon micro\|tips were made by etching the p\|type (1 0 0) silicon wafers which had SiO 2 masks with alkaline solution. The density of the micro\|tips is 2×10 4 cm -2 . The Scanning Electron Microscope (SEM) photos showed that the tips in these arrays are uniform and orderly. The CN x thin film, with the thickness of 1.27μm was deposited on the silicon micro\|tip arrays by using the middle frequency magnetron sputtering technology. The SEM photos showed that the films on the tips are smoothly without particles. Keeping the sharpness of the tips will benefit the properties of field emission. The X\|ray photoelectron spectrum (XPS) showed that carbon, nitrogen and oxygen are the three major elements in the surfaces of the films. The percents of them are C: 69.5 %, N: 12.6 % and O: 17.9 %. The silicon arrays coated with CN x thin films had shown a good field emission characterization. The emission current intensity reached 3.2 mA/cm 2 at 32.8 V/μm, so it can be put into use. The result showed that the silicon arrays coated with CN x thin films are likely to be good field emission cathode. The preparation and the characterization of the samples were discussed in detail. 展开更多
关键词 field emission CN x thin films silicon micro\|tip arrays
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Characterization of Thin Films by Low Incidence X-Ray Diffraction 被引量:2
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作者 Mirtat Bouroushian Tatjana Kosanovic 《Crystal Structure Theory and Applications》 2012年第3期35-39,共5页
Glancing Angle X-ray Diffraction (GAXRD) is introduced as a direct, non-destructive, surface-sensitive technique for analysis of thin films. The method was applied to polycrystalline thin films (namely, titanium oxide... Glancing Angle X-ray Diffraction (GAXRD) is introduced as a direct, non-destructive, surface-sensitive technique for analysis of thin films. The method was applied to polycrystalline thin films (namely, titanium oxide, zinc selenide, cadmium selenide and combinations thereof) obtained by electrochemical growth, in order to determine the composition of ultra-thin surface layers, to estimate film thickness, and perform depth profiling of multilayered heterostructures. The experimental data are treated on the basis of a simple absorption-diffraction model involving the glancing angle of X-ray incidence. 展开更多
关键词 Glancing Angle x-ray DIFFRACTION Thin films Titanium OxIDES Metal CHALCOGENIDES ELECTRODEPOSITION
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The Characteristics and Dynamic Changes of X Ray Chest Film in 50 Patients with Severe Acute Respiratory Syndrome
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作者 马俊义 李智岗 +2 位作者 赵增毅 孙武装 王颖 《Chinese Journal of Integrated Traditional and Western Medicine》 2003年第4期296-298,共3页
关键词 in The Characteristics and Dynamic Changes of x ray Chest film in 50 Patients with Severe Acute Respiratory Syndrome SARS
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XPS Study of Electroless Deposited Sb2Se3 Thin Films for Solar Cell Absorber Material
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作者 Towhid Adnan Chowdhury 《Energy and Power Engineering》 2023年第11期363-371,共9页
As a thin film solar cell absorber material, antimony selenide (Sb<sub>2</sub>Se<sub>3</sub>) has become a potential candidate recently because of its unique optical and electrical properties a... As a thin film solar cell absorber material, antimony selenide (Sb<sub>2</sub>Se<sub>3</sub>) has become a potential candidate recently because of its unique optical and electrical properties and easy fabrication method. X-ray photoelectron spectroscopy (XPS) was used to determine the stoichiometry and composition of electroless Sb<sub>2</sub>Se<sub>3</sub> thin films using depth profile studies. The surface layers were analyzed nearly stoichiometric. But the abundant amount of antimony makes the inner layer electrically more conductive. 展开更多
关键词 Sb2Se3 ELECTROLESS Depth Profiling Thin film x-ray Photoelectron Spectroscopy
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金属卤化物闪烁体薄膜的X射线成像研究进展
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作者 王鲁凯 林宏健 +5 位作者 吴坤 曹亭亭 李志远 孙炼 张磊磊 王尊刚 《发光学报》 EI CAS CSCD 北大核心 2024年第8期1266-1280,共15页
X射线成像在核辐射安全、无损检测、安全检查、医学诊断等领域有着广泛需求。然而,传统闪烁单晶受限于高成本耗时工艺、有限体积尺寸以及固有脆性,难以实现高效、灵活的X射线成像。相较而言,基于金属卤化物纳米晶/微晶设计的闪烁体薄膜... X射线成像在核辐射安全、无损检测、安全检查、医学诊断等领域有着广泛需求。然而,传统闪烁单晶受限于高成本耗时工艺、有限体积尺寸以及固有脆性,难以实现高效、灵活的X射线成像。相较而言,基于金属卤化物纳米晶/微晶设计的闪烁体薄膜具有简便制备、大面积尺寸、柔性变形、高效发光等显著优点,在X射线成像应用上展现出巨大潜力。本文详细综述了近几年金属卤化物闪烁体薄膜的X射线成像研究进展,首先以是否单独合成金属卤化物纳米晶/微晶为依据,将金属卤化物闪烁体薄膜制备方法概括分为两类:晶体复合成膜法、原位结晶成膜法,对比分析了两类制备方法的优缺点;其次明晰了金属卤化物晶体的发光机理,对改善闪烁体薄膜发光性能做出指导,并据此总结发光效率提升方法;再次归纳了与金属卤化物闪烁体薄膜X射线成像应用相关的各种性能,主要包括空间分辨率、柔韧性、稳定性和自修复性;最后根据研究现状对闪烁体薄膜进行总结与展望。 展开更多
关键词 金属卤化物晶体 闪烁体薄膜 x射线成像 辐射发光 制备方法
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V含量对AlCrTiNbV_(x)N薄膜结构和摩擦学性能影响
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作者 阎红娟 米智丰 +3 位作者 程方赢 司丽娜 豆照良 刘峰斌 《功能材料》 CAS CSCD 北大核心 2024年第10期10064-10070,共7页
为了探究V含量对AlCrTiNbV_(x)N薄膜结构和摩擦学性能的影响,使用磁控溅射仪在304不锈钢基体上制备AlCrTiNbV_(x)N薄膜。使用X射线衍射仪(XRD)、扫描电镜(SEM)等分析薄膜结构,使用纳米压痕仪、材料表面综合测试仪等表征薄膜力学性能和... 为了探究V含量对AlCrTiNbV_(x)N薄膜结构和摩擦学性能的影响,使用磁控溅射仪在304不锈钢基体上制备AlCrTiNbV_(x)N薄膜。使用X射线衍射仪(XRD)、扫描电镜(SEM)等分析薄膜结构,使用纳米压痕仪、材料表面综合测试仪等表征薄膜力学性能和摩擦学性能。结果表明,AlCrTiNbV_(x)N薄膜均呈面心立方结构,在(200)晶面呈择优取向,衍射角向右偏移。AlCrTiNbV_(1.0)N薄膜在(200)晶面的偏移角度最大,晶面间距最小。随着V含量的增加,AlCrTiNbV_(x)N薄膜的硬度和弹性模量先增大后减小,AlCrTiNbV_(x)N的摩擦系数和磨痕宽度先减小后增大。AlCrTiNbV_(1.0)N薄膜具有最大的薄膜硬度和弹性模量,最小的摩擦系数和磨痕宽度,摩擦学性能最好。主要磨损机理为磨粒磨损、粘着磨损和氧化磨损。 展开更多
关键词 AlCrTiNbV_(x)N薄膜 磁控溅射 摩擦学性能 硬度 V含量
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射频磁控溅射制备HfMoNbZrN_(x)薄膜的组织和性能
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作者 谢明强 施杰 +6 位作者 李博海 胡恒宁 汪辉 巫兴胜 张丽 苏齐家 杜昊 《工具技术》 北大核心 2024年第1期3-8,共6页
利用射频磁控溅射技术分别在单面抛光Si(001),Al_(2)O_(3)(0001)和硬质合金(WC-8 wt.%Co)基底表面沉积HfMoNbZrN_(x)薄膜,研究不同氮气流量R_(N)对HfMoNbZrN_(x)薄膜的组织和性能影响。结果表明,HfMoNbZr薄膜倾向于形成非晶态,随着R_(N... 利用射频磁控溅射技术分别在单面抛光Si(001),Al_(2)O_(3)(0001)和硬质合金(WC-8 wt.%Co)基底表面沉积HfMoNbZrN_(x)薄膜,研究不同氮气流量R_(N)对HfMoNbZrN_(x)薄膜的组织和性能影响。结果表明,HfMoNbZr薄膜倾向于形成非晶态,随着R_(N)的增加,HfMoNbZrN高熵合金氮化薄膜转变为面心立方(FCC)结构并且沉积速率下降;当R_(N)=10%时,薄膜硬度和弹性模量最大,分别为21.8GPa±0.88GPa和293.5GPa±9.56GPa;所有薄膜均发生磨粒磨损,相较于多元合金薄膜,氮化物薄膜的磨损率下降了一个数量级,薄膜耐磨性显著提高。 展开更多
关键词 射频磁控溅射 HfMoNbZrN_(x)薄膜 微观结构 硬度 摩擦学
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304不锈钢钝化膜的X射线光电子能谱刻蚀研究
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作者 李晓伟 安胜利 +1 位作者 韩沛 范秀风 《热加工工艺》 北大核心 2024年第4期42-45,共4页
通过X射线衍射仪测试了304不锈钢表面钝化膜物相组成物。通过X射线光电子能谱仪中单原子氩离子和团簇离子枪采用不同的电压及不同时间对304不锈钢表面进行刻蚀;分析了电压及时间对304不锈钢表面元素化合态影响。采用深度剖析法检测了钝... 通过X射线衍射仪测试了304不锈钢表面钝化膜物相组成物。通过X射线光电子能谱仪中单原子氩离子和团簇离子枪采用不同的电压及不同时间对304不锈钢表面进行刻蚀;分析了电压及时间对304不锈钢表面元素化合态影响。采用深度剖析法检测了钝化膜垂直于样品表面纵深元素分布。结果表明:不锈钢钝化膜外层为铁氧化物,内层为铬氧化物,钝化膜厚度约为120 nm。 展开更多
关键词 x射线光电子能谱 单粒子氩离子及团簇离子枪 钝化膜 深度剖析
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Evaluation of multiaxial stress in textured cubic films by x-ray diffraction
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作者 张建民 徐可为 《Chinese Physics B》 SCIE EI CAS CSCD 2005年第9期1866-1872,共7页
X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is... X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the x-ray penetrating region. The stress is calculated from the gradient of ε ~ sin^2 φ linear relation. But the method cannot be used in textured films due to nonlinear relation. In this paper, a novel method is proposed for measuring the multiaxial stresses in cubic films with any [hkl] fibre texture. As an example, a detailed analysis is given for measuring three-dimensional stresses in FCC films with [111] fibre texture. 展开更多
关键词 residual stress x-ray diffraction thin film fibre texture
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