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A Study on HA Titanium Surface with Atomic Force Microscope (AFM)
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作者 杨晓喻 刘长虹 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2005年第B12期242-245,共4页
Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic micros... Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic microscope and atomic force microscope ( AFM ) . The typical surface morphology of the acid and alkali group is little holes, and on the two HA surface the tiny protuberances is typical. The surface treated by apatite solution was smoother than the two formers. The rough surface treated with acid and alkali was propitious to Ca^+ , P^- and proteins' adhesion, and the relatively smooth HA surface was of benefit to the cell adhesion. 展开更多
关键词 TITANIUM surface morphology atomic force microscope afm
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Sorting Gold and Sand(Silica) Using Atomic Force Microscope-Based Dielectrophoresis 被引量:1
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作者 Chungman Kim Sunghoon Hong +3 位作者 Dongha Shin Sangmin An Xingcai Zhang Wonho Jhe 《Nano-Micro Letters》 SCIE EI CAS CSCD 2022年第2期1-11,共11页
Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the curre... Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the current technology still exhibits a limitation in realizing the selective deposition and sorting of various materials contained in the same reservoir,which can contribute significantly to additive printing or manufacturing by enabling simultaneous sorting and deposition of different substances through a single nozzle.Here,we propose a dielectrophoresis(DEP)-based material-selective deposition and sorting technique using a pipette-based quartz tuning fork(QTF)-atomic force microscope(AFM) platform DEPQA and demonstrate multi-material sorting through a single nozzle in ambient conditions.We used Au and silica nanoparticles for sorting and obtained 95% accuracy for spatial separation,which confirmed the surfaceenhanced Raman spectroscopy(SERS).To validate the scheme,we also performed a simulation for the system and found qualitative agreement with the experimental results.The method that combines DEP,pipette-based AFM,and SERS may widely expand the unique capabilities of 3D printing and nano-micro patterning for multi-material patterning,materials sorting,and diverse advanced applications. 展开更多
关键词 Dielectrophoresis-empowered Pipette/afm platform On-demand materials sorting Additive 3D printing Multimaterial nano-patterning Nanopipette-based atomic force microscope
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IMPROVED FABRICATION METHOD FOR CARBON NANOTUBE PROBE OF ATOMIC FORCE MICROSCOPY(AFM) 被引量:1
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作者 XU Zongwei DONG Shen +1 位作者 GUO Liqiu ZHAO Qingliang 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第3期373-375,共3页
An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig... An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication's difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe. 展开更多
关键词 Carbon nanotube (CNT) atomic force microscope afm Probe Fabrication
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Monte Carlo method in optical atomic force microscopy
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作者 Ahemd ElMelegy Sarwat Zahwi 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2021年第3期267-271,共5页
Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versa... Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm. 展开更多
关键词 MEASUREMENT Monte Carlo method atomic force microscope(afm) NANOMETROLOGY
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Carbon nanotubes as tips for atomic force microscopy
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作者 国立秋 徐宗伟 +3 位作者 赵铁强 赵清亮 张飞虎 董申 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2004年第2期223-227,共5页
Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical ... Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect. 展开更多
关键词 carbon nanotube atomic force microscope (afm) PROBE
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Damage of DNA ends induced by mechanical force during AFM nano-manipulation
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作者 DUAN Na WANG Xinyan +2 位作者 ZHANG Chen ZHANG Yi HU Jun 《Nuclear Science and Techniques》 SCIE CAS CSCD 2013年第1期26-31,共6页
An experimental and statistical study was carried out to explore the effects of mechanical forces on the ends of linear double-stranded DNA (dsDNA) fragments. Mechanical force was applied onto individual DNA molecules... An experimental and statistical study was carried out to explore the effects of mechanical forces on the ends of linear double-stranded DNA (dsDNA) fragments. Mechanical force was applied onto individual DNA molecules during atomic force microscope (AFM)-based picking-up manipulation. By comparing the PCR efficiency of two DNA fragments with primers either at ends or at the inner regions, it was found that the ends of DNA fragments were damaged during picking-up process. 展开更多
关键词 机械力 afm DNA损伤 纳米操纵 单个DNA分子 DNA片段 诱导 原子力显微镜
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An automated AFM for nanoindentation and force related measurements
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作者 BAI Jiang-hua Andres La Rosa 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2018年第4期347-353,共7页
A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz cr... A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz crystal tuning fork(TF)was used as the transducer with a probe attached.An acoustic sensor was used to measure the interactions between the probe and the sample.An SR850lock-in amplifier was used to monitor the TF signals.An additional lock-in amplifier was used to monitor the acoustic signal.A field programmable gate array(FPGA)board was used to collect the data in automatic mode.The main controller was coded with LabVIEW,which was in charge of Z-axis scan,signal processing and data visualization.A manual mode and an automatic mode were implemented in the controller.Users can switch the two modes at any time during the operation.This AFM system showed several advantages during the test operations.It is simple,flexible and easy to use. 展开更多
关键词 atomic force microscope(afm) nano indentation acoustic sensing piezo drive crystal tuning fork LabVIEW lock-in amplifier 8051microcontroller
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{001} surface structure of clinotyrolite revealed by atomic force microscope (AFM)
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作者 廖立兵 马哲生 施倪承 《Chinese Science Bulletin》 SCIE EI CAS 1996年第9期759-761,共3页
Clinotyrolite is a mineral discovered by Ma et al. in 1980. It is a hydrous copperarsenate and similar to tyrolite in both composition and structure. Its structureformula is Cu<sub>9</sub>Ca<sub>2<... Clinotyrolite is a mineral discovered by Ma et al. in 1980. It is a hydrous copperarsenate and similar to tyrolite in both composition and structure. Its structureformula is Cu<sub>9</sub>Ca<sub>2</sub>[(As, S)O<sub>4</sub>](OH, O)<sub>10</sub>·10H<sub>2</sub>O. Because of a group of perfect 展开更多
关键词 clinotyrolite afm (atomic force microscope) MODULATION structure.
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Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope 被引量:10
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作者 YU JianQiang YUAN JingHe +2 位作者 ZHANG XueJie LIU JianLi FANG XiaoHong 《Chinese Science Bulletin》 SCIE EI CAS 2013年第33期4045-4050,共6页
We have built an integrated imaging system by combining stimulated emission depletion(STED)microscope and atomic force microscope(AFM).The STED microscope was constructed based on the supercontinuum fiber laser and a ... We have built an integrated imaging system by combining stimulated emission depletion(STED)microscope and atomic force microscope(AFM).The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of42 nm was achieved.With this integrated imaging system,morphological features,mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples.This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine. 展开更多
关键词 原子力显微镜 成像系统 集成系统 受激发射 纳米级 损耗 光纤激光器 横向分辨率
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Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy 被引量:3
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作者 Xinfeng TAN Dan GUO Jianbin LUO 《Friction》 SCIE EI CAS CSCD 2022年第5期748-761,共14页
Dynamic friction occurs not only between two contact objects sliding against each other,but also between two relative sliding surfaces several nanometres apart.Many emerging micro-and nano-mechanical systems that prom... Dynamic friction occurs not only between two contact objects sliding against each other,but also between two relative sliding surfaces several nanometres apart.Many emerging micro-and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction.Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy(AFM)method driving the second order flexural and the first order torsional vibration simultaneously.The pull-in problem caused by the attractive force is avoided,and the friction dissipation can be imaged near the surface.The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves.Image contrast is enhanced in the intermediate setpoint region.The work offers an effective method for directly detecting the friction dissipation and high resolution images,which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments. 展开更多
关键词 dynamic friction energy dissipation contact states image contrast bimodal atomic force microscopy(afm)
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Aligning DNA on Si surface and cutting off by tips of atomic force microscope 被引量:1
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作者 LI Hui & HAN Baoshan Institute of Physics, State Key Laboratory of Magnetism, ChineseAcademy of Sciences, Beijing 100080, China Correspondence should be addressed to Han Baoshan (e-mail: bhan@aphy.iphy.ac.cn 《Chinese Science Bulletin》 SCIE EI CAS 2003年第8期800-803,共4页
DNA is a kind of promising molecule as nano-lead to build or connect nano-devices due to its stable linear structure and certain conductivity. Many methods have been applied to constructing nano-patterns by using DNA ... DNA is a kind of promising molecule as nano-lead to build or connect nano-devices due to its stable linear structure and certain conductivity. Many methods have been applied to constructing nano-patterns by using DNA molecule. In this report it is presented that l-DNA was aligned on Si substrate by using the free-flowing method and then imaged by an atomic force microscope (AFM). After the second liquid flow, a catenary-like pattern and a crossed network of l-DNA were formed. In addition, the alignedl-DNA was successfully cut off by tips of AFM. 展开更多
关键词 Si 原子显微镜 afm DNA 脱氧核糖核酸
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Investigation of structural change of purple membrane in storage by transmission electron microscope and atomic force microscope
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作者 LI Xiaodong LI Zongli +4 位作者 YAN Jiusheng LI Hui HAN Baoshan HU Kunsheng WANG Aojin 《Chinese Science Bulletin》 SCIE EI CAS 2001年第20期1753-1756,共4页
The structural change of purple membrane during storage has been investigated by means of transmission electron microscope and atomic force microscope. It is found that many liposomes have spontaneously evolved from t... The structural change of purple membrane during storage has been investigated by means of transmission electron microscope and atomic force microscope. It is found that many liposomes have spontaneously evolved from the purple membrane sheets isolated three years ago. The membrane proteins on the liposomes, bacteriorhodopsin, are still presented as trimers in 2-D hexagonal structure, which is the same as that in natural cell membrane. However, the cytoplasmic surface of purple membrane faced outside on the liposomes. 展开更多
关键词 transmission electron microscope (TEM) atomic force microscope (afm) PURPLE membrane (PM) BACTERIORHODOPSIN (BR).
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Fabrication of Nanoscale Active Plasmonic Elements Using Atomic Force Microscope Tip-Based Nanomachining
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作者 Ciaran Barron Silas O'Toole Dominic Zerulla 《Nanomanufacturing and Metrology》 EI 2022年第1期50-59,共10页
Atomic force microscopy(AFM)is a widely adopted imaging and surface analysis technique that provides resolutions on the nanometer scale.AFM tip-based nanomachining has recently been adopted for the fabrication of arbi... Atomic force microscopy(AFM)is a widely adopted imaging and surface analysis technique that provides resolutions on the nanometer scale.AFM tip-based nanomachining has recently been adopted for the fabrication of arbitrarily shaped nanoscale structures.A major challenge of using AFM tip-based machining for the sculpting of nanoscale plasmonic structures is the build-up of displaced material along the sides of the channels.Here we apply this nanomechanical machining method to create active plasmonic elements and present the strategy we have been using to avoid the formation of such debris.Furthermore,a number of post-manufacturing treatments that can potentially be used to reduce the amount of debris surrounding the fabricated structures are discussed. 展开更多
关键词 Nanomechanical machining Nanoscale fabrication PLASMONICS atomic force microscope afm
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Micro-Friction of Diazoresin/Polyacrylic Acid Self-Assembly Films in Water with Atomic Force Microscopy
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作者 LI Xuefeng LI Han +1 位作者 HUANG Dahua LI Jian 《Wuhan University Journal of Natural Sciences》 CAS 2014年第3期253-256,共4页
Ultrathin films composed of diazoresin(DR)and polyacrylic acid(PAA)were fabricated.The surface morphology of the films in water was measured using an atomic force microscopy(AFM).The self-assembly technique make... Ultrathin films composed of diazoresin(DR)and polyacrylic acid(PAA)were fabricated.The surface morphology of the films in water was measured using an atomic force microscopy(AFM).The self-assembly technique makes the surface rather flat and uniform.The friction force and its dependence on the velocity differ from the surface charge of the thin films.The friction force of repulsive DR/PAA film increases linearly with velocity and has lower values than that of attractive DR film over the full range of velocity.As the velocity increases,the attractive friction of DR film first decreases to a minimum at a velocity of 2 line/s and then increases all the way.When the surface is repulsive to the friction substrate,the friction of thin films that is determined by hydrated lubrication of polymer chains that is ultralubricated;when it is adhesive to the friction substrate,the friction is mainly contributed from the elastic deformation of adsorbed polymer chains in the low velocity region and from viscous sliding in the presence of hydrated-layer lubrication of the polymer chains in the higher velocity region. 展开更多
关键词 micro-friction poly(acrylic acid) self-assembly film atomic force microscopy(afm
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Microfluidic bacterial traps for simultaneous fluorescence and atomic force microscopy 被引量:1
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作者 Oliver Peric Melanie Hannebelle +1 位作者 Jonathan D. Adams Georg E. Fantner 《Nano Research》 SCIE EI CAS CSCD 2017年第11期3896-3908,共13页
The atomic force microscope has become an established research tool for imaging microorganisms with unprecedented resolution.However,its use in microbiology has been limited by the difficulty of proper bacterial immob... The atomic force microscope has become an established research tool for imaging microorganisms with unprecedented resolution.However,its use in microbiology has been limited by the difficulty of proper bacterial immobilization.Here,we have developed a microfluidic device that solves the issue of bacterial immobilization for atomic force microscopy under physiological conditions.Our device is able to rapidly immobilize bacteria in well-defined positions and subsequently release the cells for quick sample exchange.The developed device also allows simultaneous fluorescence analysis to assess the bacterial viability during atomic force microscope imaging.We demonstrated the potential of our approach for the immobilization of rod-shaped Escherichia coli and Bacillus subtilis.Using our device,we observed buffer-dependent morphological changes of the bacterial envelope mediated by the antimicrobial peptide CM15.Our approach to bacterial immobilization makes sample preparation much simpler and more reliable,thereby accelerating atomic force microscopy studies at the single-cell level. 展开更多
关键词 atomic force microscope afm MICROFABRICATION MICROFLUIDICS MICROBIOLOGY correlative microscopy physical immobilization
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Electrocondensation and Evaporation of Attoliter Water Droplets: Direct Visualization Using Atomic Force Microscopy 被引量:1
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作者 Narendra Kurra Adina Scott Giridhar U.Kulkarni 《Nano Research》 SCIE EI CSCD 2010年第5期307-316,共10页
Working with a biased atomic force microscope(AFM)tip in the tapping mode under ambient atmosphere,attoliter(10^(-18) L)water droplet patterns have been generated on a patterned carbonaceous surface.This is essentiall... Working with a biased atomic force microscope(AFM)tip in the tapping mode under ambient atmosphere,attoliter(10^(-18) L)water droplet patterns have been generated on a patterned carbonaceous surface.This is essentially electrocondensation of water leading to charged droplets,as evidenced from electrostatic force microscopy measurements.The droplets are unusual in that they exhibit a highly corrugated surface and evaporate rather slowly,taking several tens of minutes. 展开更多
关键词 Electrocondensation attoliter water droplets biased atomic force microscope(afm)lithography electron beam induced deposition carbonaceous deposition
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Atomic Force Microscopy of Calcite Surface
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作者 廖立兵 马喆生 施倪承 《Chinese Science Bulletin》 SCIE EI CAS 1993年第24期2058-2061,共4页
Both atomic force microscope (AFM) and scanning tunneling microscope (STM) are devices for investigating material surfaces down to atomic-scale in real space. But unlike STM, AFM can be used to study not only conducto... Both atomic force microscope (AFM) and scanning tunneling microscope (STM) are devices for investigating material surfaces down to atomic-scale in real space. But unlike STM, AFM can be used to study not only conductors and semiconductors but also insulators. So it has a wider application range than STM. As most minerals are insulators, 展开更多
关键词 atomic force microscope (afm) SURFACE CLEAVAGE MICROTOPOGRAPHY stress.
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基于光偏转原理的AFM光电检测系统设计
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作者 王旭东 温阳 +3 位作者 王慧云 秦丽 温焕飞 马宗敏 《传感器与微系统》 CSCD 北大核心 2024年第3期76-79,共4页
利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向... 利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向精准调节偏转角度,36mm的聚焦焦距满足了小型化、集成化的设计目标。基于该高灵敏度光电检测系统的设计,AFM系统得到了清晰的硅材料表面台阶结构,系统分辨率达到了0.1nm,为今后的亚原子测量奠定了实验基础。 展开更多
关键词 原子力显微镜 光偏转 准直调节 压电陶瓷
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Nanowear pretreatment of AFM tips for reasonable friction force 被引量:1
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作者 CHAI ZhiMin LIU YuHong +2 位作者 WANG WeiQi LU XinChun HE DanNong 《Science China(Technological Sciences)》 SCIE EI CAS 2014年第11期2241-2248,共8页
In a nanoscale friction test,wear of an atomic force microscope(AFM)tip is inevitable.The shape of the worn tip influences the friction force measured.In order to eliminate the influence,nanowear pretreatment should b... In a nanoscale friction test,wear of an atomic force microscope(AFM)tip is inevitable.The shape of the worn tip influences the friction force measured.In order to eliminate the influence,nanowear pretreatment should be conducted for the AFM tip.In our study,pretreatment of three kinds of tips,i.e.Si3N4 tip,Si tip and silica colloidal tip,was performed using AFM.The results show that the shape of the tips changes with the increase of sliding distance,which leads to the variety of friction force.Whereas,when the tip gets blunt,the shape of tip tends to become stable and the friction force becomes stable correspondingly.To a certain degree,it reveals that the pretreated tips can be applied to study the friction force of samples. 展开更多
关键词 atomic force microscope TIP wear friction force
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Measurement of the friction coefficient of a fluctuating contact line using an AFM-based dual-mode mechanical resonator
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作者 郭硕 熊小敏 +2 位作者 徐祖力 沈平 童彭尔 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第11期64-74,共11页
A dual-mode mechanical resonator using an atomic force microscope (AFM) as a force sensor is developed. The resonator consists of a long vertical glass fiber with one end glued onto a rectangular cantilever beam and... A dual-mode mechanical resonator using an atomic force microscope (AFM) as a force sensor is developed. The resonator consists of a long vertical glass fiber with one end glued onto a rectangular cantilever beam and the other end immersed through a liquid-air interface. By measuring the resonant spectrum of the modified AFM cantilever, one is able to accurately determine the longitudinal friction coefficient ξv along the fiber axis associated with the vertical oscillation of the hanging fiber and the traversal friction coefficient ξh perpendicular to the fiber axis associated with the horizontal swing of the fiber around its joint with the cantilever. The technique is tested by measurement of the friction coefficient of a fluctuating (and slipping) contact line between the glass fiber and the liquid interface. The experiment verifies the theory and demonstrates its applications. The dual-mode mechanical resonator provides a powerful tool for the study of the contact line dynamics and the rheological property of anisotropic fluids. 展开更多
关键词 contact line dynamics atomic force microscope afm resonator friction coefficient liquid inter-faces
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