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THE CRYSTALLIZATION KINETICS OF AN AMORPHOUS Ti-RICHNiTi FILM 被引量:1
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作者 X. Y. Jiang, H.B. Xu and S.K. Gong (Department of Materials Science and Engineering, Beijing University of Aeronautics and Astronautics,Beijing 100083, China) 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2000年第6期1131-1135,共5页
The crystallization kinetics of an amorphous Ti-rich NiTi film (Ni 46.34at.%, Ti 53.66at.%)prepared by DC magnetron sputtering was determined by non-isothermal techniques. The activation energy of crystallization and ... The crystallization kinetics of an amorphous Ti-rich NiTi film (Ni 46.34at.%, Ti 53.66at.%)prepared by DC magnetron sputtering was determined by non-isothermal techniques. The activation energy of crystallization and the mean value of the Avrami parameter are 382kJ/mol and 0.85, respectively. The calculated isothermal kinetic curse of amorphous film at 773K coincides with the result of X-ray diffraction.The formation of a Ti2Ni phase is accompanied with the crystallization of Ti-rich NiTi film. 展开更多
关键词 amorphous NiTi film crystallization kinetics activation energy of crystallization
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