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Factors Affecting the Top Stripping of GaAs Microwire Array Fabricated by Inductively Coupled Plasma Etching
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作者 程滢 邹继军 +5 位作者 万明 王炜路 彭新村 冯林 邓文娟 朱志甫 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第5期150-152,共3页
The effects of different masks and patterns on the top stripping of GaAs microwire arrays fabricated by inductively coupled plasma etching for 20min and 40min are investigated. The results show that the mask layer is ... The effects of different masks and patterns on the top stripping of GaAs microwire arrays fabricated by inductively coupled plasma etching for 20min and 40min are investigated. The results show that the mask layer is the main affect of the top stripping of the GaAs microwires in 40min. Increasing the mask layers and reducing the photoresist layers can prevent top stripping and result in a suitable GaAs microwire array. 展开更多
关键词 SEM factors Affecting the Top Stripping of GaAs Microwire array Fabricated by Inductively Coupled Plasma Etching
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