The Electroluminescence thin films of zinc sulfide do ped with erbium, fabricated by thermal evaporation with two boats, are analyzed by the technology of X-ray diffraction (XRD) and X-ray photoelectron spectrosc opy ...The Electroluminescence thin films of zinc sulfide do ped with erbium, fabricated by thermal evaporation with two boats, are analyzed by the technology of X-ray diffraction (XRD) and X-ray photoelectron spectrosc opy (XPS). The relationship between electroluminescence brightness and microst ructure of the thin films is obtained. The analysis results of XRD indicate th at the fabricated zinc sulfide thin films belong to the blende structure and hav e a trend of preferential orientation. The XPS measurements reveal the surface m icrostructure states formed mainly by oxygen absorption and carbon absorption th at effect on the EL excitation and relaxation luminescence process. The maximum photoelectron peak corresponding to the doped erbium is detected at a depth of 1 35nm to 350nm that formed the activation layer in the films. Analysis shows that the high brightness of the film devices is attributed to the crystalline planes of growth orientated in the (311), (400). In explanation of this phenomenon, th e status of the substitute energy for Er 3+ replacing Zn 2+ in the hos t lattice of zinc sulfide is discussed. All results of describing above are referable in researching of the electroluminescence excitation machnism of the t hin film devices and in favor of fabricating the thin film devices with high qua lity.展开更多
Ni0.4Cu0.2Zn0.4Fe2O4 thin films were fabricated on Si substrates by using the sol-gel method and rapid thermal annealing （RTA）, and their magnetic properties and crystalline structures were investigated. The samples...Ni0.4Cu0.2Zn0.4Fe2O4 thin films were fabricated on Si substrates by using the sol-gel method and rapid thermal annealing （RTA）, and their magnetic properties and crystalline structures were investigated. The samples calcined at and above 600 ℃ have a single-phase spinel structure and the average grain size of the sample calcined at 600 ℃ is about 20 nm. The initial permeability μi, saturation magnetization M and coercivity H of the samples increase with the increasing calcination temperature. The sample calcined at 600 ℃ exhibits an excellent soft magnetic performance, which has μi=33.97 （10 MHz）, Hc=15.62 Oe and Ms=228.877 emu/cm^3. Low-temperature annealing can enhance the magnetic properties of the samples. The work shows that using the sol-gel method in conjunction with RTA is a promising way to fabricate integrated thin-film devices.展开更多
Cu-Zn ferrite nano thin films were deposited from a target of Cu-Zn ferrite onto a sapphire substrate using XeCl excimer laser operating 308 nm with an energy of 225 mJ and a frequency of 30 Hz. Films were deposited f...Cu-Zn ferrite nano thin films were deposited from a target of Cu-Zn ferrite onto a sapphire substrate using XeCl excimer laser operating 308 nm with an energy of 225 mJ and a frequency of 30 Hz. Films were deposited from the target onto sapphire (001) substrates heated to 650℃ in an oxygen atmosphere of 100 mTorr. The laser beam was incident On the target face at an angle of 45°. Studies on crystal structure were done by X-ray diffactometry (XRD). The surface texture, cross-section morphology and grain size was observed by JEOL-JSM-6400 scanning electron microscopy, atomic force microscopy (AFM) and magnetic force microscopy (MFM) [Model DI 3000, Digital instruments].展开更多
文摘The Electroluminescence thin films of zinc sulfide do ped with erbium, fabricated by thermal evaporation with two boats, are analyzed by the technology of X-ray diffraction (XRD) and X-ray photoelectron spectrosc opy (XPS). The relationship between electroluminescence brightness and microst ructure of the thin films is obtained. The analysis results of XRD indicate th at the fabricated zinc sulfide thin films belong to the blende structure and hav e a trend of preferential orientation. The XPS measurements reveal the surface m icrostructure states formed mainly by oxygen absorption and carbon absorption th at effect on the EL excitation and relaxation luminescence process. The maximum photoelectron peak corresponding to the doped erbium is detected at a depth of 1 35nm to 350nm that formed the activation layer in the films. Analysis shows that the high brightness of the film devices is attributed to the crystalline planes of growth orientated in the (311), (400). In explanation of this phenomenon, th e status of the substitute energy for Er 3+ replacing Zn 2+ in the hos t lattice of zinc sulfide is discussed. All results of describing above are referable in researching of the electroluminescence excitation machnism of the t hin film devices and in favor of fabricating the thin film devices with high qua lity.
基金the National Natural Science Foundation of China (No. 90607021).
文摘Ni0.4Cu0.2Zn0.4Fe2O4 thin films were fabricated on Si substrates by using the sol-gel method and rapid thermal annealing （RTA）, and their magnetic properties and crystalline structures were investigated. The samples calcined at and above 600 ℃ have a single-phase spinel structure and the average grain size of the sample calcined at 600 ℃ is about 20 nm. The initial permeability μi, saturation magnetization M and coercivity H of the samples increase with the increasing calcination temperature. The sample calcined at 600 ℃ exhibits an excellent soft magnetic performance, which has μi=33.97 （10 MHz）, Hc=15.62 Oe and Ms=228.877 emu/cm^3. Low-temperature annealing can enhance the magnetic properties of the samples. The work shows that using the sol-gel method in conjunction with RTA is a promising way to fabricate integrated thin-film devices.
文摘Cu-Zn ferrite nano thin films were deposited from a target of Cu-Zn ferrite onto a sapphire substrate using XeCl excimer laser operating 308 nm with an energy of 225 mJ and a frequency of 30 Hz. Films were deposited from the target onto sapphire (001) substrates heated to 650℃ in an oxygen atmosphere of 100 mTorr. The laser beam was incident On the target face at an angle of 45°. Studies on crystal structure were done by X-ray diffactometry (XRD). The surface texture, cross-section morphology and grain size was observed by JEOL-JSM-6400 scanning electron microscopy, atomic force microscopy (AFM) and magnetic force microscopy (MFM) [Model DI 3000, Digital instruments].
