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Genetic Analysis and Molecular Tagging a Novel Yellow Rust Resistance Gene Derived from Synthetic Hexaploid Wheat Germplasm M08
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作者 CHEN Guo-yue LI Li-hui 《Agricultural Sciences in China》 CAS CSCD 2008年第3期266-271,共6页
Yellow rust of wheat (caused by Puccinia striiformis Westend. f. sp. tritici Eriks.) has been periodically epidemic and severely damaged wheat production in China. The development of resistant cultivars could be an ... Yellow rust of wheat (caused by Puccinia striiformis Westend. f. sp. tritici Eriks.) has been periodically epidemic and severely damaged wheat production in China. The development of resistant cultivars could be an effective way to reduce yield losses of wheat caused by yellow rust. Rust reaction tests and genetic analysis indicated that M08, the synthetic hexaploid wheat derived from hybridization between Triticum durum (2n = 6X = 28; genome AABB) and Aegilops tauschii (2n = 2X = 14; genome DD), showed resistance to current prevailing yellow rust races at seedling stage, which was controlled by a single dominant gene, designated as YrAm. Bulked segregant analysis was used to identify microsatellite markers linked to gene YrAm in an F2 population derived from cross M08 (resistant) × Jinan 17 (susceptible). Three microsatellite marker loci Xgwm77, Xgwm285, and Xgwml31 located on chromosome 3B were mapped to the YrAm locus. Xgwml31 was the closest marker locus and showed a linkage distance of 7.8 cM to the resistance locus. Thus, it is assumed that YrAm for resistance to yellow rust may be derived from Triticum durum and is located on the long arm of chromosome 3B. 展开更多
关键词 yellow rust resistance gene chromosomal location microsatellite marker synthetic hexaploid wheat Triticum durum
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