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Effect of Sulfur on the Performance of Three-Way Catalysts
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作者 Li Yang He Zhenfu +2 位作者 Shao Qian Shen Ningyuan Jing Zhenhua(SINOPEC Research Institute of Petroleum Processing, Beijing 100083) 《China Petroleum Processing & Petrochemical Technology》 SCIE CAS 2003年第3期53-57,共5页
Sulfur content is one of the fuel properties to be monitored. Sulfur dioxide, the major product derived from organic sulfur compounds in the exhaust gas emissions, is a poison to the three-way catalysts (TWC). A gas m... Sulfur content is one of the fuel properties to be monitored. Sulfur dioxide, the major product derived from organic sulfur compounds in the exhaust gas emissions, is a poison to the three-way catalysts (TWC). A gas mixture was applied to simulate the exhaust gases used in the TWC aging procedure tests. Two types of the TWC, REX-IIC and REX-IID, were tested in this study. The performance of both TWC's before and after the 100-hour sulfur aging program was compared. It was concluded that the Pt component in the TWC was apt to be poisoned by sulfur much easily than Rh. The performance of the REX-IID catalyst was generally better than that of the REX-IIC catalyst. 展开更多
关键词 three-way catalyst simulated aging performance tests
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Model of NBTI combined with mobility degradation
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作者 Xuezhong Wu Chenyue Ma +4 位作者 Shucheng Gao Xiangbin Li Fu Sun Lining Zhang Xinnan Lin 《Journal of Semiconductors》 EI CAS CSCD 2018年第12期141-146,共6页
The mobility degradation induced by negative bias temperature instability(NBTI) is usually ignored in traditional NBTI modeling and simulation, resulting in overestimation of the circuit lifetime, especially after lon... The mobility degradation induced by negative bias temperature instability(NBTI) is usually ignored in traditional NBTI modeling and simulation, resulting in overestimation of the circuit lifetime, especially after longterm operation. In this paper, the mobility degradation is modeled in combination with the universal NBTI model.The coulomb scattering induced by interface states is revealed to be the dominant component responsible for mobility degradation. The proposed mobility degradation model fits the measured data well and provides an accurate solution for evaluating coupling of NBTI with HCI(hot carrier injection) and SHE(self-heating effect), which indicates that mobility degradation should be considered in long-term circuit aging simulation. 展开更多
关键词 NBTI mobility degradation aging simulation algorithm hot carrier injection self-heating effect COUPLING
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