Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It...Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors,展开更多
Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IR...Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy展开更多
This paper investigates a simple step-stress accelerated lifetime test(SSALT)model for the inferential analysis of exponential competing risks data.A generalized type-I hybrid censoring scheme is employed to improve t...This paper investigates a simple step-stress accelerated lifetime test(SSALT)model for the inferential analysis of exponential competing risks data.A generalized type-I hybrid censoring scheme is employed to improve the efficiency and controllability of the test.Firstly,the MLEs for parameters are established based on the cumulative exposure model(CEM).Then the conditional moment generating function(MGF)for unknown parameters is set up using conditional expectation and multiple integral techniques.Thirdly,confidence intervals(CIs)are constructed by the exact MGF-based method,the approximate normality-based method,and the bias-corrected and accelerated(BCa)percentile bootstrap method.Finally,we present simulation studies and an illustrative example to compare the performances of different methods.展开更多
基金supported by the National Natural Science Foundation of China (61302083, 61531007)
文摘Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors,
文摘Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy
基金Humanities and Social Sciences Fund in Ministry of Education in China(18YJC910009)the National Natural Science Foundation of China(12061091)Program for the Philosophy and Social Sciences Research of Higher Learning Institutions of Shanxi(201803050)。
文摘This paper investigates a simple step-stress accelerated lifetime test(SSALT)model for the inferential analysis of exponential competing risks data.A generalized type-I hybrid censoring scheme is employed to improve the efficiency and controllability of the test.Firstly,the MLEs for parameters are established based on the cumulative exposure model(CEM).Then the conditional moment generating function(MGF)for unknown parameters is set up using conditional expectation and multiple integral techniques.Thirdly,confidence intervals(CIs)are constructed by the exact MGF-based method,the approximate normality-based method,and the bias-corrected and accelerated(BCa)percentile bootstrap method.Finally,we present simulation studies and an illustrative example to compare the performances of different methods.
