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A Study on HA Titanium Surface with Atomic Force Microscope (AFM)
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作者 杨晓喻 刘长虹 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2005年第B12期242-245,共4页
Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic micros... Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic microscope and atomic force microscope ( AFM ) . The typical surface morphology of the acid and alkali group is little holes, and on the two HA surface the tiny protuberances is typical. The surface treated by apatite solution was smoother than the two formers. The rough surface treated with acid and alkali was propitious to Ca^+ , P^- and proteins' adhesion, and the relatively smooth HA surface was of benefit to the cell adhesion. 展开更多
关键词 TITANIUM surface morphology atomic force microscope afm)
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Sorting Gold and Sand(Silica) Using Atomic Force Microscope-Based Dielectrophoresis 被引量:1
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作者 Chungman Kim Sunghoon Hong +3 位作者 Dongha Shin Sangmin An Xingcai Zhang Wonho Jhe 《Nano-Micro Letters》 SCIE EI CAS CSCD 2022年第2期1-11,共11页
Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the curre... Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the current technology still exhibits a limitation in realizing the selective deposition and sorting of various materials contained in the same reservoir,which can contribute significantly to additive printing or manufacturing by enabling simultaneous sorting and deposition of different substances through a single nozzle.Here,we propose a dielectrophoresis(DEP)-based material-selective deposition and sorting technique using a pipette-based quartz tuning fork(QTF)-atomic force microscope(AFM) platform DEPQA and demonstrate multi-material sorting through a single nozzle in ambient conditions.We used Au and silica nanoparticles for sorting and obtained 95% accuracy for spatial separation,which confirmed the surfaceenhanced Raman spectroscopy(SERS).To validate the scheme,we also performed a simulation for the system and found qualitative agreement with the experimental results.The method that combines DEP,pipette-based AFM,and SERS may widely expand the unique capabilities of 3D printing and nano-micro patterning for multi-material patterning,materials sorting,and diverse advanced applications. 展开更多
关键词 Dielectrophoresis-empowered Pipette/afm platform On-demand materials sorting Additive 3D printing Multimaterial nano-patterning Nanopipette-based atomic force microscope
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IMPROVED FABRICATION METHOD FOR CARBON NANOTUBE PROBE OF ATOMIC FORCE MICROSCOPY(AFM) 被引量:1
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作者 XU Zongwei DONG Shen +1 位作者 GUO Liqiu ZHAO Qingliang 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第3期373-375,共3页
An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig... An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication's difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe. 展开更多
关键词 Carbon nanotube (CNT) Atomic force microscope (afm Probe Fabrication
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Carbon nanotubes as tips for atomic force microscopy
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作者 国立秋 徐宗伟 +3 位作者 赵铁强 赵清亮 张飞虎 董申 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2004年第2期223-227,共5页
Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical ... Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect. 展开更多
关键词 carbon nanotube atomic force microscope (afm) PROBE
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Monte Carlo method in optical atomic force microscopy
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作者 Ahemd ElMelegy Sarwat Zahwi 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2021年第3期267-271,共5页
Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versa... Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm. 展开更多
关键词 MEASUREMENT Monte Carlo method atomic force microscope(afm) NANOMETROLOGY
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Damage of DNA ends induced by mechanical force during AFM nano-manipulation
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作者 DUAN Na WANG Xinyan +2 位作者 ZHANG Chen ZHANG Yi HU Jun 《Nuclear Science and Techniques》 SCIE CAS CSCD 2013年第1期26-31,共6页
An experimental and statistical study was carried out to explore the effects of mechanical forces on the ends of linear double-stranded DNA (dsDNA) fragments. Mechanical force was applied onto individual DNA molecules... An experimental and statistical study was carried out to explore the effects of mechanical forces on the ends of linear double-stranded DNA (dsDNA) fragments. Mechanical force was applied onto individual DNA molecules during atomic force microscope (AFM)-based picking-up manipulation. By comparing the PCR efficiency of two DNA fragments with primers either at ends or at the inner regions, it was found that the ends of DNA fragments were damaged during picking-up process. 展开更多
关键词 机械力 afm DNA损伤 纳米操纵 单个DNA分子 DNA片段 诱导 原子力显微镜
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An automated AFM for nanoindentation and force related measurements
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作者 BAI Jiang-hua Andres La Rosa 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2018年第4期347-353,共7页
A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz cr... A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz crystal tuning fork(TF)was used as the transducer with a probe attached.An acoustic sensor was used to measure the interactions between the probe and the sample.An SR850lock-in amplifier was used to monitor the TF signals.An additional lock-in amplifier was used to monitor the acoustic signal.A field programmable gate array(FPGA)board was used to collect the data in automatic mode.The main controller was coded with LabVIEW,which was in charge of Z-axis scan,signal processing and data visualization.A manual mode and an automatic mode were implemented in the controller.Users can switch the two modes at any time during the operation.This AFM system showed several advantages during the test operations.It is simple,flexible and easy to use. 展开更多
关键词 atomic force microscope(afm) nano indentation acoustic sensing piezo drive crystal tuning fork LabVIEW lock-in amplifier 8051microcontroller
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基于光偏转原理的AFM光电检测系统设计
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作者 王旭东 温阳 +3 位作者 王慧云 秦丽 温焕飞 马宗敏 《传感器与微系统》 CSCD 北大核心 2024年第3期76-79,共4页
利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向... 利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向精准调节偏转角度,36mm的聚焦焦距满足了小型化、集成化的设计目标。基于该高灵敏度光电检测系统的设计,AFM系统得到了清晰的硅材料表面台阶结构,系统分辨率达到了0.1nm,为今后的亚原子测量奠定了实验基础。 展开更多
关键词 原子力显微镜 光偏转 准直调节 压电陶瓷
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基于AFM的SBS改性沥青老化过程力学特性研究 被引量:1
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作者 曲恒辉 丁昕 +4 位作者 李孟 田冬军 冯美军 王飞 王鹏 《市政技术》 2024年第1期212-218,共7页
为了探究改性沥青在老化过程中宏观与微观性能的变化,制备了掺量为5.5%的SBS改性沥青,并进行了短期与长期老化试验,分析了其基本性能指标。采用温度扫描与频率扫描试验研究了SBS改性沥青的流变性能,采用AFM试验分析了其表面微观形貌和... 为了探究改性沥青在老化过程中宏观与微观性能的变化,制备了掺量为5.5%的SBS改性沥青,并进行了短期与长期老化试验,分析了其基本性能指标。采用温度扫描与频率扫描试验研究了SBS改性沥青的流变性能,采用AFM试验分析了其表面微观形貌和耗散力,并结合力曲线分析了其黏附力及杨氏模量在老化前后的变化。研究结果表明,短期老化对SBS改性沥青流变性能的影响较小,长期老化对其流变性能影响显著,弹性模量和黏性模量均增大,呈现出变硬、变脆的特性;AFM试验表明SBS改性沥青在老化后高度增大,且蜂状结构尺寸增大、数量增多,黏附力和耗散力均降低,杨氏模量增大,验证了宏观流变试验的结果。 展开更多
关键词 afm SBS改性沥青 老化 力学特性
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{001} surface structure of clinotyrolite revealed by atomic force microscope (AFM)
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作者 廖立兵 马哲生 施倪承 《Chinese Science Bulletin》 SCIE EI CAS 1996年第9期759-761,共3页
Clinotyrolite is a mineral discovered by Ma et al. in 1980. It is a hydrous copperarsenate and similar to tyrolite in both composition and structure. Its structureformula is Cu<sub>9</sub>Ca<sub>2<... Clinotyrolite is a mineral discovered by Ma et al. in 1980. It is a hydrous copperarsenate and similar to tyrolite in both composition and structure. Its structureformula is Cu<sub>9</sub>Ca<sub>2</sub>[(As, S)O<sub>4</sub>](OH, O)<sub>10</sub>·10H<sub>2</sub>O. Because of a group of perfect 展开更多
关键词 clinotyrolite afm (atomic force microscope) MODULATION structure.
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基于AFM对蝙蝠葛碱诱导NB4细胞凋亡的研究 被引量:5
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作者 陈伟 王穗湘 +2 位作者 胡小毛 邢晓波 蔡继业 《中山大学学报(医学科学版)》 CAS CSCD 北大核心 2012年第4期421-428,共8页
【目的】探讨蝙蝠葛碱对急性早幼粒细胞白血病(APL)NB4细胞增殖的影响和可能的细胞凋亡机制。【方法】采用CCK-8法检测NB4细胞的存活率,原子力显微镜(AFM)探测蝙蝠葛碱作用NB4细胞前后细胞形态及超微结构的变化,流式细胞术检测细胞凋亡... 【目的】探讨蝙蝠葛碱对急性早幼粒细胞白血病(APL)NB4细胞增殖的影响和可能的细胞凋亡机制。【方法】采用CCK-8法检测NB4细胞的存活率,原子力显微镜(AFM)探测蝙蝠葛碱作用NB4细胞前后细胞形态及超微结构的变化,流式细胞术检测细胞凋亡率、线粒体膜电位和活性氧的变化。【结果】蝙蝠葛碱能显著抑制NB4细胞生长增殖,20~80μmol/L蝙蝠葛碱处理细胞24 h后,细胞存活率从(86.5±11.7)%下降到(4.1±0.5)%;以10~40μmol/L蝙蝠葛碱处理NB4细胞24 h,流式细胞术分析显示,细胞凋亡率和细胞内活性氧含量上升、线粒体膜电位下降。AFM探测表明,正常NB4细胞呈圆形,细胞饱满,表面较光滑。蝙蝠葛碱处理组细胞皱缩,细胞表面的平均粗糙度增大。【结论】蝙蝠葛碱能显著抑制NB4细胞增殖并诱导其凋亡。 展开更多
关键词 蝙蝠葛碱 NB4细胞 原子力显微镜 超微结构 细胞凋亡
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基于AFM的机器人化纳米操作中纳观力的初步研究 被引量:6
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作者 田孝军 王越超 +1 位作者 席宁 董再励 《机器人》 EI CSCD 北大核心 2007年第4期363-367,共5页
针对基于原子力显微镜(AFM)的机器人化纳米操作,对探针作用下探针—基片—微粒之间纳观力的作用规律进行了初步分析.指出起主要作用的纳观力为范德华力、接触斥力、纳米摩擦力、毛细作用力以及纳米静电力等五种,并初步推导了各种纳观力... 针对基于原子力显微镜(AFM)的机器人化纳米操作,对探针作用下探针—基片—微粒之间纳观力的作用规律进行了初步分析.指出起主要作用的纳观力为范德华力、接触斥力、纳米摩擦力、毛细作用力以及纳米静电力等五种,并初步推导了各种纳观力的表达形式.通过力—距离曲线仿真与实验验证了所进行分析的合理性;该分析有助于进行纳米操作的精确控制. 展开更多
关键词 纳观力分析 力-距离曲线 机器人化纳米操作 原子力显微镜
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动态AFM悬臂的高阶谐振特性研究及实验 被引量:7
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作者 黄强先 袁丹 +2 位作者 尤焕杰 赵阳 程真英 《仪器仪表学报》 EI CAS CSCD 北大核心 2013年第12期2647-2652,共6页
为了提高动态原子力显微镜(AFM)的灵敏度、分辨率、扫描速度等,基于硅悬臂器件具有多阶谐振模态的特性,提出一种利用硅悬臂高阶谐振而进行扫描测量的高阶谐振表面测量方法,并对相应动态AFM悬臂的高阶谐振特性进行了理论和实验研究。分... 为了提高动态原子力显微镜(AFM)的灵敏度、分辨率、扫描速度等,基于硅悬臂器件具有多阶谐振模态的特性,提出一种利用硅悬臂高阶谐振而进行扫描测量的高阶谐振表面测量方法,并对相应动态AFM悬臂的高阶谐振特性进行了理论和实验研究。分析了高阶谐振悬臂的工作原理,给出了悬臂的振动方程和振型函数,从理论上证明了高阶谐振悬臂较其初级谐振模式具有更高灵敏度和更高空间分辨率;由于频率的提高,悬臂的动态测量性能明显改善。基于自制的轻敲式AFM,通过实验证实了高阶谐振现象的存在;实验测得的一阶二阶谐振悬臂的灵敏度,空间分辨率和最小可探测力梯度分别为8 V/μm,17 V/μm;1.33 nm,0.47 nm;1.80×10-7N/m,0.54×10-7N/m,实验结果与理论分析结论一致;通过二阶谐振扫描获得了光栅试样表面轮廓图,证明了该高阶谐振特性研究的正确性及利用高阶谐振特性进行扫描测量的可行性。 展开更多
关键词 硅悬臂 高阶谐振 动态afm 最小可探测力梯度
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基于AFM的虚拟纳米手操作策略研究 被引量:6
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作者 侯静 吴成东 +2 位作者 董再励 李孟歆 王文学 《仪器仪表学报》 EI CAS CSCD 北大核心 2013年第5期1167-1172,共6页
针对纳米操作过程中存在的不确定性及AFM单探针带来的纳米粒子的稳定操作问题,提出了虚拟纳米手操作策略。该策略采用蒙特卡洛方法描述粒子的不确定性,在纳米粒子推动操作的运动学模型基础上,对AFM探针的作用参数进行规划,模拟多探针并... 针对纳米操作过程中存在的不确定性及AFM单探针带来的纳米粒子的稳定操作问题,提出了虚拟纳米手操作策略。该策略采用蒙特卡洛方法描述粒子的不确定性,在纳米粒子推动操作的运动学模型基础上,对AFM探针的作用参数进行规划,模拟多探针并行操作效果,将粒子的中心位置限制在规定误差范围内,从而可以避免操作过程中粒子的丢失,实现粒子的稳定高精度纳米操作,仿真结果与实验操作结果相对比,验证了虚拟纳米手操作方法的有效性。 展开更多
关键词 虚拟纳米手策略 纳米粒子 稳定纳米操作 afm
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AFM制作纳米光栅技术研究 被引量:5
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作者 张鸣 张伟 +3 位作者 华心 谢惠民 陈鹏万 黄风雷 《光学技术》 EI CAS CSCD 北大核心 2006年第3期330-332,336,共4页
在扫描探针纳米加工技术的基础上,提出了利用原子力显微镜(AFM)来制作高频光栅的新工艺。利用AFM硅制探针,在接触模式下对光盘(聚碳酸酯材料)进行刻划试验。对刻划光栅的工艺参数进行优化,得到了纳米量级光栅。并将刻划所得光栅应用于... 在扫描探针纳米加工技术的基础上,提出了利用原子力显微镜(AFM)来制作高频光栅的新工艺。利用AFM硅制探针,在接触模式下对光盘(聚碳酸酯材料)进行刻划试验。对刻划光栅的工艺参数进行优化,得到了纳米量级光栅。并将刻划所得光栅应用于数字云纹法,与数字参考栅干涉形成微/纳米数字云纹。实验结果表明,该法所制得的光栅可以应用于实际变形的测量。 展开更多
关键词 原子力显微镜 微纳米加工 光栅制作 数字云纹
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AFM扫描参数对样品粗糙度测量的影响 被引量:8
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作者 王子仪 张荣君 +2 位作者 郑玉祥 张振生 李海涛 《实验室研究与探索》 CAS 北大核心 2013年第2期5-7,共3页
原子力显微镜(Atomic Force Microscope,AFM)是纳米科技研究领域的一种重要工具。作为一种近场成像仪器,参数的选择对样品成像的效果有着很大的影响,不当的参数甚至可能造成样品的损坏。通过采用控制变量法,并以均方根粗糙度作为评判标... 原子力显微镜(Atomic Force Microscope,AFM)是纳米科技研究领域的一种重要工具。作为一种近场成像仪器,参数的选择对样品成像的效果有着很大的影响,不当的参数甚至可能造成样品的损坏。通过采用控制变量法,并以均方根粗糙度作为评判标准,改变AFM各项扫描参数,研究了AFM中不同参数的调整对于样品扫描图像的影响。结果表明,振幅阈值、扫描速率、积分增益三项参数对于测量样品表面粗糙度均有较大影响,通过适当改变扫描参数,可以有效提升AFM的样品扫描质量。 展开更多
关键词 原子力显微镜 扫描参数 表面粗糙度
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DNALB膜的AFM形貌观察 被引量:2
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作者 陈霞 靳健 +6 位作者 杨文胜 杨百全 徐力 江林 白玉白 李铁津 陈曦 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2000年第9期1459-1461,共3页
DNA/octadecylamine(ODA) monolayers were transferred onto silicon substrates and the morphologies of the monolayers were investigated by Atomic Force Microscope(AFM). AFM images show that the morphologies of DNA dissol... DNA/octadecylamine(ODA) monolayers were transferred onto silicon substrates and the morphologies of the monolayers were investigated by Atomic Force Microscope(AFM). AFM images show that the morphologies of DNA dissolved in pure water are very different from those of DNA dissolved in the NaCl solution. When DNA molecules are dissovled in pure water, they will form ball-like structure in the monolayer. When the DNA molecules are dissolved in NaCl solution, they will form bunch lines. This DNA line offers a valuable template to direct the formation of unique inorganic nanomaterials. 展开更多
关键词 LB技术 DNA分子 afm LB膜 纳米材料 排列形态
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基于AFM的靶丸表面轮廓仪设计及其测量精度分析 被引量:3
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作者 赵学森 孙涛 +3 位作者 马小军 高党忠 唐永建 董申 《纳米技术与精密工程》 EI CAS CSCD 2006年第4期307-310,共4页
基于商用原子力显微镜(AFM)建立了靶丸表面轮廓测量仪系统,并对该系统的精密回转轴系进行了结构设计.为了评价系统的测量不确定度,进行了气浮轴系回转精度测试,确定了回转轴系的误差曲线,其最小二乘圆度误差为48nm;同时对安装回转轴系后... 基于商用原子力显微镜(AFM)建立了靶丸表面轮廓测量仪系统,并对该系统的精密回转轴系进行了结构设计.为了评价系统的测量不确定度,进行了气浮轴系回转精度测试,确定了回转轴系的误差曲线,其最小二乘圆度误差为48nm;同时对安装回转轴系后AFM的测量噪声进行了测试,并通过结构改进使静态噪声幅值降为约10nm.应用这一系统进行了靶丸表面圆周迹线的测量实验,实验测量出该系统运转测量时噪声幅值约13nm,综合测量误差约49.7nm,此测量精度可以通过回转轴系的误差分离来进一步提高. 展开更多
关键词 靶丸表面轮廓仪 原于力显微镜 轴系设计 测量精度
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表面活性剂及复配在云母片上吸附的AFM研究 被引量:3
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作者 毛逢银 黄小兵 +1 位作者 曹理兵 金晓伟 《润滑与密封》 EI CAS CSCD 北大核心 2006年第8期115-117,共3页
借助原子力显微镜对十二烷基硫酸钠(SDS)/十六烷基三甲基溴化铵(CTAB)及其复配溶液在云母表面的吸附以及吸附后不同的表面形貌和微摩擦特性进行了研究,探讨了摩擦力与表面形貌的关系。结果表明,SDS与CTAB表面活性剂分子都以纳米级颗粒... 借助原子力显微镜对十二烷基硫酸钠(SDS)/十六烷基三甲基溴化铵(CTAB)及其复配溶液在云母表面的吸附以及吸附后不同的表面形貌和微摩擦特性进行了研究,探讨了摩擦力与表面形貌的关系。结果表明,SDS与CTAB表面活性剂分子都以纳米级颗粒吸附于云母表面;摩擦力受表面形貌的影响,但不成一一对应关系;在0.8和2倍临界胶束浓度(CMC)下,SDS/CTAB=1∶1复配溶液在云母表面吸附后的润滑效应较其它配比好。 展开更多
关键词 阴/阳离子表面活性剂 复配 表面吸附 原子力显微镜 摩擦力
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AFM观察稳恒磁场对细胞表面精细结构的影响 被引量:4
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作者 齐浩 艾霞 +2 位作者 孙润广 刘颖 郭伟 《电子显微学报》 CAS CSCD 北大核心 2009年第2期150-156,共7页
利用原子力显微镜(AFM)观察稳恒磁场(SMF)处理后,悬浮生长细胞(K562人白血病细胞)、贴壁生长细胞(人结肠癌SW480细胞)、小鼠肝癌细胞Hepa1-6和原代小鼠肝细胞表面精细结构的变化,以了解SMF杀伤肿瘤细胞的可能机制。观察结果显示:随曝磁... 利用原子力显微镜(AFM)观察稳恒磁场(SMF)处理后,悬浮生长细胞(K562人白血病细胞)、贴壁生长细胞(人结肠癌SW480细胞)、小鼠肝癌细胞Hepa1-6和原代小鼠肝细胞表面精细结构的变化,以了解SMF杀伤肿瘤细胞的可能机制。观察结果显示:随曝磁时间延长,SMF可在肿瘤细胞表面造成不同程度损伤,主要表现为细胞膜上出现许多大小不一的凹陷,且凹陷数量和直径随着曝磁时间延长而增加。与MTT检测相比,AFM观察到的各类细胞表面损伤远早于细胞的生长抑制。实验观察显示,悬浮生长细胞比贴壁生长细胞对磁场处理更为敏感,小鼠肝癌细胞比肝细胞对磁处理更敏感。实验结果显示,AFM能够及早观察到细胞表面因SMF作用而产生的精细结构方面的变化。 展开更多
关键词 原子力显微镜(afm) 细胞表面结构 肿瘤细胞 稳恒磁场(SMF)
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