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IMPROVED FABRICATION METHOD FOR CARBON NANOTUBE PROBE OF ATOMIC FORCE MICROSCOPY(AFM) 被引量:1
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作者 XU Zongwei DONG Shen +1 位作者 GUO Liqiu ZHAO Qingliang 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第3期373-375,共3页
An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig... An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication's difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe. 展开更多
关键词 Carbon nanotube (CNT) atomic force microscope (afm Probe Fabrication
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Observation and characterization of asphalt microstructure by atomic force microscopy 被引量:9
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作者 杨军 龚明辉 +3 位作者 王潇婷 陈先华 王晓 王征 《Journal of Southeast University(English Edition)》 EI CAS 2014年第3期353-357,共5页
The microstructure of asphalt is investigated by atomic force microscopy (AFM). In order to analyze the impacts of asphalt types on microstructures, two neat asphalts with different penetration grades (50# and 70#... The microstructure of asphalt is investigated by atomic force microscopy (AFM). In order to analyze the impacts of asphalt types on microstructures, two neat asphalts with different penetration grades (50# and 70#) and one styrene-butadiene-styrene (SBS) modified asphalt are chosen. The influence of short-term aging is also studied. Based on the knowledge of asphalt's microproperties, the relationship between microstructures and healing property is analyzed. The results indicate that the microstructures of three asphalts are quite different and the effects of aging on the surface characteristics for different asphalts are also different. It is proposed that the bee structure is a type of wax crystal and it has a close relationship with the "bridge-healing" mechanism. The findings may reveal the formation mechanism of microstructure and the healing property for asphalts. 展开更多
关键词 ASPHALT atomic force microscopy (afm MICROSTRUCTURE self-healing property
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A Study on HA Titanium Surface with Atomic Force Microscope (AFM)
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作者 杨晓喻 刘长虹 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2005年第B12期242-245,共4页
Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic micros... Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic microscope and atomic force microscope ( AFM ) . The typical surface morphology of the acid and alkali group is little holes, and on the two HA surface the tiny protuberances is typical. The surface treated by apatite solution was smoother than the two formers. The rough surface treated with acid and alkali was propitious to Ca^+ , P^- and proteins' adhesion, and the relatively smooth HA surface was of benefit to the cell adhesion. 展开更多
关键词 TITANIUM surface morphology atomic force microscope afm)
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Intermolecular and surface forces in atomic-scale manufacturing 被引量:4
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作者 Xin Hou Jingyang Li +1 位作者 Yuanzhe Li Yu Tian 《International Journal of Extreme Manufacturing》 SCIE EI 2022年第2期32-48,共17页
Atomic and close-to-atomic scale manufacturing(ACSM)aims to provide techniques for manufacturing in various fields,such as circuit manufacturing,high energy physics equipment,and medical devices and materials.The real... Atomic and close-to-atomic scale manufacturing(ACSM)aims to provide techniques for manufacturing in various fields,such as circuit manufacturing,high energy physics equipment,and medical devices and materials.The realization of atomic scale material manipulation depending on the theoretical system of classical mechanics faces great challenges.Understanding and using intermolecular and surface forces are the basis for better designing of ACSM.Transformation of atoms based on scanning tunneling microscopy or atomic force microscopy(AFM)is an essential process to regulate intermolecular interactions.Self-assemble process is a thermodynamic process involving complex intermolecular forces.The competition of these interaction determines structure assembly and packing geometry.For typical nanomachining processes including AFM nanomachining and chemical mechanical polishing,the coupling of chemistry and stress(tribochemistry)assists in the removal of surface atoms.Furthermore,based on the principle of triboelectrochemistry,we expect a further reduction of the potential barrier,and a potential application in high-efficiency atoms removal and fabricating functional coating.Future fundamental research is proposed for achieving high-efficiency and high-accuracy manufacturing with the aiding of external field.This review highlights the significant contribution of intermolecular and surface forces to ACSM,and may accelerate its progress in the in-depth investigation of fundamentals. 展开更多
关键词 intermolecular and surface forces atomic-scale manufacturing transformation of atoms afm nanomachining chemical mechanical polishing triboelectrochemistry
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Investigation of Adsorption of Xanthan Gum on Enamel by Tapping Mode Atomic Force Microscopy 被引量:1
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作者 LIHao-ying 《Chemical Research in Chinese Universities》 SCIE CAS CSCD 2004年第4期501-503,共3页
By using tapping mode atomic force microscopy(TMAFM), a polymer layer was found on the enamel surface after the exposure to xanthan gum solutions. The layer thickness is closely related to the exposure time and the co... By using tapping mode atomic force microscopy(TMAFM), a polymer layer was found on the enamel surface after the exposure to xanthan gum solutions. The layer thickness is closely related to the exposure time and the concentration of xanthan gum solution. The thickness data were evaluated by a Kruskal-Wallis test and Box-Whisker Plot at a 95% confidence level(p<0.05), and a statistically significant difference among the thickness data groups was demonstrated. After the exposure to 1000, 400, 100 mg/L xanthan gum solutions, the mean of layer thickness at the adsorption equilibrium is in the ranges of 103.5_122.06, 82.4_88.94 and 45.27_55.55 nm, respectively. This phenomenon suggests that the viscosity modifying agents in the beverage might be adsorbed on the enamel surface during consumption, which may form a barrier that can protect the enamel from being attacked by acid and therefore reduce dental erosion. 展开更多
关键词 atomic force microscopy(afm) Vertical distance Xanthan gum ENAMEL
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A Study of the Probe Effect on the Apparent Image of Biological Atomic Force Microscopy 被引量:1
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作者 Xue Mei WANG Lei QIN +1 位作者 Long BA Zu Hong LU 《Chinese Chemical Letters》 SCIE CAS CSCD 2001年第12期1113-1114,共2页
The probe effect on the apparent image of biological atomic force microscopy was explored in this study, and the potential of AFM in conformational study of gene related biological processes was illustrated by the spe... The probe effect on the apparent image of biological atomic force microscopy was explored in this study, and the potential of AFM in conformational study of gene related biological processes was illustrated by the specific nanostructural information of a new antitumor drug binding to DNA. 展开更多
关键词 atomic force microscopy (afm) ABSORPTION DNA recognition
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Single DNA molecular manipulation with atomic force microscopy 被引量:3
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作者 LüJun-Hong WUShi-Ying +2 位作者 ZHANGYi HUJun LIMin-Qian 《Nuclear Science and Techniques》 SCIE CAS CSCD 2004年第5期257-260,共4页
Nanomanipulation of DNA molecules or other biomolecules to form artificial patterns or structures at nanometer scale has potential applications in the construction of molecular devices in future industries. It may als... Nanomanipulation of DNA molecules or other biomolecules to form artificial patterns or structures at nanometer scale has potential applications in the construction of molecular devices in future industries. It may also lead to new insights into the interesting properties and behavior of this fantastic nature-selected molecule at the sin- gle-molecular level. Here we present a special method based on the combination of macroscopic “molecular comb- ing” and microscopic “molecular cutting” to manipulate DNA molecules and form complex patterns at nanometer scale on solid surfaces. A possible strategy for ordered DNA sequencing based on this nanomanipulation technique has also been proposed. 展开更多
关键词 纳米处理 脱氧核糖核酸 原子显微镜 序列编排 生物分子
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Atomic force microscope study of WC-10Co cemented carbide sintered from nanocrystalline composite powders 被引量:2
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作者 Xiaoliang Shi Gangqin Shao Xinglong Duan Runzhang Yuan 《Journal of University of Science and Technology Beijing》 CSCD 2005年第6期558-563,共6页
In order to compare the spark plasma sintedng (SPS) process plus hot isostatic press (HIP) with vacuum sintedng plus HIP, an investigation was carried out on the topography, microstructure and gain size distributi... In order to compare the spark plasma sintedng (SPS) process plus hot isostatic press (HIP) with vacuum sintedng plus HIP, an investigation was carried out on the topography, microstructure and gain size distribution of nanocrystalline WC-10Co composite powder and the sintered specimens prepared by SPS plus HIP and by vacuum sintering plus HIP by means of atomic force microscopy (AFM). The mechanical properties of the sintered specimens were also investigated. It is very easy to find cobalt lakes in the specimen prepared by vacuum sintering plus HIP process. But the microstructure of the specimen prepared by SPS plus HIP is more homogeneous, and the grain size is smaller than that prepared by vacuum sintering plus HIP. The WC-10Co ultrafine cemented carbide consolidated by SPS plus HIP can reach a relative density of 99.4%, and the transverse rupture strength (TRS) is higher than 3540 MPa, the Rockwell A hardness (HRA) is higher than 92.8, the average grain size is smaller than 300 nm, and the WC-10Co ultrafine cemented carbide with excellent properties is achieved. The specimen prepared by SPS with HIP has better properties and microstructure than that prepared by vacuum sintering with HIP. 展开更多
关键词 WC-10Co nanocrystalline composite powder atomic force microscopy (afm spark plasma sintering (SPS) hot isostatic pressing (HIP)
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Elucidation and Identification of Double-Tip Effects in Atomic Force Microscopy Studies of Biological Structures 被引量:1
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作者 Yong Chen 《Journal of Surface Engineered Materials and Advanced Technology》 2012年第3期238-247,共10页
While atomic force microscopy (AFM) has been increasingly applied to life science, artifactual measurements or images can occur during nanoscale analyses of cell components and biomolecules. Tip-sample convolution eff... While atomic force microscopy (AFM) has been increasingly applied to life science, artifactual measurements or images can occur during nanoscale analyses of cell components and biomolecules. Tip-sample convolution effect is the most common mechanism responsible for causing artifacts. Some deconvolution-based methods or algorithms have been developed to reconstruct the specimen surface or the tip geometry. Double-tip or double-probe effect can also induce artifactual images by a different mechanism from that of convolution effect. However, an objective method for identifying the double-tip/probe-induced artifactual images is still absent. To fill this important gap, we made use of our expertise of AFM to analyze artifactual double-tip images of cell structures and biomolecules, such as linear DNA, during AFM scanning and imaging. Mathematical models were then generated to elucidate the artifactual double-tip effects and images develop during AFM imaging of cell structures and biomolecules. Based on these models, computational formulas were created to measure and identify potential double-tip AFM images. Such formulas proved to be useful for identification of double-tip images of cell structures and DNA molecules. The present studies provide a useful methodology to evaluate double-tip effects and images. Our results can serve as a foundation to design computer-based automatic detection of double-tip AFM images during nanoscale measuring and imaging of biomolecules and even non-biological materials or structures, and then personal experience is not needed any longer to evaluate artifactual images induced by the double-tip/probe effect. 展开更多
关键词 NANOBIOTECHNOLOGY atomic force Microscopy (afm) Double-Tip ARTIFACT Biological SPECIMENS Linear DNA
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Sorting Gold and Sand(Silica) Using Atomic Force Microscope-Based Dielectrophoresis 被引量:1
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作者 Chungman Kim Sunghoon Hong +3 位作者 Dongha Shin Sangmin An Xingcai Zhang Wonho Jhe 《Nano-Micro Letters》 SCIE EI CAS CSCD 2022年第2期1-11,共11页
Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the curre... Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the current technology still exhibits a limitation in realizing the selective deposition and sorting of various materials contained in the same reservoir,which can contribute significantly to additive printing or manufacturing by enabling simultaneous sorting and deposition of different substances through a single nozzle.Here,we propose a dielectrophoresis(DEP)-based material-selective deposition and sorting technique using a pipette-based quartz tuning fork(QTF)-atomic force microscope(AFM) platform DEPQA and demonstrate multi-material sorting through a single nozzle in ambient conditions.We used Au and silica nanoparticles for sorting and obtained 95% accuracy for spatial separation,which confirmed the surfaceenhanced Raman spectroscopy(SERS).To validate the scheme,we also performed a simulation for the system and found qualitative agreement with the experimental results.The method that combines DEP,pipette-based AFM,and SERS may widely expand the unique capabilities of 3D printing and nano-micro patterning for multi-material patterning,materials sorting,and diverse advanced applications. 展开更多
关键词 Dielectrophoresis-empowered Pipette/afm platform On-demand materials sorting Additive 3D printing Multimaterial nano-patterning Nanopipette-based atomic force microscope
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Monitoring film coalescence from aqueous polymeric dispersions using atomic force microscopy: Surface topographic and nano-adhesion studies
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作者 Ziyi Yang Duncan QMCraig 《Asian Journal of Pharmaceutical Sciences》 SCIE CAS 2020年第1期104-111,共8页
The aim of the investigation was to develop the use of topographic and nano-adhesion atomic force microscopy(AFM) studies as a means of monitoring the coalescence of latex particles within films produced from a pharma... The aim of the investigation was to develop the use of topographic and nano-adhesion atomic force microscopy(AFM) studies as a means of monitoring the coalescence of latex particles within films produced from a pharmaceutically relevant aqueous dispersion(Eudragit~?NE30 D). Films were prepared via spin coating and analysed using AFM, initially via tapping mode for topographic assessment followed by force-distance measurements which allowed assessment of site-specific adhesion. The results showed that colloidal particles were clearly observed topographically in freshly prepared samples, with coalescence detected on curing via the disappearance of discernible surface features and a decrease in roughness indices. The effects of temperature and humidity on film curing were also studied, with the former having the most pronounced effect. AFM force measurements showed that the variation in adhesive force reduced with increasing curing time, suggesting a novel method of quantifying the rate of film formation upon curing. It was concluded that the AFM methods outlined in this study may be used as a means of qualitatively and quantitatively monitoring the curing of pharmaceutical films as a function of time and other variables, thereby facilitating rational design of curing protocols. 展开更多
关键词 FILM curing atomic force microscopy Spin coating AQUEOUS dispersion afm pull-off force measurement
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Carbon nanotubes as tips for atomic force microscopy
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作者 国立秋 徐宗伟 +3 位作者 赵铁强 赵清亮 张飞虎 董申 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2004年第2期223-227,共5页
Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical ... Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect. 展开更多
关键词 carbon nanotube atomic force microscope (afm) PROBE
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Monte Carlo method in optical atomic force microscopy
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作者 Ahemd ElMelegy Sarwat Zahwi 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2021年第3期267-271,共5页
Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versa... Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm. 展开更多
关键词 MEASUREMENT Monte Carlo method atomic force microscope(afm) NANOMETROLOGY
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Atomic force microscopy study on microstructure of various ranks of coals
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作者 Jie-Nan PAN Hai-Tao ZHU He-Ling BAI Yan-Qing ZHAO Hai-Chao WANG Li-Ping YAO 《Journal of Coal Science & Engineering(China)》 2013年第3期309-315,共7页
As a new technology, Atomil Force Microscopy (AFM) is being used in the research of microscopic structure on coal surface in recent years. By this technology, we can observe the nanoscale pore and crack shape of coa... As a new technology, Atomil Force Microscopy (AFM) is being used in the research of microscopic structure on coal surface in recent years. By this technology, we can observe the nanoscale pore and crack shape of coal surface, and measure some structural parameters. Different metamorphic grades produce different feature of surface microscopic structure of coal. This paper analyzes the surface microscopic structure of different metamorphic grade coal by AFM. The results show that the coal surface microstructure has a trend from rough to smooth with the increasing of metamorphic grade. The low rank coals contain large or medium pores and the high rank coals contain micro pores. The values of surface morphology characteristic parameters (Sq and Sa) nonlinearly decrease with the increasing coal rank. That is, the coal surface becomes smoother during coalification. 展开更多
关键词 atomic force microscopy (afm metamorphic degree MICRO-STRUCTURE nanoscale pore
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Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy
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作者 YIN Ze-Jie TANG Shi-Biao +1 位作者 HUANG Huan ZHU Da-Ming 《Nuclear Science and Techniques》 SCIE CAS CSCD 2005年第6期341-346,共6页
The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positronannihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radiusand ... The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positronannihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radiusand intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size anddistribution determined from PALS and AFM measurements showed reasonable agreement. 展开更多
关键词 原子物理学 PALS afm 显微镜
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基于光偏转原理的AFM光电检测系统设计
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作者 王旭东 温阳 +3 位作者 王慧云 秦丽 温焕飞 马宗敏 《传感器与微系统》 CSCD 北大核心 2024年第3期76-79,共4页
利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向... 利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向精准调节偏转角度,36mm的聚焦焦距满足了小型化、集成化的设计目标。基于该高灵敏度光电检测系统的设计,AFM系统得到了清晰的硅材料表面台阶结构,系统分辨率达到了0.1nm,为今后的亚原子测量奠定了实验基础。 展开更多
关键词 原子力显微镜 光偏转 准直调节 压电陶瓷
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基于AFM的SBS改性沥青老化过程力学特性研究 被引量:1
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作者 曲恒辉 丁昕 +4 位作者 李孟 田冬军 冯美军 王飞 王鹏 《市政技术》 2024年第1期212-218,共7页
为了探究改性沥青在老化过程中宏观与微观性能的变化,制备了掺量为5.5%的SBS改性沥青,并进行了短期与长期老化试验,分析了其基本性能指标。采用温度扫描与频率扫描试验研究了SBS改性沥青的流变性能,采用AFM试验分析了其表面微观形貌和... 为了探究改性沥青在老化过程中宏观与微观性能的变化,制备了掺量为5.5%的SBS改性沥青,并进行了短期与长期老化试验,分析了其基本性能指标。采用温度扫描与频率扫描试验研究了SBS改性沥青的流变性能,采用AFM试验分析了其表面微观形貌和耗散力,并结合力曲线分析了其黏附力及杨氏模量在老化前后的变化。研究结果表明,短期老化对SBS改性沥青流变性能的影响较小,长期老化对其流变性能影响显著,弹性模量和黏性模量均增大,呈现出变硬、变脆的特性;AFM试验表明SBS改性沥青在老化后高度增大,且蜂状结构尺寸增大、数量增多,黏附力和耗散力均降低,杨氏模量增大,验证了宏观流变试验的结果。 展开更多
关键词 afm SBS改性沥青 老化 力学特性
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Damage of DNA ends induced by mechanical force during AFM nano-manipulation
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作者 DUAN Na WANG Xinyan +2 位作者 ZHANG Chen ZHANG Yi HU Jun 《Nuclear Science and Techniques》 SCIE CAS CSCD 2013年第1期26-31,共6页
An experimental and statistical study was carried out to explore the effects of mechanical forces on the ends of linear double-stranded DNA (dsDNA) fragments. Mechanical force was applied onto individual DNA molecules... An experimental and statistical study was carried out to explore the effects of mechanical forces on the ends of linear double-stranded DNA (dsDNA) fragments. Mechanical force was applied onto individual DNA molecules during atomic force microscope (AFM)-based picking-up manipulation. By comparing the PCR efficiency of two DNA fragments with primers either at ends or at the inner regions, it was found that the ends of DNA fragments were damaged during picking-up process. 展开更多
关键词 机械力 afm DNA损伤 纳米操纵 单个DNA分子 DNA片段 诱导 原子力显微镜
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原子力红外显微镜(AFM-IR):成像原理及方法综述
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作者 罗放 《中外能源》 CAS 2024年第8期68-76,共9页
综述了基于原子力显微镜的红外光谱(Atomic force microscopy-based infrared spectroscopy,AFM-IR)的特点,测量和检测原理及其技术优势。AFM-IR是能在纳米尺度对不同材料进行表征的新兴技术,该技术可以以远低于常规光学衍射极限的分辨... 综述了基于原子力显微镜的红外光谱(Atomic force microscopy-based infrared spectroscopy,AFM-IR)的特点,测量和检测原理及其技术优势。AFM-IR是能在纳米尺度对不同材料进行表征的新兴技术,该技术可以以远低于常规光学衍射极限的分辨率检测材料的化学成分,同时提供不同组分的分布图谱。AFM-IR的原理是利用原子力显微镜(AFM)悬臂梁的振动检测样本因吸收红外辐射脉冲产生的热膨胀,因此AFM-IR在继承了AFM的纳米级分辨率的基础上结合了红外光谱的化学分析能力,克服了二者原有的缺点并实现了优势互补。这项新技术在过去十多年备受关注并获得了长足的发展,因其操作简便、系统稳定、样品制备要求相对较低,以及与红外光谱直接相关而无需数学建模或额外数据后续处理,已被广泛用于材料科学、生命科学等诸多领域。 展开更多
关键词 原子力红外显微镜 afm-IR
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An automated AFM for nanoindentation and force related measurements
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作者 BAI Jiang-hua Andres La Rosa 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2018年第4期347-353,共7页
A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz cr... A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz crystal tuning fork(TF)was used as the transducer with a probe attached.An acoustic sensor was used to measure the interactions between the probe and the sample.An SR850lock-in amplifier was used to monitor the TF signals.An additional lock-in amplifier was used to monitor the acoustic signal.A field programmable gate array(FPGA)board was used to collect the data in automatic mode.The main controller was coded with LabVIEW,which was in charge of Z-axis scan,signal processing and data visualization.A manual mode and an automatic mode were implemented in the controller.Users can switch the two modes at any time during the operation.This AFM system showed several advantages during the test operations.It is simple,flexible and easy to use. 展开更多
关键词 atomic force microscope(afm) nano indentation acoustic sensing piezo drive crystal tuning fork LabVIEW lock-in amplifier 8051microcontroller
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